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testimine (subject term)
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501
book article
Provably correct test generation for online testing of timed systems
Vain, Jüri
;
Anier, Aivo
;
Halling, Evelin
Databases and Information Systems : proceedings of the 11th International Baltic Conference, Baltic DB&IS 2014 : Tallinn, Estonia, 8-11 June, 2014
2014
/
p. 337-348 : ill
book article
502
book article
Pseudojuhuslikud bitijadad ja nende juhuslikkuse testimine
Lossmann, Eerik
;
Meister, Ants
Ringhääling 2003 : X rahvusvahelise telekommunikatsioonipäeva materjalid
2003
/
lk. 54-59 : ill
book article
503
book article
Quality assuarance system of metals testing laboratory
Päärsoo, Riho
;
Veinthal, Renno
Proceedings of the 2nd International Conference, 27-29th April 2000, Tallinn, Estonia / DAAAM International Vienna, DAAAM National Estonia
2000
/
p. 313-315
book article
504
book article
Quality assurance in mechanical testing laboratory by participating in proficiency test
Päärsoo, Riho
;
Veinthal, Renno
;
Peetsalu, Priidu
;
Saarna, Mart
Proceedings of the 3rd International Conference Industrial Engineering - New Challenges to SME : 25-27 April 2002, Tallinn, Estonia
2002
/
p. 242-244 : ill
book article
505
book article
Rail and rail weld testing
Saarna, Mart
;
Laansoo, Andres
Proceedings of the 4th International Conference Industrial Engineering - New Challenges to SME : 29-30 April 2004, Tallinn, Estonia
2004
/
p. 223-225 : ill
book article
506
journal article
Raytraced images for testing the reconstruction of fibre orientation distributions
Eik, Marika
;
Herrmann, Heiko
Proceedings of the Estonian Academy of Sciences
2012
/
p. 128-136 : ill
journal article
507
book article
Reactive testing of nondeterministic systems by test purpose-directed tester
Vain, Jüri
;
Kull, Andres
;
Kääramees, Marko
;
Markvardt, Maili
;
Raiend, Kullo
Model-based testing for embedded systems
2012
/
p. 425-452 : ill
https://www.researchgate.net/publication/234117187_Reactive_Testing_of_Nondeterministic_Systems_by_Test_Purpose-Directed_Tester
book article
508
book article
Recognition and analysis of the contours drawn during the Poppelreuter's test
Nõmm, Sven
;
Bardõš, Konstantin
;
Mašarov, Ilja
;
Kozhenkina, Julia
;
Toomela, Aaro
;
Toomsoo, Toomas
2016 15th IEEE International Conference on Machine Learning and Applications : 18-20 December 2016, Anaheim, California : proceedings
2016
/
p. 170-175 : ill
http://doi.org//10.1109/ICMLA.2016.0036
book article
509
book article
Reflection segments based robust PID controller solution for benchmark problem
Avanessov, Sergei
;
Nurges, Ülo
2014 22nd Mediterranean Conference on Control and Automation (MED) : University of Palermo, June 16-19, 2014, Palermo, Italy
2014
/
p. 1406-1411 : ill
book article
510
book article
Regular bridge inspection data improvement using non-destructive testing
Kušar, M.
;
Galvao, N.
