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journal article EST
/
journal article ENG
Molecularly imprinted polymer based electrochemical sensor for quantitative detection of SARS-CoV-2 spike protein
Ayankojo, Akinrinade George
;
Boroznjak, Roman
;
Reut, Jekaterina
;
Öpik, Andres
;
Sõritski, Vitali
Sensors and Actuators B: Chemical
2022
/
Art. 131160
https://doi.org/10.1016/j.snb.2021.131160
Journal metrics at Scopus
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Article at WOS
journal article EST
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journal article ENG
Number of records 1, displaying
1 - 1
keyword
145
1.
antigen test
2.
COVID-19 antigen test
3.
antigen
4.
carcinoembryonic antigen
5.
Thomsen-Friedenreich antigen
6.
accelerated shelf-life test
7.
adaptive test strategy generation
8.
Applications in Test Engineering
9.
ASTM G65 dry sand rubber wheel abrasion test
10.
Automated Synthesis of Software-based Self-test
11.
automated test environment
12.
automated test pattern generation
13.
automatic test case generation
14.
automatic test pattern generation
15.
automatic test program generation
16.
Auvergne test-bed
17.
battery test
18.
behavioral test
19.
behaviour level test generation
20.
bending test
21.
bit-error rate test
22.
Board and System Test
23.
board test
24.
bounds test
25.
built-in self-test
26.
capillary condensation redistribution test
27.
chi-square test
28.
closed bottle test
29.
cognitive screening test
30.
compartment fire test
31.
compartment test
32.
cone penetration test (CPT)
33.
cutting test
34.
cybersecurity test bed
35.
DDR4 interconnect test
36.
design and test
37.
design-for-test
38.
deterministic test sequences
39.
diagnostic test
40.
digital test
41.
Digital test and testable design
42.
double-pulse test
43.
drawing test
44.
dry droplet antimicrobial test
45.
embedded test
46.
fan pressurisation test
47.
final test result prediction
48.
four-point bending test
49.
FPGA based test
50.
FPGA-Assisted Test
51.
FPGA-centric test
52.
functional self-test
53.
functional test generation
54.
Granger causality test
55.
hardness test
56.
Hierarchical Multi-level Test Generation
57.
high-level synthesis for test
58.
high-level test data generation
59.
highlevel test generation
60.
high-speed serial link test
61.
IEEE 9 bus test system
62.
implementation-independent test generation
63.
in situ tensile test in SEM
64.
industrial field test
65.
in-situ tensile test in SEM
66.
Johansen cointegration test
67.
Kolmogorov-Smirnov test
68.
load test
69.
logic built-in self-test
70.
Luria alternating series test
71.
Mann–Kendall test
72.
Mann-Kendall trend test
73.
memory interconnect test
74.
microprocessor test
75.
Model test
76.
multiplier test
77.
offline test generation
78.
orthogonal test
79.
package test analysis
80.
parallel design and test
81.
performance test
82.
piezocone penetration test (CPTu)
83.
Point Load Test index
84.
pressurisation test
85.
processor-centric board test
86.
progressive damage test
87.
provably correct test generation
88.
pseudo-exhaustive test
89.
purity test
90.
rolling thin film oven test
91.
rtioco-based timed test sequences
92.
seasonal Mann Kendall test
93.
seismic piezocone penetration test
94.
self-test
95.
self-test architectures
96.
sentence writing test
97.
serial sevens test
98.
ship towing test tank
99.
similar material simulation test
100.
small-scale fire test
101.
small‐scale test
102.
software based self-test
103.
software-based self-test
104.
software-based self-test (SBST)
105.
soil phosphorus (P) test
106.
standard test method
107.
static load test
108.
static-dynamic probing test (SDT)
109.
stress test
110.
system level test
111.
teaching design and test of systems
112.
tensile test
113.
tensile test
114.
test
115.
test and evaluation platform
116.
test automation
117.
test bench
118.
test coverage
119.
test driven development
120.
test driven modelling
121.
test embankment
122.
test equipment
123.
test generation
124.
test generation and fault diagnosis
125.
Test Group Generation for Detecting Multiple Faults
126.
test groups
127.
test model design
128.
test optimization
129.
test packets
130.
test path synthesis
131.
test patterns
132.
test point insertion
133.
test program generation
134.
test reference year
135.
test replication
136.
test scenario description language
137.
test-bed
138.
test-chips
139.
test-house
140.
test-pattern
141.
test-suite reduction
142.
Three-point bending test
143.
unit root test
144.
usability platform test
145.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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