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A numerical study for plant-independent evaluation of fractional-order PID controller performanceAlagoz, Baris Baykant; Tepljakov, Aleksei; Yeroglu, Celaleddin; Gonzalez, Emmanuel A.; Hossein Nia, S. Hassan; Petlenkov, EduardIFAC-PapersOnLine2018 / p. 539-544 : ill https://doi.org/10.1016/j.ifacol.2018.06.151 Conference proceedings at Scopus Article at Scopus Article at WOS

journal article EST / journal article ENG

452

book article

Off-line testing of crosstalk induced glitch faults in NoC InterconnectsBengtsson, Tomas; Kumar, Shashi; Jutman, Artur; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 221-225 : ill http://dx.doi.org/10.1109/NORCHP.2006.329215

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453

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Off-line testing of delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Peng, Zebo; Ubar, Raimund-Johannes9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 677-680 : ill http://dx.doi.org/10.1109/DSD.2006.72

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454

book article

On automatic software-based self-test program generation based on high-Level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 177 http://dx.doi.org/10.1109/LATW.2016.7483357

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455

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On coverage of timing related faults at board levelJutman, Artur; Aleksejev, Igor; Devadze, Sergei2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings2016 / [2] p. : ill https://doi.org/10.1109/ETS.2016.7519295

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456

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On efficient logic-level simulation of digital circuits represented by the SSBDD modelJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 621-624 : ill https://ieeexplore.ieee.org/document/1003334

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457

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On LFSR polynomial calculation for test time reductionJutman, ArturComputer Science Meets Automation : 10-13 September 2007 : proceedings. Volume II2007 / p. 153-158 : ill https://www.db-thueringen.de/receive/dbt_mods_00008867

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458

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On mutating UPPAAL timed automata to assess robustness of web servicesSiavashi, Faezeh; Truscan, Dragos; Vain, JüriProceedings of the 11th International Joint Conference on Software Technologies (ICSOFT 2016). Vol. 1, ICSOFT-EA2016 / p. 15-26 : ill http://dx.doi.org/10.5220/0005970800150026

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459

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On reusability of verification assertions for testingJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Tšepurov, AntonBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 151-154 : ill

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460

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On reusability of verification assertions for testingJenihhin, Maksim; Raik, JaanInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 43-46 : ill

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461

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On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

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462

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On testing microservice systemsKoschel, Arne; Astrova, Irina; Bartels, Mirco; Helmers, Mark; Lyko, MarcelProceedings of the Future Technologies Conference (FTC) 2020 ; vol. 32021 / p. 597–609 https://doi.org/10.1007/978-3-030-63092-8_40 Conference Proceedings at Scopus Article at Scopus

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463

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On the combined use of HLDDs and EFSMs for functional ATPGDi Guglielmo, Giuseppe; Fummi, Franco; Jenihhin, Maksim; Pravadelli, Graziano; Raik, Jaan; Ubar, Raimund-Johannes5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia2007 / p. 503-508 : ill

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464

journal article

On the reuse of TLM mutation analysis at RTLGuarnieri, Valerio; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2012 / p. 435-448 : ill https://link.springer.com/article/10.1007/s10836-012-5303-6

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465

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On using genetic algorithm for test generationBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 233-236 : ill

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466

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Online testing of nondeterministic systems with the reactive planning testerVain, Jüri; Kääramees, Marko; Markvardt, MailiDependability and computer engineering : concepts for software-intensive systems2012 / p. 113-150 : ill https://www.igi-global.com/chapter/online-testing-nondeterministic-systems-reactive/55327

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467

dissertation

Optical detection methods for droplet microfluidic applications = Optilised tuvastusmeetodid tilkade mikrofluidiliste rakenduste jaoksPärnamets, Kaiser2023 https://doi.org/10.23658/taltech.31/2023 https://digikogu.taltech.ee/et/Item/ffb85150-fb85-4a7c-b130-0d7f2c3b7fb5 https://www.ester.ee/record=b5569973*est

dissertation

Related publications 3

468

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Optimierte Steuerung der Fehlersuche auf digitalen LeiterplattenThomä, E.; Ubar, Raimund-JohannesProceedings of the 27th International Conference, Technical University of Ilmenau, October, 19821982 / p. 65-68

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469

dissertation

Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemidesKruus, Helena2011

dissertation

470

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Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 20072007 / p. 71-77 https://ieeexplore.ieee.org/document/4297319

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471

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Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 133-136 : ill

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472

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Optimization of the store-and-generate based built-in self-testUbar, Raimund-Johannes; Jervan, Gert; Kruus, Helena; Orasson, Elmet; Aleksejev, IgorBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 199-202 : ill

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473

journal article EST / journal article ENG

Out-of-step protection based on discrete angle derivativesTealane, Marko; Kilter, Jako; Bagleybter, Oleg; Heimisson, Birkir; Popov, MarjanIEEE Access2022 / p. 78290-78305 https://doi.org/10.1109/ACCESS.2022.3193390 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Related publications 1

Future power system out-of-step protection concept utilizing synchronized phasor measurements = Tuleviku elektrisüsteemi faasimõõtmistel põhinev sünkronismikaotuskaitse kontseptsioon

474

journal article

Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 303-324 : ill http://dx.doi.org/10.2298/FUEE1103303U

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475

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Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesProceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland2011 / p. 1-10 : ill https://scindeks-clanci.ceon.rs/data/pdf/0353-3670/2011/0353-36701103303U.pdf

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