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testimine (subject term)
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301
book article
Mapping physical defects to logic level for defect oriented testing
Ubar, Raimund-Johannes
SCS 2003 : International Symposium on Signals, Circuits and Systems : July 10-11, 2003, Iasi, Romania : proceedings. Vol. 2
2003
/
p. 453-456 : ill
https://ieeexplore.ieee.org/document/5731320
book article
302
journal article
Material characterization for laminated glass composite panel
Väer, Kaur
;
Anton, Johan
;
Klauson, Aleksander
;
Eerme, Martin
;
Õunapuu, Erko
;
Tšukrejev, Pavel
Journal of achievements in materials and manufacturing engineering
2017
/
p. 11-17
journal article
303
book article
MCM-test
Magnhagen, Bengt
;
Linden, Henric
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 297-304: ill
book article
304
book article
Measuring mining influence in the form of students practice in opposition to the emotional environmental impact assessment
Robam, Karin
;
Väizene, Vivika
;
Anepaio, Ain
;
Kolats, Margit
;
Valgma, Ingo
5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 2008
2008
/
p. 62-65 : ill
book article
305
journal article
Meie igapäevane testimine
Markvardt, Maili
A & A
2010
/
3, lk. 5-11
https://artiklid.elnet.ee/record=b2183723*est
journal article
306
book article
A method for crosstalk fault detection in on-chip buses
Bengtsson, Tomas
;
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Kumar, Shashi
Norchip : proceedings : Oulu, Finland, 21-22 November 2005
2005
/
p. 285-288 : ill
https://doi.org/10.1109/NORCHP.2005.1597045
book article
307
book article
A method for identification dynamic parameters of mixed signal circuits
Zagursky, V.
;
Semyonova, N.
;
Gertners, A.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 211-215
https://www.ester.ee/record=b2150914*est
book article
308
book article
A method for testing dynamic characteristics of analog-digital converters in spectral domain
Zagursky, V.
;
Semyonova, N.
;
Gertners, A.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 207-210
https://www.ester.ee/record=b2150914*est
book article
309
book article
Method for testing the brain
Hinrikus, Hiie
;
Bachmann, Maie
;
Lass, Jaanus
;
Tuulik, Viiu
;
Ubar, Raimund-Johannes
5th European Conference of the International Federation for Medical and Biological Engineering : 14-18 September 2011, Budapest, Hungary
2012
/
p. 1198-1201 : ill
book article
310
book article
Microprocessor-based system test using debug interface
Devadze, Sergei
;
Jutman, Artur
;
Tšertov, Anton
;
Instenberg, Martin
;
Ubar, Raimund-Johannes
26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings
2008
/
p. 98-101 : ill
http://dx.doi.org/10.1109/NORCHP.2008.4738291
book article
311
book article
Microprogrammed test generator for bus oriented devices
Szegi, A.
;
Feher, B.
Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section A. Section M / Tallinn Technical University
1992
/
p. 88-94: ill
book article
312
book article
Mikroelektroonika kiipide testimise tarkvara turbo-tester : kommentaar Eesti Teaduste Akadeemia Bernhard Schmidti preemia pälvinud tööle
Raik, Jaan
Tallinna Tehnikaülikooli aastaraamat 2007
2008
/
lk. 275-278
book article
313
journal article
Milleks ja kuidas katsetada laevu?
Hartikainen, Anni
Paat & Meremees
2016
/
lk. 30
http://www.ester.ee/record=b4471304*est
journal article
314
journal article
Milline on parim hiir? : [TTÜ tootearenduse tudengid testisid arvutihiiri]
Toon, Triin
;
Matsi, Birthe
;
Otto, Tauno
Arvutikasutaja
2005
/
8, lk. 34-37 : ill
https://artiklid.elnet.ee/record=b1050729*est
journal article
315
newspaper article
Milline pann osta? Kas odav pann teeb töö ära sama hästi kui kallis?
Arndt-Kalju, Margit
;
Kirikal, Siiri
;
Skuin, Mari
;
Tarkmeel, Krõõt
delfi.ee
2023
Milline pann osta? Kas odav pann teeb töö ära sama hästi kui kallis?
newspaper article
316
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
317
newspaper article
Mis on head ja halba Bioestis? : [prof. Anti Viikna TTÜ teadlaste korraldatud testist]
Viikna, Anti
;
Luts, Eva
Postimees
1996
/
12. nov., Kasu, lk. 3
newspaper article
318
book article
Mixed-level defect simulation in data-paths of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 617-620 : ill
https://ieeexplore.ieee.org/document/1003333
book article
319
book article EST
/
book article ENG
Model based approach for testing: distributed real-time systems augmented with online monitors
Pal, Deepak
;
Vain, Jüri
Databases and Information Systems : 13th International Baltic Conference, DB&IS 2018, Trakai, Lithuania, July 1-4, 2018 : proceedings
2018
/
p. 142-157
https://doi.org/10.1007/978-3-319-97571-9_13
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
320
book article
Model based framework for testing distributed systems
Pal, Deepak
;
Vain, Jüri
Proceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere
2014
/
p. 91-94 : ill
book article
321
book article
Model based testing of distributed time critical systems
Vain, Jüri
;
Kanter, Gert
;
Srinivasan, Seshadhri
2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 2017
2017
/
p. 99-105 : ill
https://doi.org/10.1109/ICRITO.2017.8342406
book article
322
book article
Model of fracture micromechanism of Cu-Cr-Zr system by "in-situ" test in SEM
Besterci, Michal
;
Ivan, Jozef
;
Kulu, Priit
;
Arensburger, Daniil
;
Velgosova, Oksana
Proceedings of 9th International Scientific Conference "Adhievements in Mechanical & Materials Engineering" : Gliwice, Poland, 11.-14.10.2000
2000
/
p. 59-62
https://doiserbia.nb.rs/img/doi/1450-5339/2003/1450-53390304499B.pdf
book article
323
dissertation
Model synthesis from VHDL for the functional test generation system
Krupnova, Helena
1993
https://www.ester.ee/record=b2090509*est
dissertation
324
book article
Model-based integration testing of ROS packages : a mobile robot case study
Ernits, Juhan-Peep
;
Halling, Evelin
;
Kanter, Gert
;
Vain, Jüri
2015 European Conference on Mobile Robots : Lincoln, United Kingdom, September 2-4, 2015 : conference proceedings
2015
/
[7] p. : ill
http://dx.doi.org/10.1109/ECMR.2015.7324210
book article
325
book article
Model-based synthesis of reactive planning on-line testers for non-deterministic embedded systems
Kääramees, Marko
;
Vain, Jüri
;
Raiend, Kullo
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 189-192 : ill
book article
Number of records 639, displaying
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