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journal article
Orthogonal test design for the optimization of preparation of steel slag-based carbonated building materials with ultramafic tailings as fine aggregates
Li, Jiajie
;
Wang, Chengzhou
;
Ni, Wen
;
Zhu, Sitao
;
Mao, Shilong
;
Jiang, Fuxing
;
Zeng, Hui
;
Sun, Xikui
;
Huang, Bingxiang
;
Hitch, Michael William
Minerals
2022
/
art. 246, 19 p. : ill
https://doi.org/10.3390/min12020246
journal article
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keyword
143
1.
orthogonal test
2.
cyclostationary empirical orthogonal functions
3.
empirical orthogonal function (EOF)
4.
Empirical orthogonal functions
5.
Non Orthogonal Multiple Access (NOMA)
6.
Non-Orthogonal Multiple Access (NOMA)
7.
orthogonal interpolation method
8.
orthogonal interpolation method (OIM)
9.
Orthogonal Multiple Access (OMA)
10.
orthogonal projection
11.
principle of orthogonal design
12.
proper orthogonal decomposition (POD)
13.
accelerated shelf-life test
14.
adaptive test strategy generation
15.
antigen test
16.
ASTM G65 dry sand rubber wheel abrasion test
17.
automated test environment
18.
automated test pattern generation
19.
automatic test case generation
20.
automatic test pattern generation
21.
automatic test program generation
22.
Auvergne test-bed
23.
battery test
24.
behavioral test
25.
behaviour level test generation
26.
bending test
27.
bit-error rate test
28.
Board and System Test
29.
board test
30.
bounds test
31.
built-in self-test
32.
capillary condensation redistribution test
33.
chi-square test
34.
closed bottle test
35.
cognitive screening test
36.
compartment fire test
37.
compartment test
38.
cone penetration test (CPT)
39.
COVID-19 antigen test
40.
cutting test
41.
cybersecurity test bed
42.
DDR4 interconnect test
43.
design and test
44.
design-for-test
45.
deterministic test sequences
46.
diagnostic test
47.
digital test
48.
Digital test and testable design
49.
double-pulse test
50.
drawing test
51.
dry droplet antimicrobial test
52.
embedded test
53.
fan pressurisation test
54.
final test result prediction
55.
four-point bending test
56.
FPGA based test
57.
FPGA-Assisted Test
58.
FPGA-centric test
59.
functional self-test
60.
functional test generation
61.
Granger causality test
62.
hardness test
63.
high-level synthesis for test
64.
high-level test data generation
65.
highlevel test generation
66.
high-speed serial link test
67.
IEEE 9 bus test system
68.
implementation-independent test generation
69.
in situ tensile test in SEM
70.
industrial field test
71.
in-situ tensile test in SEM
72.
Johansen cointegration test
73.
Kolmogorov-Smirnov test
74.
load test
75.
logic built-in self-test
76.
Luria alternating series test
77.
Mann–Kendall test
78.
memory interconnect test
79.
microprocessor test
80.
Model test
81.
multiplier test
82.
offline test generation
83.
package test analysis
84.
parallel design and test
85.
performance test
86.
piezocone penetration test (CPTu)
87.
Point Load Test index
88.
pressurisation test
89.
processor-centric board test
90.
progressive damage test
91.
provably correct test generation
92.
pseudo-exhaustive test
93.
purity test
94.
rtioco-based timed test sequences
95.
seasonal Mann Kendall test
96.
seismic piezocone penetration test
97.
self-test
98.
self-test architectures
99.
sentence writing test
100.
serial sevens test
101.
ship towing test tank
102.
similar material simulation test
103.
small‐scale test
104.
software based self-test
105.
software-based self-test
106.
software-based self-test (SBST)
107.
soil phosphorus (P) test
108.
standard test method
109.
static load test
110.
static-dynamic probing test (SDT)
111.
stress test
112.
system level test
113.
teaching design and test of systems
114.
tensile test
115.
test
116.
test and evaluation platform
117.
test bench
118.
test coverage
119.
test driven development
120.
test driven modelling
121.
test embankment
122.
test equipment
123.
test generation
124.
test generation and fault diagnosis
125.
test groups
126.
test model design
127.
test optimization
128.
test packets
129.
test path synthesis
130.
test patterns
131.
test point insertion
132.
test program generation
133.
test reference year
134.
test replication
135.
test scenario description language
136.
test-bed
137.
test-chips
138.
test-house
139.
test-pattern
140.
test-suite reduction
141.
Three-point bending test
142.
unit root test
143.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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