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high-level test data generation (keyword)
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book article
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
book article
2
book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
Number of records 2, displaying
1 - 2
keyword
42
1.
high-level test data generation
2.
behaviour level test generation
3.
Hierarchical Multi-level Test Generation
4.
high-level synthesis for test
5.
logic level and high level BDDs
6.
extreme penetration level of non synchronous generation
7.
adaptive test strategy generation
8.
automated test pattern generation
9.
automatic test case generation
10.
automatic test pattern generation
11.
automatic test program generation
12.
data set generation
13.
functional test generation
14.
highlevel test generation
15.
implementation-independent test generation
16.
offline test generation
17.
provably correct test generation
18.
test generation
19.
test generation and fault diagnosis
20.
Test Group Generation for Detecting Multiple Faults
21.
test program generation
22.
system level test
23.
high level DD (HLDD)
24.
high level of security
25.
high level synthesis
26.
high-level control fault model
27.
high-level control faults
28.
high-level decision diagram
29.
high-level decision diagrams
30.
high-level decision diagrams (HLDD) synthesis
31.
High-level Decision Diagrams for Modeling Digital Systems
32.
high-level expert group on AI
33.
high-level fault coverage
34.
high-level fault model
35.
high-level fault simulation
36.
high-level functional fault model
37.
high-level synthesis
38.
High-Level Synthesis (HLS)
39.
high-speed serial link test
40.
high-dimensional data
41.
high-frequency data
42.
High-Pressure High-Temperature Spark Plasma Sintering
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