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1
journal article
Correlation between COVID-19 cases and gold price fluctuation
Gautam, Roshan
;
Kim, Yoochan
;
Topal, Erkan
;
Hitch, Michael William
International journal of mining, reclamation and environment
2022
/
p. 574-586
https://doi.org/10.1080/17480930.2022.2077542
journal article
Number of records 1, displaying
1 - 1
keyword
161
1.
unit root test
2.
root causes
3.
Root exudates
4.
root identification
5.
Root Mean Square (RMS)
6.
root structures
7.
root vegetable
8.
square root area parameter
9.
air handling unit configuration
10.
CHP unit
11.
decentralized ventilation unit
12.
energy control unit (ECU)
13.
graphics processing unit
14.
inertial measurement unit
15.
inertial measurement unit (IMU)
16.
isolated power conditioning unit (PCU)
17.
neural processing unit
18.
phasor measurement unit
19.
Phasor measurement unit (PMU)
20.
pilot unit
21.
room air handling unit
22.
room unit based ventilation
23.
single room ventilation unit
24.
syntagmatic unit
25.
unit commitment
26.
unit labour costs
27.
Unit non-response
28.
unit roots
29.
ventilation unit
30.
virtual micro controller unit, VMCU
31.
accelerated shelf-life test
32.
adaptive test strategy generation
33.
antigen test
34.
ASTM G65 dry sand rubber wheel abrasion test
35.
automated test environment
36.
automated test pattern generation
37.
automatic test case generation
38.
automatic test pattern generation
39.
automatic test program generation
40.
Auvergne test-bed
41.
battery test
42.
behavioral test
43.
behaviour level test generation
44.
bending test
45.
bit-error rate test
46.
Board and System Test
47.
board test
48.
bounds test
49.
built-in self-test
50.
capillary condensation redistribution test
51.
chi-square test
52.
closed bottle test
53.
cognitive screening test
54.
compartment fire test
55.
compartment test
56.
cone penetration test (CPT)
57.
COVID-19 antigen test
58.
cutting test
59.
cybersecurity test bed
60.
DDR4 interconnect test
61.
design and test
62.
design-for-test
63.
deterministic test sequences
64.
diagnostic test
65.
digital test
66.
Digital test and testable design
67.
double-pulse test
68.
drawing test
69.
dry droplet antimicrobial test
70.
embedded test
71.
fan pressurisation test
72.
final test result prediction
73.
four-point bending test
74.
FPGA based test
75.
FPGA-Assisted Test
76.
FPGA-centric test
77.
functional self-test
78.
functional test generation
79.
Granger causality test
80.
hardness test
81.
high-level synthesis for test
82.
high-level test data generation
83.
highlevel test generation
84.
high-speed serial link test
85.
IEEE 9 bus test system
86.
implementation-independent test generation
87.
in situ tensile test in SEM
88.
industrial field test
89.
in-situ tensile test in SEM
90.
Johansen cointegration test
91.
Kolmogorov-Smirnov test
92.
load test
93.
logic built-in self-test
94.
Luria alternating series test
95.
Mann–Kendall test
96.
memory interconnect test
97.
microprocessor test
98.
Model test
99.
multiplier test
100.
offline test generation
101.
orthogonal test
102.
package test analysis
103.
parallel design and test
104.
performance test
105.
piezocone penetration test (CPTu)
106.
Point Load Test index
107.
pressurisation test
108.
processor-centric board test
109.
progressive damage test
110.
provably correct test generation
111.
pseudo-exhaustive test
112.
purity test
113.
rtioco-based timed test sequences
114.
seasonal Mann Kendall test
115.
seismic piezocone penetration test
116.
self-test
117.
self-test architectures
118.
sentence writing test
119.
serial sevens test
120.
ship towing test tank
121.
similar material simulation test
122.
small‐scale test
123.
software based self-test
124.
software-based self-test
125.
software-based self-test (SBST)
126.
soil phosphorus (P) test
127.
standard test method
128.
static load test
129.
static-dynamic probing test (SDT)
130.
stress test
131.
system level test
132.
teaching design and test of systems
133.
tensile test
134.
test
135.
test and evaluation platform
136.
test bench
137.
test coverage
138.
test driven development
139.
test driven modelling
140.
test embankment
141.
test equipment
142.
test generation
143.
test generation and fault diagnosis
144.
test groups
145.
test model design
146.
test optimization
147.
test packets
148.
test path synthesis
149.
test patterns
150.
test point insertion
151.
test program generation
152.
test reference year
153.
test replication
154.
test scenario description language
155.
test-bed
156.
test-chips
157.
test-house
158.
test-pattern
159.
test-suite reduction
160.
Three-point bending test
161.
1995 ECC benchmark test
author
3
1.
Root, Andres
2.
Root, I.
3.
European Added Value Unit
CV
3
1.
Root, Andres 1956-2016
2.
Root, Malle 1931-2004
3.
Root, Nikolai 1870-1960
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
name of the person
1
1.
Root, Andres, 1956-
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