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journal article EST
/
journal article ENG
Performance of Al2O3-cBN materials and the perspective of using hyperspectral imaging during cutting tests
Antonov, Maksim
;
Zahavi, Ali
;
Kumar, Rahul, 1993-
;
Tamre, Mart
;
Klimczyk, Piotr
Proceedings of the Estonian Academy of Sciences
2021
/
p. 524-532 : ill
https://doi.org/10.3176/proc.2021.4.21
Journal Metrics at Scopus
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journal article EST
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journal article ENG
Number of records 1, displaying
1 - 1
keyword
156
1.
cutting test
2.
abrasive cutting
3.
cutting
4.
cutting and packing problems
5.
cutting tool wear phenomenon
6.
cutting tools
7.
metal cutting
8.
ozone cutting
9.
steel cutting
10.
wearingand cutting
11.
wood cutting
12.
accelerated shelf-life test
13.
adaptive test strategy generation
14.
antigen test
15.
Applications in Test Engineering
16.
ASTM G65 dry sand rubber wheel abrasion test
17.
Automated Synthesis of Software-based Self-test
18.
automated test environment
19.
automated test pattern generation
20.
automatic test case generation
21.
automatic test pattern generation
22.
automatic test program generation
23.
Auvergne test-bed
24.
battery test
25.
behavioral test
26.
behaviour level test generation
27.
bending test
28.
bit-error rate test
29.
Board and System Test
30.
board test
31.
bounds test
32.
built-in self-test
33.
capillary condensation redistribution test
34.
chi-square test
35.
closed bottle test
36.
cognitive screening test
37.
compartment fire test
38.
compartment test
39.
cone penetration test (CPT)
40.
COVID-19 antigen test
41.
cybersecurity test bed
42.
DDR4 interconnect test
43.
design and test
44.
design-for-test
45.
deterministic test sequences
46.
diagnostic test
47.
digital test
48.
Digital test and testable design
49.
double-pulse test
50.
drawing test
51.
dry droplet antimicrobial test
52.
Embedded figures test
53.
embedded test
54.
fan pressurisation test
55.
final test result prediction
56.
four-point bending test
57.
FPGA based test
58.
FPGA-Assisted Test
59.
FPGA-centric test
60.
functional self-test
61.
functional test generation
62.
Granger causality test
63.
hardness test
64.
Hierarchical Multi-level Test Generation
65.
high-level synthesis for test
66.
high-level test data generation
67.
highlevel test generation
68.
high-speed serial link test
69.
IEEE 9 bus test system
70.
implementation-independent test generation
71.
in situ tensile test in SEM
72.
industrial field test
73.
in-situ tensile test in SEM
74.
Johansen cointegration test
75.
Kolmogorov-Smirnov test
76.
load test
77.
logic built-in self-test
78.
Luria alternating series test
79.
Mann–Kendall test
80.
Mann-Kendall trend test
81.
memory interconnect test
82.
microprocessor test
83.
Model test
84.
multiplier test
85.
offline test generation
86.
orthogonal test
87.
package test analysis
88.
parallel design and test
89.
performance test
90.
piezocone penetration test (CPTu)
91.
Point Load Test index
92.
pressurisation test
93.
processor-centric board test
94.
progressive damage test
95.
Provably Correct Test Development
96.
provably correct test generation
97.
pseudo-exhaustive test
98.
purity test
99.
real-time room temperature test
100.
rolling thin film oven test
101.
rtioco-based timed test sequences
102.
seasonal Mann Kendall test
103.
seismic piezocone penetration test
104.
self-test
105.
self-test architectures
106.
sentence writing test
107.
serial sevens test
108.
ship towing test tank
109.
similar material simulation test
110.
small-scale fire test
111.
small‐scale test
112.
software based self-test
113.
software-based self-test
114.
software-based self-test (SBST)
115.
soil phosphorus (P) test
116.
standard test method
117.
static load test
118.
static-dynamic probing test (SDT)
119.
stress test
120.
system level test
121.
teaching design and test of systems
122.
tensile test
123.
tensile test
124.
test
125.
Test Adapters
126.
test and evaluation platform
127.
test automation
128.
test bench
129.
test coverage
130.
test driven development
131.
test driven modelling
132.
test embankment
133.
test equipment
134.
test generation
135.
test generation and fault diagnosis
136.
Test Group Generation for Detecting Multiple Faults
137.
test groups
138.
test model design
139.
test optimization
140.
test packets
141.
test path synthesis
142.
test patterns
143.
test point insertion
144.
test program generation
145.
test reference year
146.
test replication
147.
test scenario description language
148.
test-bed
149.
test-chips
150.
test-house
151.
test-pattern
152.
test-suite reduction
153.
Three-point bending test
154.
unit root test
155.
usability platform test
156.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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