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451

book article

On reusability of verification assertions for testingJenihhin, Maksim; Raik, JaanInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 43-46 : ill

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452

book article EST / book article ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

453

book article EST / book article ENG

On testing microservice systemsKoschel, Arne; Astrova, Irina; Bartels, Mirco; Helmers, Mark; Lyko, MarcelProceedings of the Future Technologies Conference (FTC) 2020 ; vol. 32021 / p. 597–609 https://doi.org/10.1007/978-3-030-63092-8_40 Conference Proceedings at Scopus Article at Scopus

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454

book article

On the combined use of HLDDs and EFSMs for functional ATPGDi Guglielmo, Giuseppe; Fummi, Franco; Jenihhin, Maksim; Pravadelli, Graziano; Raik, Jaan; Ubar, Raimund-Johannes5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia2007 / p. 503-508 : ill

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455

journal article

On the reuse of TLM mutation analysis at RTLGuarnieri, Valerio; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2012 / p. 435-448 : ill https://link.springer.com/article/10.1007/s10836-012-5303-6

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456

book article

On using genetic algorithm for test generationBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 233-236 : ill

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457

book article

Online testing of nondeterministic systems with the reactive planning testerVain, Jüri; Kääramees, Marko; Markvardt, MailiDependability and computer engineering : concepts for software-intensive systems2012 / p. 113-150 : ill https://www.igi-global.com/chapter/online-testing-nondeterministic-systems-reactive/55327

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458

dissertation

Optical detection methods for droplet microfluidic applications = Optilised tuvastusmeetodid tilkade mikrofluidiliste rakenduste jaoksPärnamets, Kaiser2023 https://doi.org/10.23658/taltech.31/2023 https://digikogu.taltech.ee/et/Item/ffb85150-fb85-4a7c-b130-0d7f2c3b7fb5 https://www.ester.ee/record=b5569973*est

dissertation

Related publications 3

459

book article

Optimierte Steuerung der Fehlersuche auf digitalen LeiterplattenThomä, E.; Ubar, Raimund-JohannesProceedings of the 27th International Conference, Technical University of Ilmenau, October, 19821982 / p. 65-68

book article

460

dissertation

Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemidesKruus, Helena2011

dissertation

461

book article

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 20072007 / p. 71-77 https://ieeexplore.ieee.org/document/4297319

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462

book article

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 133-136 : ill

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463

book article

Optimization of the store-and-generate based built-in self-testUbar, Raimund-Johannes; Jervan, Gert; Kruus, Helena; Orasson, Elmet; Aleksejev, IgorBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 199-202 : ill

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464

journal article EST / journal article ENG

Out-of-step protection based on discrete angle derivativesTealane, Marko; Kilter, Jako; Bagleybter, Oleg; Heimisson, Birkir; Popov, MarjanIEEE Access2022 / p. 78290-78305 https://doi.org/10.1109/ACCESS.2022.3193390 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Related publications 1

Future power system out-of-step protection concept utilizing synchronized phasor measurements = Tuleviku elektrisüsteemi faasimõõtmistel põhinev sünkronismikaotuskaitse kontseptsioon

465

journal article

Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 303-324 : ill http://dx.doi.org/10.2298/FUEE1103303U

journal article

466

book article

Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesProceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland2011 / p. 1-10 : ill https://scindeks-clanci.ceon.rs/data/pdf/0353-3670/2011/0353-36701103303U.pdf

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467

book article

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 20042004 / p. 253-258 : ill https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

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468

book article

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 20042004 / p. 173-176 https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

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469

book article

Parallel critical path tracing fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanProceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 20182018 / p. 305-310 : ill https://doi.org/10.23919/MIXDES.2018.8436880

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470

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Parallel exact critical path tracing fault simulation with reduced memory requirementsDevadze, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 20092009 / p. 155-160 : ill https://ieeexplore.ieee.org/document/4938046

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471

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Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

472

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Performance estimation of embedded applications on microcontrollersRuberg, Priit; Lass, Keijo; Liiv, Elvar; Ellervee, Peeter2017 IEEE Nordic Circuits and Systems Conference (NORCAS 2017): NORCHIP and International Symposium of System-on-Chip (SoC 2017) : Linkoping, Sweden, 23-25 October, 20172017 / p. 170-175 : ill http://dx.doi.org/10.1109/NORCHIP.2017.8124964

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473

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Performance testing of frost damage model by hygrothermal simulationIlomets, Simo; Kalamees, Targo; Raado, Lembi-MerikeProceedings of the 5th International Building Physics Conference (IBPC) : Kyoto, Japan, May 28-31, 20122012 / p. 73-80 : ill

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474

journal article

PilvtestimisestLeis, PaulA & A2010 / 3, lk. 3-4 : ill https://artiklid.elnet.ee/record=b2183722*est

journal article

475

book article

PLA-based FSM state assignment for testabilityKasirova, Lilia; Keevallik, Andres; Kruus, MargusProceedings of the International Conference "Computer-Aided Design of Discrete Devices", Minsk, 19951995 / p. 50-51

book article

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