;
Sein, Sander
Life cycle analysis and assessment in civil engineering: towards an integrated vision : proceedings of the Sixth International Symposium on Life-Cycle Civil Engineering (IALCCE 2018), 28-31 October 2018, Ghent, Belgium
2019
/
p. 1793-1797
https://www.taylorfrancis.com/books/9781351857574
https://doi.org/10.1201/9781315228914
book article
Related publications
1
Development of an optimised condition assessment plan for common reinforced concrete bridges in Estonia = Optimeeritud seisukorra kontrolliplaani välja töötamine tüüpilistele Eesti raudbetoonsildadele
511
book article
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
book article
512
book article EST
/
book article ENG
Requirements for e-testing services in the afgREN cloud-based e-learning system
Saay, Salim
;
Laanpere, Mart
;
Norta, Alexander
Technology Enhanced Assessment, 19th International Conference, TEA 2016, Tallinn Estonia, October 5–6, 2016 : revised selected papers
2017
/
p. 133-147
https://doi.org/10.1007/978-3-319-57744-9_12
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
513
book article
Requirements-driven model-based testing of the IP Multimedia Subsystem
Ernits, Juhan-Peep
;
Kääramees, Marko
;
Raiend, Kullo
;
Kull, Andres
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 203-206 : ill
book article
514
book article
RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems
Jenihhin, Maksim
;
Raik, Jaan
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings
2020
/
art. 19690741 , 6 p
https://doi.org/10.23919/DATE48585.2020.9116558
book article
515
book article
Research and training environment for digital design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
34th ASEE/IEEE Frontiers in Education Conference : October 20-23, 2004, Savannah, GA
2004
/
p. S3F-18-S3F-23 : ill
http://dx.doi.org/10.1109/FIE.2004.1408779
book article
516
book article
Research and training environment for digital design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Proceedings of the Eighth IASTED International Conference on Computers and Advanced Technology in Education : August 29-31, 2005, Oranjestad, Aruba
2005
/
p. 232-237 : ill
https://ieeexplore.ieee.org/document/1408779
book article
517
book article
Research and training scenarios for design and test of SOC [Electronic resource]
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
WCETE 2004 : World Congress on Engineering and Technology Education : Engineering Education in the Changing Society : March 14-17, 2004, Guaruja/Santos, Brazil
2004
/
p. 320-324 : ill. [CD-ROM]
book article
518
journal article
Research in digital design and test at Tallinn University of Technology
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Jutman, Artur
;
Raik, Jaan
;
Ellervee, Peeter
;
Kruus, Margus
Radioelectronics & informatics
2008
/
p. 4-12 : ill
http://www.ewdtest.com/ri/%E2%84%96-1-40-january-march-2008/
journal article
519
book article
Reseeding using compaction of pre-generated LFSR sequences
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : 31st August to 3rd September 2008, Malta : conference guide
2008
/
p. 215
book article
520
book article
Reseeding using compaction of pre-generated LFSR sub-sequences
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : Malta
2008
/
p. 1290-1295 : ill
http://dx.doi.org/10.1109/ICECS.2008.4675096
book article
521
journal article EST
/
journal article ENG
Response of stress relieving and solution annealing treatment on tensile properties and fracture toughness of additively manufactured stainless steel 316L
Kumar, Deepak
;
Arya, Abhinav
;
Dutta, Shubhendu Anupam
;
Jhavar, Suyog
;
Prashanth, Konda Gokuldoss
;
Suwas, Satyam
Journal of Materials Engineering and Performance
2025
/
art. 145021
https://doi.org/10.1007/s11665-025-11334-y
journal article EST
/
journal article ENG
522
book article
Re-using chip level DFT at board level
Gu, Xinli
;
Jutman, Artur
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
2012
/
1 p
https://www.academia.edu/25351525/Re_using_chip_level_DFT_at_board_level
book article
523
newspaper article
Robot reducing mining industry's environmental impact tested in Estonia
news.err.ee
2023
Robot reducing mining industry's environmental impact tested in Estonia
newspaper article
524
journal article
Role of experimental damage mechanics for the circular economy implementation in cotton industries
Hussein, Abrar
;
Abbas, Muhammad Mujtaba
Journal of Modern Nanotechnology
2021
/
9 p
https://doi.org/10.53964/jmn.2021004
journal article
525
book article
RT-level identification of potentially testable initialization faults
Raik, Jaan
;
Fujiwara, Hideo
;
Krivenko, Anna
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
2008
/
[6] p
https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults
book article
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