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Board and System Test (keyword)
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book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
Number of records 1, displaying
1 - 1
keyword
143
1.
Board and System Test
2.
board test
3.
processor-centric board test
4.
IEEE 9 bus test system
5.
system level test
6.
board
7.
board composition
8.
board diagnosis
9.
board diversity
10.
board of directors
11.
Estonian Police and Border Guard Board (PPA)
12.
laminate embedded printed circuit board
13.
off-board charger
14.
on-board charger (OBC)
15.
processor-centric board
16.
single board computer
17.
accelerated shelf-life test
18.
adaptive test strategy generation
19.
antigen test
20.
ASTM G65 dry sand rubber wheel abrasion test
21.
automated test environment
22.
automated test pattern generation
23.
automatic test case generation
24.
automatic test pattern generation
25.
automatic test program generation
26.
Auvergne test-bed
27.
battery test
28.
behavioral test
29.
behaviour level test generation
30.
bending test
31.
bit-error rate test
32.
bounds test
33.
built-in self-test
34.
capillary condensation redistribution test
35.
chi-square test
36.
closed bottle test
37.
cognitive screening test
38.
compartment fire test
39.
compartment test
40.
cone penetration test (CPT)
41.
COVID-19 antigen test
42.
cutting test
43.
cybersecurity test bed
44.
DDR4 interconnect test
45.
design and test
46.
design-for-test
47.
deterministic test sequences
48.
diagnostic test
49.
digital test
50.
Digital test and testable design
51.
double-pulse test
52.
drawing test
53.
dry droplet antimicrobial test
54.
embedded test
55.
fan pressurisation test
56.
final test result prediction
57.
four-point bending test
58.
FPGA based test
59.
FPGA-Assisted Test
60.
FPGA-centric test
61.
functional self-test
62.
functional test generation
63.
Granger causality test
64.
hardness test
65.
high-level synthesis for test
66.
high-level test data generation
67.
highlevel test generation
68.
high-speed serial link test
69.
implementation-independent test generation
70.
in situ tensile test in SEM
71.
industrial field test
72.
in-situ tensile test in SEM
73.
Johansen cointegration test
74.
Kolmogorov-Smirnov test
75.
load test
76.
logic built-in self-test
77.
Luria alternating series test
78.
Mann–Kendall test
79.
memory interconnect test
80.
microprocessor test
81.
Model test
82.
multiplier test
83.
offline test generation
84.
orthogonal test
85.
package test analysis
86.
parallel design and test
87.
performance test
88.
piezocone penetration test (CPTu)
89.
Point Load Test index
90.
pressurisation test
91.
progressive damage test
92.
provably correct test generation
93.
pseudo-exhaustive test
94.
purity test
95.
rtioco-based timed test sequences
96.
seasonal Mann Kendall test
97.
seismic piezocone penetration test
98.
self-test
99.
self-test architectures
100.
sentence writing test
101.
serial sevens test
102.
ship towing test tank
103.
similar material simulation test
104.
small‐scale test
105.
software based self-test
106.
software-based self-test
107.
software-based self-test (SBST)
108.
soil phosphorus (P) test
109.
standard test method
110.
static load test
111.
static-dynamic probing test (SDT)
112.
stress test
113.
teaching design and test of systems
114.
tensile test
115.
test
116.
test and evaluation platform
117.
test bench
118.
test coverage
119.
test driven development
120.
test driven modelling
121.
test embankment
122.
test equipment
123.
test generation
124.
test generation and fault diagnosis
125.
test groups
126.
test model design
127.
test optimization
128.
test packets
129.
test path synthesis
130.
test patterns
131.
test point insertion
132.
test program generation
133.
test reference year
134.
test replication
135.
test scenario description language
136.
test-bed
137.
test-chips
138.
test-house
139.
test-pattern
140.
test-suite reduction
141.
Three-point bending test
142.
unit root test
143.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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