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301
book article
Hybrid BIST optimization using reseeding and test set compaction
Jervan, Gert
;
Orasson, Elmet
;
Kruus, Helena
;
Ubar, Raimund-Johannes
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 596-603 : ill
http://dx.doi.org/10.1109/DSD.2007.4341529
book article
302
journal article
Hybrid BIST optimization using reseeding and test set compaction
Jervan, Gert
;
Orasson, Elmet
;
Kruus, Helena
;
Ubar, Raimund-Johannes
Microprocessors and microsystems
2008
/
5/6, p. 254-262 : ill
https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288
journal article
303
book article
Hybrid BIST scheduling for NoC-based SoCs
Jervan, Gert
;
Shchenova, Tatjana
;
Ubar, Raimund-Johannes
Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006
2006
/
p. 141-144 : ill
https://ieeexplore.ieee.org/document/4126966
book article
304
book article
Hybrid BIST time minimization for core-based systems with STUMPS architecture
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 November 2003, Boston, Massachusetts : proceedings
2003
/
p. 225-232 : ill
https://ieeexplore.ieee.org/document/1250116
book article
305
dissertation
Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseks
Orasson, Elmet
2007
https://www.ester.ee/record=b2305436*est
dissertation
306
book
Hybrid built-in self-test and test generation techniques for digital systems
Jervan, Gert
2005
https://www.ester.ee/record=b2177537*est
book
307
book article
Hybrid functional BIST for digital systems
Mazurova, Natalja
;
Smahtina, Julia
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 205-208 : ill
book article
308
book article
Hydraulic conductivity testing method for all-in aggregates and mining waste materials
Šommet, Julija
;
Pastarus, Jüri-Rivaldo
;
Sabanov, Sergei
10th International Symposium "Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 10-15, 2011
2011
/
p. 122-126 : ill
book article
309
book article
HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systems
Ubar, Raimund-Johannes
;
Mazurova, Natalja
;
Smahtina, Julia
;
Orasson, Elmet
;
Raik, Jaan
Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004
2004
/
p. 497-502 : ill
book article
310
journal article
Hygrothermal calculations and laboratory tests on timber-framed wall structures
Kalamees, Targo
;
Vinha, Juha
Building and environment
2003
/
5, p. 689-697 : ill
https://www.sciencedirect.com/science/article/pii/S036013230200207X
journal article
311
book article EST
/
book article ENG
IEEE European Test Symposium (ETS)
Eggersgluss, Stephan
;
Hamdioui, Said
;
Jutman, Artur
;
Michael, Maria K.
;
Raik, Jaan
2019 IEEE International Test Conference (ITC)
2019
/
4 p
https://doi.org/10.1109/ITC44170.2019.9000148
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
312
book article
IEEE P1687 IJTAG demonstrator on FPGA
Shibin, Konstantin
;
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
DATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 2012
2012
/
1 p. : ill
https://www.academia.edu/22101517/IEEE_P1687_IJTAG_demonstrator_on_FPGA
book article
313
book article
IF filter design for satellite TV FM video modulator
Kinks, Priit
;
Laidvee, Andres
;
Taklaja, Andres
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 367-370: ill
book article
314
book article
Impact of small specimens sampling on durability of in-service power plant components
Klevtsov, Ivan
;
Dedov, Andrei
;
Bogoljubova, Elena
Conference Proceedings : 2nd International Conference SSTT : Determination of mechanical properties of materials by small punch and other miniature testing techniques
2012
/
p. 373-378
book article
315
book article
Impact wear tester for the s[t]udy of abrasive erosion and milling processes
Tarbe, Riho
;
Kulu, Priit
Proceedings of the 6th International Conference of DAAAM Baltic "Industrial Engineering" : 24-26th April 2008, Tallinn, Estonia. [2]
2008
/
p. 561-566 : ill
http://innomet.ttu.ee/daaam08/online/Materials%20Engineering/Tarbe-rev.pdf
book article
316
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
317
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
318
book article
An improved estimation methodology for hybrid BIST cost calculation
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Korelina, Olga
Proceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 2004
2004
/
p. 297-300 : ill
https://ieeexplore.ieee.org/document/1423882
book article
319
book article
An improved estimation technique for hybrid BIST test set generation
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Korelina, Olga
DDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings
2005
/
p. 182-185 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/ddecs05.pdf
book article
320
book article
Improved modeling of audio signals by modifying transient locations
Vafin, Renat
;
Heusdens, Richard
;
Par, Steven van de
;
Kleijn, W. Bastiaan
Proceedings of the 2001 IEEE Workshop on Applications of Signal Processing to Audio and Acoustics : October 21-24,2001, Mohonk Mountain House, New Paltz, New York, USA
2001
/
p. 143-143 : ill
https://ieeexplore.ieee.org/document/969563
book article
321
book article
Improving embedded software testing
Savimaa, Raul
SCI 2004 : the 8th World Multi-Conference on Systemics, Cybernetics and Informatics : July 18-21, 2004, Orlando, Florida, USA. Volume 1, Information Systems, Technologies and Applications : proceedings
2004
/
p. 270-274
book article
322
book article EST
/
book article ENG
Inductive and coinductive predicate liftings for effectful programs
Veltri, Niccolò
;
Voorneveld, Niels F.W.
Proceedings 37th Conference on Mathematical Foundations of Programming SemanticsHybrid: Salzburg, Austria and Online, 30th August - 2nd September, 2021
2021
/
p. 260-277
https://doi.org/10.4204/EPTCS.351.16
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
323
book article
Instrument-free Lab-on-a-Chip DNA amplification test for pathogen detection [Online resource]
Pardy, Tamas
;
Rang, Toomas
;
Kremer, Clemens
;
Tulp, Indrek
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600991
book article
324
book article
Integrated design and test generation under Internet based environment MOSCITO
Schneider, Andre
;
Ivask, Eero
;
Ubar, Raimund-Johannes
Euromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings
2002
/
p. 187-194 : ill
http://dx.doi.org/10.1109/DSD.2002.1115368
book article
325
journal article EST
/
journal article ENG
Integrated self-regulating resistive heating for isothermal nucleic acid amplification tests (NAAT) in Lab-on-a-Chip (LoC) devices
Pardy, Tamas
;
Tulp, Indrek
;
Kremer, Clemens
;
Rang, Toomas
;
Stewart, Ray
PLoS ONE
2017
/
p. 1-11 : ill
https://doi.org/10.1371/journal.pone.0189968
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
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