Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
semiconductor device reliability (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
1
Look more..
(1/80)
Export
export all inquiry results
(1)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
journal article
Short-circuit protection circuits for silicon-carbide power transistors
Sadik, Diane-Perle
;
Colmenares, Juan
;
Tolstoy, Georg
;
Rabkowski, Jacek
IEEE transactions on industrial electronics
2016
/
p. 1995-2004 : ill
https://doi.org/10.1109/TIE.2015.2506628
journal article
Number of records 1, displaying
1 - 1
keyword
80
1.
semiconductor device reliability
2.
power semiconductor device
3.
semiconductor device failure
4.
semiconductor device manufacture
5.
semiconductor device measurement
6.
semiconductor device modeling
7.
Semiconductor device packaging
8.
device-to-device (D2D)
9.
device-to-device (D2D) communication
10.
device-to-device communication
11.
metal semiconductor contacts
12.
metal-oxide-semiconductor field-effect transistors (MOSFETs)
13.
power semiconductor devices
14.
power semiconductor switches
15.
p-type transparent semiconductor
16.
semiconductor
17.
semiconductor band bending
18.
semiconductor crystals
19.
semiconductor devices
20.
semiconductor diodes
21.
semiconductor doping
22.
semiconductor heterojunctions
23.
semiconductor technology
24.
Semiconductor/electrolyte contact
25.
semiconductor-metal transition
26.
wide band gap semiconductor devices
27.
cardiac device therapy
28.
cooling device performance
29.
Counter Improvised Explosive Device (C-IED)
30.
device
31.
device capacity
32.
device characterisation
33.
Device characterization
34.
device modeling
35.
device therapy
36.
Discrete power device
37.
energy saving device (ESD)
38.
energy storage device
39.
implantable medical device
40.
Improvised Explosive Device (IED)
41.
low-power device
42.
massive device connectivity
43.
medical device
44.
microfluidic device
45.
motion-reduction device
46.
on-device transfer learning
47.
plasma-focus device
48.
Portable device
49.
projected device density of states (PDDOS)
50.
Real device
51.
robotic device
52.
storage device
53.
Superconducting device noise
54.
Wearable device
55.
cross-layer reliability
56.
engineering reliability operational probabilities
57.
framework of reliability estimation
58.
hardware reliability
59.
high reliability
60.
high reliability leadership
61.
high reliability management
62.
high reliability organizations
63.
materials reliability
64.
Network reliability
65.
power reliability
66.
power system reliability
67.
process reliability
68.
reliability
69.
reliability analysis
70.
reliability assessment
71.
reliability assessment and enhancement
72.
Reliability engineering
73.
reliability evaluation
74.
reliability optimization
75.
reliability prediction
76.
reliability verification
77.
reliability-performance trade-off
78.
soft-error reliability
79.
substation reliability
80.
system reliability
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT