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526
book article
RT-level test point insertion for sequential circuits
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings
2004
/
p. 34-40 : ill
https://ieeexplore.ieee.org/document/1428412
book article
527
book article
Run-time reconfigurable instruments for advanced board-level testing
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
IEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings
2016
/
p. 385-392 : ill
https://doi.org/10.1109/AUTEST.2016.7589627
book article
528
journal article
Run-time reconfigurable instruments for advanced board-level testing
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
IEEE instrumentation & measurement magazine
2017
/
p. 23-30 : ill
https://doi.org/10.1109/MIM.2017.8006390
journal article
529
journal article EST
/
journal article ENG
Safeguarding female reproductive health against endocrine disrupting chemicals-The FREIA project
Duursen, Majorie B.M. van
;
Boberg, Julie
;
Christiansen, Sofie
;
Jääger, Kersti
;
Salumets, Andres
;
Velthut-Meikas, Agne
International journal of molecular sciences
2020
/
art. 3215
https://doi.org/10.3390/ijms21093215
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
530
book article EST
/
book article ENG
Safety-Critical Physically Informed Scenario Generation and Execution for Autonomous Vehicle Software Validation
Malayjerdi, Mohsen
;
Sell, Raivo
;
Razdan, Rahul
;
Malayjerdi, Ehsan
2025 IEEE International Automated Vehicle Validation Conference (IAVVC)
2025
https://ieeexplore.ieee.org/abstract/document/11219468
https://doi.org/10.1109/IAVVC61942.2025.11219468
book article EST
/
book article ENG
531
book article
A scalable technique to identify true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
2017
/
p. 152-157 : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
book article
532
dissertation
Scenario oriented model-based testing = Stsenaariumjuhitud mudelipõhine testimine
Halling, Evelin
2019
https://digi.lib.ttu.ee/i/?11943
dissertation
533
book article
Scenario-based Validation for Autonomous Vehicles with Different Fidelity Levels
Malayjerdi, Mohsen
;
Kaljavesi, Gemb
;
Diermeyer, Frank
;
Sell, Raivo
2023 IEEE Conference on Intelligent Transportation Systems (ITSC 2023)
2023
/
6 p
https://doi.org/10.1109/ITSC57777.2023.10422403
book article
534
dissertation
Scenario-based validation of safety and performance of an autonomous vehicle by a software in loop simulation method = Autonoomse sõiduki ohutuse ja jõudluse stsenaariumipõhine valideerimine tsüklisimulatsiooni meetodi abil
Malayjerdi, Mohsen
2023
https://doi.org/10.23658/taltech.43/2023
https://digikogu.taltech.ee/et/Item/5d3435ba-8ce1-4da6-8d16-4b279e88c861
https://www.ester.ee/record=b5574240*est
dissertation
Related publications
5
Development of a validation regime for an autonomous campus shuttle
Autonomous vehicle safety evaluation through a high-fidelity simulation approach
Combined safety and cybersecurity testing methodology for autonomous driving algorithms
A Two-layered approach for the validation of an operational autonomous shuttle
Virtual simulations environment development for autonomous vehicles interaction
535
journal article
Second IEEE East-West Design and Test Workshop
Hahanov, Vladimir
;
Ubar, Raimund-Johannes
IEEE journal of design & test of computers
2004
/
p. 594
journal article
536
dissertation
Selected issues of modeling, verification and testing of digital systems
Jutman, Artur
2004
https://www.ester.ee/record=b1989760*est
dissertation
537
dissertation
Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemid
Kostin, Sergei
2012
https://www.ester.ee/record=b2757857*est
dissertation
538
newspaper article
Self-driving bus to be tested in Mustamäe this summer [online resource]
news.err.ee
2021
"Self-driving bus to be tested in Mustamäe this summer "
newspaper article
539
book article
Self-learning tool for digital test
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Evartson, Teet
Proceedings of 2nd International Conference "Distance Learning - Educational Sphere of the XXI Century"
2002
/
p. 36-38 : ill
book article
540
book article
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
book article
541
book article
Sequential circuit test generation using decision diagram models
Raik, Jaan
;
Ubar, Raimund-Johannes
Design, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings
1999
/
p. 736-740: ill
https://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/1999/date99/pdffiles/11e_1.pdf
book article
542
book article
Sequential circuits BIST synthesis from signal specifications
Raik, Jaan
;
Jenihhin, Maksim
;
Adelbert, Rain
Proceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 2005
2005
/
p. 196-199 : ill
https://ieeexplore.ieee.org/document/1597023
book article
543
book article
Sequential circuits BIST with status bit control
Raik, Jaan
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004
2004
/
p. 507-510 : ill
https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf
book article
544
book article
Sequential test set compaction in LFSR reseeding
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
Design and test technology for dependable systems-on-chip
2011
/
p. 476-493 : ill
https://ieeexplore.ieee.org/document/4738292
book article
545
book article
A set of tools for estimating quality of built-in self-test in digital circuits
Jervan, Gert
;
Markus, Antti
;
Paomets, Priidu
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the International Symposium on Signals, Circuits and Systems, Iasi (Romania), October 2-3, 1997
1997
/
p. 362-365
book article
546
book article
Shift register based TPG for at-speed interconnect BIST
Jutman, Artur
MIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 2
2004
/
p. 751-754 : ill
https://ieeexplore.ieee.org/document/1314941?signout=success
book article
547
book article
Simulation and automated test development system for digital devices
Birger, Alexander
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 293-295
book article
548
journal article
Simulation of wear in a rolling-sliding contact by a semi-Winkler model and the Archard's wear law
Telliskivi, Tanel
Wear
2004
/
7/8, p. 817-831 : ill
https://www.sciencedirect.com/science/article/abs/pii/S0043164803005246
journal article
549
journal article EST
/
journal article ENG
Single-stage buck–boost inverters: a state-of-the-art survey
Azizi, Mohammadreza
;
Husev, Oleksandr
;
Vinnikov, Dmitri
Energies
2022
/
art. 1622
https://doi.org/10.3390/en15051622
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
550
journal article
Sisseehitatud isetestimine digitaalsüsteemides
Kruus, Helena
A & A
2011
/
lk. 32-37 : ill
https://artiklid.elnet.ee/record=b2472216*est
journal article
Number of records 799, displaying
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