Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Searching

test equipment (keyword)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 4
Look more.. (2/158)
Export

export all inquiry results (4)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

Dynamic control system for electric motor drive testing on the test benchRassõlkin, Anton; Kallaste, Ants; Vaimann, Toomas2015 9th International Conference on Compatibility and Power Electronics (CPE) : proceedings : Faculty of Science and Technology (FCT), Caparica, Lisbon, Portugal, 24-26 June, 20152015 / p. 252-257 : ill http://dx.doi.org/10.1109/CPE.2015.7231082

book article
2

book article

A library of samples for testing variable load electric drivesLiivik, Liisa; Vodovozov, Valery; Rassõlkin, AntonDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 12.1-12.6 : ill

book article
3

journal article

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

journal article
4

book article

Study of e-vehicle drive behaviour under changeable controlRassõlkin, Anton; Vodovozov, Valery; Raud, ZojaDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 13.1-13.5 : ill

book article

Number of records 4, displaying 1 - 4

1. test equipment
2. bakery equipment
3. electric control equipment
4. hydraulic equipment
5. manufacturing equipment
6. material handling equipment
7. optical communication equipment
8. overall equipment effectiveness
9. overall equipment effectiveness (OEE)
10. overall equipment efficiency
11. power quality measurement equipment
12. price-sensitive model of flexible equipment
13. technological equipment
14. used equipment
15. used industrial equipment
16. waste from electrical and electronic equipment
17. virtual equipment
18. accelerated shelf-life test
19. adaptive test strategy generation
20. antigen test
21. Applications in Test Engineering
22. ASTM G65 dry sand rubber wheel abrasion test
23. Automated Synthesis of Software-based Self-test
24. automated test environment
25. automated test pattern generation
26. automatic test case generation
27. automatic test pattern generation
28. automatic test program generation
29. Auvergne test-bed
30. battery test
31. behavioral test
32. behaviour level test generation
33. bending test
34. bit-error rate test
35. Board and System Test
36. board test
37. bounds test
38. built-in self-test
39. capillary condensation redistribution test
40. chi-square test
41. closed bottle test
42. cognitive screening test
43. compartment fire test
44. compartment test
45. cone penetration test (CPT)
46. COVID-19 antigen test
47. cutting test
48. cybersecurity test bed
49. DDR4 interconnect test
50. design and test
51. design-for-test
52. deterministic test sequences
53. diagnostic test
54. digital test
55. Digital test and testable design
56. double-pulse test
57. drawing test
58. dry droplet antimicrobial test
59. embedded test
60. fan pressurisation test
61. final test result prediction
62. four-point bending test
63. FPGA based test
64. FPGA-Assisted Test
65. FPGA-centric test
66. functional self-test
67. functional test generation
68. Granger causality test
69. hardness test
70. Hierarchical Multi-level Test Generation
71. high-level synthesis for test
72. high-level test data generation
73. highlevel test generation
74. high-speed serial link test
75. IEEE 9 bus test system
76. implementation-independent test generation
77. in situ tensile test in SEM
78. industrial field test
79. in-situ tensile test in SEM
80. Johansen cointegration test
81. Kolmogorov-Smirnov test
82. load test
83. logic built-in self-test
84. Luria alternating series test
85. Mann–Kendall test
86. memory interconnect test
87. microprocessor test
88. Model test
89. multiplier test
90. offline test generation
91. orthogonal test
92. package test analysis
93. parallel design and test
94. performance test
95. piezocone penetration test (CPTu)
96. Point Load Test index
97. pressurisation test
98. processor-centric board test
99. progressive damage test
100. provably correct test generation
101. pseudo-exhaustive test
102. purity test
103. rolling thin film oven test
104. rtioco-based timed test sequences
105. seasonal Mann Kendall test
106. seismic piezocone penetration test
107. self-test
108. self-test architectures
109. sentence writing test
110. serial sevens test
111. ship towing test tank
112. similar material simulation test
113. small-scale fire test
114. small‐scale test
115. software based self-test
116. software-based self-test
117. software-based self-test (SBST)
118. soil phosphorus (P) test
119. standard test method
120. static load test
121. static-dynamic probing test (SDT)
122. stress test
123. system level test
124. teaching design and test of systems
125. tensile test
126. test
127. test and evaluation platform
128. test automation
129. test bench
130. test coverage
131. test driven development
132. test driven modelling
133. test embankment
134. test generation
135. test generation and fault diagnosis
136. Test Group Generation for Detecting Multiple Faults
137. test groups
138. test model design
139. test optimization
140. test packets
141. test path synthesis
142. test patterns
143. test point insertion
144. test program generation
145. test reference year
146. test replication
147. test scenario description language
148. test-bed
149. test-chips
150. test-house
151. test-pattern
152. test-suite reduction
153. Three-point bending test
154. unit root test
155. usability platform test
156. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

match

sort

Otsing
Valikud 0

year of publication

author

TalTech department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digital Collection of TalTech Library Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu