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journal article EST
/
journal article ENG
Performance of Al2O3-cBN materials and the perspective of using hyperspectral imaging during cutting tests
Antonov, Maksim
;
Zahavi, Ali
;
Kumar, Rahul, 1993-
;
Tamre, Mart
;
Klimczyk, Piotr
Proceedings of the Estonian Academy of Sciences
2021
/
p. 524-532 : ill
https://doi.org/10.3176/proc.2021.4.21
Journal Metrics at Scopus
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journal article EST
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journal article ENG
Number of records 1, displaying
1 - 1
keyword
152
1.
cutting test
2.
abrasive cutting
3.
cutting
4.
cutting tool wear phenomenon
5.
cutting tools
6.
metal cutting
7.
ozone cutting
8.
steel cutting
9.
wearingand cutting
10.
wood cutting
11.
accelerated shelf-life test
12.
adaptive test strategy generation
13.
antigen test
14.
Applications in Test Engineering
15.
ASTM G65 dry sand rubber wheel abrasion test
16.
Automated Synthesis of Software-based Self-test
17.
automated test environment
18.
automated test pattern generation
19.
automatic test case generation
20.
automatic test pattern generation
21.
automatic test program generation
22.
Auvergne test-bed
23.
battery test
24.
behavioral test
25.
behaviour level test generation
26.
bending test
27.
bit-error rate test
28.
Board and System Test
29.
board test
30.
bounds test
31.
built-in self-test
32.
capillary condensation redistribution test
33.
chi-square test
34.
closed bottle test
35.
cognitive screening test
36.
compartment fire test
37.
compartment test
38.
cone penetration test (CPT)
39.
COVID-19 antigen test
40.
cybersecurity test bed
41.
DDR4 interconnect test
42.
design and test
43.
design-for-test
44.
deterministic test sequences
45.
diagnostic test
46.
digital test
47.
Digital test and testable design
48.
double-pulse test
49.
drawing test
50.
dry droplet antimicrobial test
51.
embedded test
52.
fan pressurisation test
53.
final test result prediction
54.
four-point bending test
55.
FPGA based test
56.
FPGA-Assisted Test
57.
FPGA-centric test
58.
functional self-test
59.
functional test generation
60.
Granger causality test
61.
hardness test
62.
Hierarchical Multi-level Test Generation
63.
high-level synthesis for test
64.
high-level test data generation
65.
highlevel test generation
66.
high-speed serial link test
67.
IEEE 9 bus test system
68.
implementation-independent test generation
69.
in situ tensile test in SEM
70.
industrial field test
71.
in-situ tensile test in SEM
72.
Johansen cointegration test
73.
Kolmogorov-Smirnov test
74.
load test
75.
logic built-in self-test
76.
Luria alternating series test
77.
Mann–Kendall test
78.
Mann-Kendall trend test
79.
memory interconnect test
80.
microprocessor test
81.
Model test
82.
multiplier test
83.
offline test generation
84.
orthogonal test
85.
package test analysis
86.
parallel design and test
87.
performance test
88.
piezocone penetration test (CPTu)
89.
Point Load Test index
90.
pressurisation test
91.
processor-centric board test
92.
progressive damage test
93.
provably correct test generation
94.
pseudo-exhaustive test
95.
purity test
96.
real-time room temperature test
97.
rolling thin film oven test
98.
rtioco-based timed test sequences
99.
seasonal Mann Kendall test
100.
seismic piezocone penetration test
101.
self-test
102.
self-test architectures
103.
sentence writing test
104.
serial sevens test
105.
ship towing test tank
106.
similar material simulation test
107.
small-scale fire test
108.
small‐scale test
109.
software based self-test
110.
software-based self-test
111.
software-based self-test (SBST)
112.
soil phosphorus (P) test
113.
standard test method
114.
static load test
115.
static-dynamic probing test (SDT)
116.
stress test
117.
system level test
118.
teaching design and test of systems
119.
tensile test
120.
tensile test
121.
test
122.
test and evaluation platform
123.
test automation
124.
test bench
125.
test coverage
126.
test driven development
127.
test driven modelling
128.
test embankment
129.
test equipment
130.
test generation
131.
test generation and fault diagnosis
132.
Test Group Generation for Detecting Multiple Faults
133.
test groups
134.
test model design
135.
test optimization
136.
test packets
137.
test path synthesis
138.
test patterns
139.
test point insertion
140.
test program generation
141.
test reference year
142.
test replication
143.
test scenario description language
144.
test-bed
145.
test-chips
146.
test-house
147.
test-pattern
148.
test-suite reduction
149.
Three-point bending test
150.
unit root test
151.
usability platform test
152.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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