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testimine (subject term)
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426
book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
427
book article
New foreign language text-books as objects of testing
Rapoport, I.
;
Petrova, N.
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 77
book article
428
book article
New high frequency surface fatigue wear tester : design and first results
Antonov, Maksim
;
Kulu, Priit
;
Sergejev, Fjodor
;
Hussainova, Irina
;
Veinthal, Renno
Proceedings of Nordtrib 2008 : 13th Nordic Symposium on Tribology : Tampere, Finland, 10-13 June, 2008
2008
/
p. NT2008-87-24
https://www.researchgate.net/publication/288482524_New_high_frequency_surface_fatigue_wear_tester_Design_and_first_results
book article
429
book article
New method of testability calculation to guide RT-level test generation
Raik, Jaan
;
Nõmmeots, Tanel
;
Ubar, Raimund-Johannes
4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003
2003
/
p. 46-51 : ill
https://link.springer.com/article/10.1007/s10836-005-5288-5
book article
430
book article
New system of testing pupils' abilities in British schools
Gizatullin, N.
;
Koptelova, N.
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 36-37
book article
431
book article EST
/
book article ENG
A new test suite reduction approach based on hypergraph minimal transversal mining
Trabelsi, Shaima
;
Bennani, Mohamed Taha
;
Ben Yahia, Sadok
Future Data and Security Engineering : 6th International Conference, FDSE 2019, Nha Trang City, Vietnam, November 27–29, 2019, Proceedings
2019
/
p. 15-30
https://doi.org/10.1007/978-3-030-35653-8_2
Conference proceeding at Scopus
Article at Scopus
Conference proceeding at WOS
Article at WOS
book article EST
/
book article ENG
432
book article
Noise behavioral model of testing system
Brygilewicz, Volodymyr
;
Wojciechowski, Jacek
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 57-60: ill
book article
433
book article
A novel artificial neural networks based automatic adaptive fault detection technique for analog circuits
Petlenkov, Eduard
;
Jutman, Artur
;
Nõmm, Sven
;
Ubar, Raimund-Johannes
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 167-170 : ill
book article
434
book article
NP-hard graph problems' algorithms testing guidelines : artificial intelligence principles and testing as a service
Kumlander, Deniss
Advances in computer and information sciences and engineering
2008
/
p. 114-118 : ill
https://link.springer.com/chapter/10.1007/978-1-4020-8739-4_20
book article
435
book article
NP-hard graph problems' algorithms testing guidlines : artificial intelligence principles and testing as a service
Kumlander, Deniss
Innovative techniques in instruction technology, e-learning, e-assessment, and education
2008
/
p. 112-116
https://link.springer.com/chapter/10.1007/978-1-4020-8739-4_20
book article
436
journal article EST
/
journal article ENG
A numerical study for plant-independent evaluation of fractional-order PID controller performance
Alagoz, Baris Baykant
;
Tepljakov, Aleksei
;
Yeroglu, Celaleddin
;
Gonzalez, Emmanuel A.
;
Hossein Nia, S. Hassan
;
Petlenkov, Eduard
IFAC-PapersOnLine
2018
/
p. 539-544 : ill
https://doi.org/10.1016/j.ifacol.2018.06.151
Conference proceedings at Scopus
Article at Scopus
Article at WOS
journal article EST
/
journal article ENG
437
book article
Off-line testing of crosstalk induced glitch faults in NoC Interconnects
Bengtsson, Tomas
;
Kumar, Shashi
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006
2006
/
p. 221-225 : ill
http://dx.doi.org/10.1109/NORCHP.2006.329215
book article
438
book article
Off-line testing of delay faults in NoC interconnects
Bengtsson, Tomas
;
Jutman, Artur
;
Kumar, Shashi
;
Peng, Zebo
;
Ubar, Raimund-Johannes
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 677-680 : ill
http://dx.doi.org/10.1109/DSD.2006.72
book article
439
book article
On automatic software-based self-test program generation based on high-Level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 177
http://dx.doi.org/10.1109/LATW.2016.7483357
book article
440
book article
On coverage of timing related faults at board level
Jutman, Artur
;
Aleksejev, Igor
;
Devadze, Sergei
2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings
2016
/
[2] p. : ill
https://doi.org/10.1109/ETS.2016.7519295
book article
441
book article
On efficient logic-level simulation of digital circuits represented by the SSBDD model
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 621-624 : ill
https://ieeexplore.ieee.org/document/1003334
book article
442
book article
On LFSR polynomial calculation for test time reduction
Jutman, Artur
Computer Science Meets Automation : 10-13 September 2007 : proceedings. Volume II
2007
/
p. 153-158 : ill
https://www.db-thueringen.de/receive/dbt_mods_00008867
book article
443
book article
On mutating UPPAAL timed automata to assess robustness of web services
Siavashi, Faezeh
;
Truscan, Dragos
;
Vain, Jüri
Proceedings of the 11th International Joint Conference on Software Technologies (ICSOFT 2016). Vol. 1, ICSOFT-EA
2016
/
p. 15-26 : ill
http://dx.doi.org/10.5220/0005970800150026
book article
444
book article
On reusability of verification assertions for testing
Jenihhin, Maksim
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 43-46 : ill
book article
445
book article
On reusability of verification assertions for testing
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Tšepurov, Anton
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 151-154 : ill
book article
446
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
447
book article EST
/
book article ENG
On testing microservice systems
Koschel, Arne
;
Astrova, Irina
;
Bartels, Mirco
;
Helmers, Mark
;
Lyko, Marcel
Proceedings of the Future Technologies Conference (FTC) 2020 ; vol. 3
2021
/
p. 597–609
https://doi.org/10.1007/978-3-030-63092-8_40
Conference Proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
448
book article
On the combined use of HLDDs and EFSMs for functional ATPG
Di Guglielmo, Giuseppe
;
Fummi, Franco
;
Jenihhin, Maksim
;
Pravadelli, Graziano
;
Raik, Jaan
;
Ubar, Raimund-Johannes
5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia
2007
/
p. 503-508 : ill
book article
449
journal article
On the reuse of TLM mutation analysis at RTL
Guarnieri, Valerio
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2012
/
p. 435-448 : ill
https://link.springer.com/article/10.1007/s10836-012-5303-6
journal article
450
book article
On using genetic algorithm for test generation
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ivask, Eero
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 233-236 : ill
book article
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