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Board and System Test (keyword)
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book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
Number of records 1, displaying
1 - 1
keyword
159
1.
Board and System Test
2.
board test
3.
processor-centric board test
4.
IEEE 9 bus test system
5.
system level test
6.
across-the-board cuts
7.
board
8.
board composition
9.
board diagnosis
10.
board diversity
11.
board of directors
12.
Estonian Police and Border Guard Board (PPA)
13.
laminate embedded printed circuit board
14.
off-board charger
15.
off-board charger (OBC)
16.
off-board chargers
17.
on-board charger (OBC)
18.
on-board chargers
19.
processor-centric board
20.
single board computer
21.
single-board computer
22.
accelerated shelf-life test
23.
adaptive test strategy generation
24.
antigen test
25.
Applications in Test Engineering
26.
ASTM G65 dry sand rubber wheel abrasion test
27.
Automated Synthesis of Software-based Self-test
28.
automated test environment
29.
automated test pattern generation
30.
automatic test case generation
31.
automatic test pattern generation
32.
automatic test program generation
33.
Auvergne test-bed
34.
battery test
35.
behavioral test
36.
behaviour level test generation
37.
bending test
38.
bit-error rate test
39.
bounds test
40.
built-in self-test
41.
capillary condensation redistribution test
42.
chi-square test
43.
closed bottle test
44.
cognitive screening test
45.
compartment fire test
46.
compartment test
47.
cone penetration test (CPT)
48.
COVID-19 antigen test
49.
cutting test
50.
cybersecurity test bed
51.
DDR4 interconnect test
52.
design and test
53.
design-for-test
54.
deterministic test sequences
55.
diagnostic test
56.
digital test
57.
Digital test and testable design
58.
double-pulse test
59.
drawing test
60.
dry droplet antimicrobial test
61.
embedded test
62.
fan pressurisation test
63.
final test result prediction
64.
four-point bending test
65.
FPGA based test
66.
FPGA-Assisted Test
67.
FPGA-centric test
68.
functional self-test
69.
functional test generation
70.
Granger causality test
71.
hardness test
72.
Hierarchical Multi-level Test Generation
73.
high-level synthesis for test
74.
high-level test data generation
75.
highlevel test generation
76.
high-speed serial link test
77.
implementation-independent test generation
78.
in situ tensile test in SEM
79.
industrial field test
80.
in-situ tensile test in SEM
81.
Johansen cointegration test
82.
Kolmogorov-Smirnov test
83.
load test
84.
logic built-in self-test
85.
Luria alternating series test
86.
Mann–Kendall test
87.
Mann-Kendall trend test
88.
memory interconnect test
89.
microprocessor test
90.
Model test
91.
multiplier test
92.
offline test generation
93.
orthogonal test
94.
package test analysis
95.
parallel design and test
96.
performance test
97.
piezocone penetration test (CPTu)
98.
Point Load Test index
99.
pressurisation test
100.
progressive damage test
101.
provably correct test generation
102.
pseudo-exhaustive test
103.
purity test
104.
real-time room temperature test
105.
rolling thin film oven test
106.
rtioco-based timed test sequences
107.
seasonal Mann Kendall test
108.
seismic piezocone penetration test
109.
self-test
110.
self-test architectures
111.
sentence writing test
112.
serial sevens test
113.
ship towing test tank
114.
similar material simulation test
115.
small-scale fire test
116.
small‐scale test
117.
software based self-test
118.
software-based self-test
119.
software-based self-test (SBST)
120.
soil phosphorus (P) test
121.
standard test method
122.
static load test
123.
static-dynamic probing test (SDT)
124.
stress test
125.
teaching design and test of systems
126.
tensile test
127.
tensile test
128.
test
129.
test and evaluation platform
130.
test automation
131.
test bench
132.
test coverage
133.
test driven development
134.
test driven modelling
135.
test embankment
136.
test equipment
137.
test generation
138.
test generation and fault diagnosis
139.
Test Group Generation for Detecting Multiple Faults
140.
test groups
141.
test model design
142.
test optimization
143.
test packets
144.
test path synthesis
145.
test patterns
146.
test point insertion
147.
test program generation
148.
test reference year
149.
test replication
150.
test scenario description language
151.
test-bed
152.
test-chips
153.
test-house
154.
test-pattern
155.
test-suite reduction
156.
Three-point bending test
157.
unit root test
158.
usability platform test
159.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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