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testimine (subject term)
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601
book article
Test method for determining radiation absorptivity and emissivity coefficients of ACSR conductors
Kiitam, Ivar
18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]
2019
/
p. 185-186 : ill
https://www.ester.ee/record=b5183874*est
book article
602
journal article
Test method for the total content of non-volatile phenols in wastewater
Johannes, Ille
;
Mölder, Leevi
;
Tiikma, Laine
Oil shale
1998
/
3, p. 232-238
journal article
603
book article
Test pattern generation at the behavioral level from VHDL circuit description containing several processes
Gramatova, Elena
;
Bezakova, Jana
;
Cibakova, Tatiana
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 145-148
book article
604
dissertation
Test program generation for microprocessor systems
Dušina, Julia
1993
https://www.ester.ee/record=b2090526*est
dissertation
605
book article
Test scenario generator learning for model-based testing of mobile robots
Kanter, Gert
;
Liibert, Marti Ingmar
System assurances : modeling and management
2022
/
p. 67-84
https://doi.org/10.1016/B978-0-323-90240-3.00005-9
book article
606
journal article EST
/
journal article ENG
Test scenario specification language for model-based testing
Halling, Evelin
;
Vain, Jüri
;
Boyarchuk, Artem
;
Illiashenko, Oleg
International Journal of Computing
2019
/
p. 408-421 : ill
http://www.computingonline.net/computing/article/view/1611
https://doi.org/10.47839/ijc.18.4.1611
Journal metrics at Scopus
Article at Scopus
journal article EST
/
journal article ENG
607
book article
Test set minimization using bipartite graphs
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 175-178: ill
book article
608
book article
Test strategy for a 486 computer multichip module
Magnhagen, Bengt
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 339-340: ill
book article
609
book article
Test synthesis from register-transfer level descriptions
Raik, Jaan
;
Paomets, Priidu
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 311-314: ill
book article
610
journal article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Journal of computer science and technology
2006
/
6, p. 907-912 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
journal article
611
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
book article
612
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf
book article
613
book article
Testability analysis for efficient register-transfer level test generation [Electronic resource]
Nõmmeots, Tanel
;
Raik, Jaan
;
Ubar, Raimund-Johannes
9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 2002
2002
/
[4] p. [CD-ROM]
book article
614
book article
Testability analysis of digital design verification
Hahanov, V.
;
Kaminska, M.
;
Fomina, Jelena
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 171-174 : ill
book article
615
book article
Testability calculation for digital circuits with decision diagrams
Ubar, Raimund-Johannes
3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers
2002
/
p. 137-143 : ill
https://dblp.org/rec/conf/latw/Ubar02.html
book article
616
book article
Testability guided hierarchical test generation with decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Nõmmeots, Tanel
20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002
2002
/
p. 265-271
https://www.semanticscholar.org/paper/Testability-Guided-Hierarchical-Test-Generation-Ubar-Raik/c6301ac35d003c92f3867f26e2e75b87e1ad9b47
book article
617
book article
Testentwurf für digitale Geräte mit Hilfe der Alternativgraphen
Voolaine, Andrus
;
Pall, Martin
;
Plakk, Mari
Fehler in Automaten
1989
/
S. 31-44 : Ill
book article
618
book article
Tester partitioning and synchronization algorithm for testing real-time distributed systems
Pal, Deepak
;
Vain, Jüri
Proceedings of the 10th Junior Researcher Workshop on Real-Time Computing : JRWRTC 2016 : Brest, France, October 19-21, 2016
2016
/
p. 13-16 : ill
http://jrwrtc2016.gforge.inria.fr/
book article
619
book
Testid harjutamiseks
Teichmann, Mare
;
Anton, Riina
1997
book
620
book article
Testieren der kommunikativen Sprachkompetenz
Serwuta, A.
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 92-94
book article
621
journal article EST
/
journal article ENG
Testing a method for evaluating the performance of coatings on end mills in semi-industrial conditions
Leemet, Tõnu
;
Allas, Jaanus
;
Madissoo, Marten
;
Adoberg, Eron
;
Saar, Rando
Agronomy research
2014
/
p. 263-268 : ill
https://www.cabidigitallibrary.org/doi/pdf/10.5555/20143184842
Journal metrics at Scopus
Article at Scopus
journal article EST
/
journal article ENG
622
book article
Testing as a means of consolidation of students' knowledge
Shaymardanova, Sh.Kh.
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 94-95
book article
623
book article
Testing beyond the SoCs in a lego style
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010
2010
/
p. 334-338 : ill
https://ieeexplore.ieee.org/document/5742052
book article
624
book article
Testing different power system out-of-step detection algorithms
Tealane, Marko
18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]
2019
/
p. 199-200 : ill
https://www.ester.ee/record=b5183874*est
book article
625
book article
Testing English for specific purposes
Tsaturova, I.
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 100-102
book article
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