Searching - TalTech Research Portal

display

sort

426

book article

Multiple stuck-at-fault detection theoremUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 / p. 236-241 : ill

book article

427

book article

Multiple-objective backtrace for solving test generation constraintsMekler, A.; Raik, JaanInternational Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings2003 / p. 123-126 : ill https://ieeexplore.ieee.org/document/1267732

book article

428

book article

Multiscale memristive properties of skin induced by memory effects of cyclic stress-relaxation loadings : data fusion from ground truth nonlinear acousto-mechanical testingDos Santos, Serge; Masood, Ali; Lints, Martin; Salupere, Andrus; Kozena, Colette; Kus, VaclavICSV 2018: 25th International Congress on Sound and Vibration (ICSV25), Hiroshima, Japan, 8-12 July, 2018 : proceedings. Vol. 12018 / p. 1965-1972 : ill http://toc.proceedings.com/40638webtoc.pdf https://www.researchgate.net/publication/326668548_MULTISCALE_MEMRISTIVE_PROPERTIES_OF_SKIN_INDUCED_BY_MEMORY_EFFECTS_OF_CYCLIC_STRESS-RELAXATION_LOADINGS_DATA_FUSION_FROM_GROUND_TRUTH_NONLINEAR_ACOUSTO-MECHANICAL_TESTING

book article

429

book article

Multi-view modeling for MPSoC design aspects [Online resource]Vain, Jüri; Apneet Kaur; Tsiopoulos, Leonidas; Raik, Jaan; Jenihhin, MaksimBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600986

book article

430

book article

Mutation analysis for systemC designs at TLMGuarnieri, Valerio; Bombieri, Nicola; Pravadelli, Graziano; Fummi, Franco; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 20112011 / [6] p https://ieeexplore.ieee.org/document/5985925

book article

431

book article

Mutations for testing hardware and correcting design errorsHantson, HannoInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 105-108 : ill

book article

432

journal article

Nanoindentation testing and modeling of chromium carbide based compositesHussainova, Irina; Hamed, Elham; Jasiuk, IwonaMechanics of composite materials2011 / p. 667-678 : ill

journal article

433

book article

Nanomaterials Al-Al4-C3 studied by "In-situ Tensile Test in SEM"Besterci, Michal; Velgosova, Oksana; Ivan, Jozef; Hvizdoš, Pavol; Kvackaj, Tibor; Kulu, Priit18th International Baltic Conference : Engineering Materials & Tribology : BALTMATTRIB-2009 : October 22-23, 2009, Tallinn, Estonia : abstracts2009 / p. 73

book article

434

newspaper article

Narkotestide idufirma sihib 700 miljoni eurost käivetMandel, Meelisaripaev.ee2025 Narkotestide idufirma sihib 700 miljoni eurost käivet

newspaper article

435

book article

Narkotestri arendamine narkootikumide tuvastamiseks süljesSaar-Reismaa, Piret; Erme, E.; Kulp, Maria; Gorbatšova, Jelena; Kaljurand, Mihkel; Vaher, Merike; Mazina-Šinkar, JekaterinaXXXIV Eesti keemiapäevad : 100. aastapäeva teaduskonverentsi teesid2019 / lk. 27 https://www.ester.ee/record=b5208044*est

book article

436

journal article

Natural apeaking and how to assess itPajupuu, Hille; Kerge, Krista; Meister, Lya; Asu, Eva Liina; Alp, PilviTrames2010 / 2, p. 120-140 : ill https://www.researchgate.net/publication/238451077_Natural_speaking_and_how_to_assess_it

journal article

437

book article

A new approach to build a low-level malicious fault list starting from high-level description and alternative graphsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza, M.; Ubar, Raimund-JohannesProceedings IEEE European Design & Test Conference, Paris, March 17-20, 19971997 / p. 560-565 https://ieeexplore.ieee.org/document/582417

book article

438

book article

New built-in self-test scheme for SoC interconnectJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanThe 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV2005 / p. 19-24 : ill https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect

book article

439

book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article

440

book article

New foreign language text-books as objects of testingRapoport, I.; Petrova, N.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 77

book article

441

book article

New high frequency surface fatigue wear tester : design and first resultsAntonov, Maksim; Kulu, Priit; Sergejev, Fjodor; Hussainova, Irina; Veinthal, RennoProceedings of Nordtrib 2008 : 13th Nordic Symposium on Tribology : Tampere, Finland, 10-13 June, 20082008 / p. NT2008-87-24 https://www.researchgate.net/publication/288482524_New_high_frequency_surface_fatigue_wear_tester_Design_and_first_results

book article

442

book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

book article

443

book article

New method of testability calculation to guide RT-level test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-Johannes4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 20032003 / p. 46-51 : ill https://link.springer.com/article/10.1007/s10836-005-5288-5

book article

444

book article

New system of testing pupils' abilities in British schoolsGizatullin, N.; Koptelova, N.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 36-37

book article

445

book article EST / book article ENG

A new test suite reduction approach based on hypergraph minimal transversal miningTrabelsi, Shaima; Bennani, Mohamed Taha; Ben Yahia, SadokFuture Data and Security Engineering : 6th International Conference, FDSE 2019, Nha Trang City, Vietnam, November 27–29, 2019, Proceedings2019 / p. 15-30 https://doi.org/10.1007/978-3-030-35653-8_2 Conference proceeding at Scopus Article at Scopus Conference proceeding at WOS Article at WOS

book article EST / book article ENG

446

journal article

A new testability calculation method to guide RTL test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2005 / p. 71-82 : ill https://doi.org/10.1007/s10836-005-5288-5

journal article

447

book article

Noise behavioral model of testing systemBrygilewicz, Volodymyr; Wojciechowski, JacekBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 57-60: ill

book article

448

book article

A novel artificial neural networks based automatic adaptive fault detection technique for analog circuitsPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 167-170 : ill

book article

449

book article

NP-hard graph problems' algorithms testing guidelines : artificial intelligence principles and testing as a serviceKumlander, DenissAdvances in computer and information sciences and engineering2008 / p. 114-118 : ill https://link.springer.com/chapter/10.1007/978-1-4020-8739-4_20

book article

450

book article

NP-hard graph problems' algorithms testing guidlines : artificial intelligence principles and testing as a serviceKumlander, DenissInnovative techniques in instruction technology, e-learning, e-assessment, and education2008 / p. 112-116 https://link.springer.com/chapter/10.1007/978-1-4020-8739-4_20

book article

testimine (subject term)

types of item

subject term 1

keyword 1