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multiplier test (keyword)
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book article
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
book article
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keyword
153
1.
multiplier test
2.
alternating direction multiplier method
3.
Booth multiplier
4.
karatsuba multiplier
5.
lagrangian multiplier
6.
multiplier effect
7.
schoolbook multiplier
8.
toom cook multiplier
9.
voltage multiplier
10.
voltage multiplier cell
11.
voltage multiplier cell (VMC)
12.
accelerated shelf-life test
13.
adaptive test strategy generation
14.
antigen test
15.
Applications in Test Engineering
16.
ASTM G65 dry sand rubber wheel abrasion test
17.
Automated Synthesis of Software-based Self-test
18.
automated test environment
19.
automated test pattern generation
20.
automatic test case generation
21.
automatic test pattern generation
22.
automatic test program generation
23.
Auvergne test-bed
24.
battery test
25.
behavioral test
26.
behaviour level test generation
27.
bending test
28.
bit-error rate test
29.
Board and System Test
30.
board test
31.
bounds test
32.
built-in self-test
33.
capillary condensation redistribution test
34.
chi-square test
35.
closed bottle test
36.
cognitive screening test
37.
compartment fire test
38.
compartment test
39.
cone penetration test (CPT)
40.
COVID-19 antigen test
41.
cutting test
42.
cybersecurity test bed
43.
DDR4 interconnect test
44.
design and test
45.
design-for-test
46.
deterministic test sequences
47.
diagnostic test
48.
digital test
49.
Digital test and testable design
50.
double-pulse test
51.
drawing test
52.
dry droplet antimicrobial test
53.
embedded test
54.
fan pressurisation test
55.
final test result prediction
56.
four-point bending test
57.
FPGA based test
58.
FPGA-Assisted Test
59.
FPGA-centric test
60.
functional self-test
61.
functional test generation
62.
Granger causality test
63.
hardness test
64.
Hierarchical Multi-level Test Generation
65.
high-level synthesis for test
66.
high-level test data generation
67.
highlevel test generation
68.
high-speed serial link test
69.
IEEE 9 bus test system
70.
implementation-independent test generation
71.
in situ tensile test in SEM
72.
industrial field test
73.
in-situ tensile test in SEM
74.
Johansen cointegration test
75.
Kolmogorov-Smirnov test
76.
load test
77.
logic built-in self-test
78.
Luria alternating series test
79.
Mann–Kendall test
80.
Mann-Kendall trend test
81.
memory interconnect test
82.
microprocessor test
83.
Model test
84.
offline test generation
85.
orthogonal test
86.
package test analysis
87.
parallel design and test
88.
performance test
89.
piezocone penetration test (CPTu)
90.
Point Load Test index
91.
pressurisation test
92.
processor-centric board test
93.
progressive damage test
94.
provably correct test generation
95.
pseudo-exhaustive test
96.
purity test
97.
real-time room temperature test
98.
rolling thin film oven test
99.
rtioco-based timed test sequences
100.
seasonal Mann Kendall test
101.
seismic piezocone penetration test
102.
self-test
103.
self-test architectures
104.
sentence writing test
105.
serial sevens test
106.
ship towing test tank
107.
similar material simulation test
108.
small-scale fire test
109.
small‐scale test
110.
software based self-test
111.
software-based self-test
112.
software-based self-test (SBST)
113.
soil phosphorus (P) test
114.
standard test method
115.
static load test
116.
static-dynamic probing test (SDT)
117.
stress test
118.
system level test
119.
teaching design and test of systems
120.
tensile test
121.
tensile test
122.
test
123.
test and evaluation platform
124.
test automation
125.
test bench
126.
test coverage
127.
test driven development
128.
test driven modelling
129.
test embankment
130.
test equipment
131.
test generation
132.
test generation and fault diagnosis
133.
Test Group Generation for Detecting Multiple Faults
134.
test groups
135.
test model design
136.
test optimization
137.
test packets
138.
test path synthesis
139.
test patterns
140.
test point insertion
141.
test program generation
142.
test reference year
143.
test replication
144.
test scenario description language
145.
test-bed
146.
test-chips
147.
test-house
148.
test-pattern
149.
test-suite reduction
150.
Three-point bending test
151.
unit root test
152.
usability platform test
153.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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