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book article EST
/
book article ENG
Electroencephalography as an objective indicator of stress
Gavriljuk, Marietta
;
Uudeberg, Tuuli
;
Pilt, Kristjan
;
Karai, Deniss
;
Fridolin, Ivo
;
Bachmann, Maie
19th Nordic-Baltic Conference on Biomedical Engineering and Medical Physics : Proceedings of NBC 2023, June 12–14, 2023, Liepaja, Latvia
2023
/
p. 221–226
https://doi.org/10.1007/978-3-031-37132-5_28
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 1, displaying
1 - 1
keyword
149
1.
serial sevens test
2.
high-speed serial link test
3.
offsite serial renovation
4.
prefabricated off-site serial renovation
5.
prefabricated serial renovation
6.
serial batch
7.
serial renovation
8.
serial resistance
9.
accelerated shelf-life test
10.
adaptive test strategy generation
11.
antigen test
12.
Applications in Test Engineering
13.
ASTM G65 dry sand rubber wheel abrasion test
14.
Automated Synthesis of Software-based Self-test
15.
automated test environment
16.
automated test pattern generation
17.
automatic test case generation
18.
automatic test pattern generation
19.
automatic test program generation
20.
Auvergne test-bed
21.
battery test
22.
behavioral test
23.
behaviour level test generation
24.
bending test
25.
bit-error rate test
26.
Board and System Test
27.
board test
28.
bounds test
29.
built-in self-test
30.
capillary condensation redistribution test
31.
chi-square test
32.
closed bottle test
33.
cognitive screening test
34.
compartment fire test
35.
compartment test
36.
cone penetration test (CPT)
37.
COVID-19 antigen test
38.
cutting test
39.
cybersecurity test bed
40.
DDR4 interconnect test
41.
design and test
42.
design-for-test
43.
deterministic test sequences
44.
diagnostic test
45.
digital test
46.
Digital test and testable design
47.
double-pulse test
48.
drawing test
49.
dry droplet antimicrobial test
50.
embedded test
51.
fan pressurisation test
52.
final test result prediction
53.
four-point bending test
54.
FPGA based test
55.
FPGA-Assisted Test
56.
FPGA-centric test
57.
functional self-test
58.
functional test generation
59.
Granger causality test
60.
hardness test
61.
Hierarchical Multi-level Test Generation
62.
high-level synthesis for test
63.
high-level test data generation
64.
highlevel test generation
65.
IEEE 9 bus test system
66.
implementation-independent test generation
67.
in situ tensile test in SEM
68.
industrial field test
69.
in-situ tensile test in SEM
70.
Johansen cointegration test
71.
Kolmogorov-Smirnov test
72.
load test
73.
logic built-in self-test
74.
Luria alternating series test
75.
Mann–Kendall test
76.
Mann-Kendall trend test
77.
memory interconnect test
78.
microprocessor test
79.
Model test
80.
multiplier test
81.
offline test generation
82.
orthogonal test
83.
package test analysis
84.
parallel design and test
85.
performance test
86.
piezocone penetration test (CPTu)
87.
Point Load Test index
88.
pressurisation test
89.
processor-centric board test
90.
progressive damage test
91.
provably correct test generation
92.
pseudo-exhaustive test
93.
purity test
94.
real-time room temperature test
95.
rolling thin film oven test
96.
rtioco-based timed test sequences
97.
seasonal Mann Kendall test
98.
seismic piezocone penetration test
99.
self-test
100.
self-test architectures
101.
sentence writing test
102.
ship towing test tank
103.
similar material simulation test
104.
small-scale fire test
105.
small‐scale test
106.
software based self-test
107.
software-based self-test
108.
software-based self-test (SBST)
109.
soil phosphorus (P) test
110.
standard test method
111.
static load test
112.
static-dynamic probing test (SDT)
113.
stress test
114.
system level test
115.
teaching design and test of systems
116.
tensile test
117.
tensile test
118.
test
119.
test and evaluation platform
120.
test automation
121.
test bench
122.
test coverage
123.
test driven development
124.
test driven modelling
125.
test embankment
126.
test equipment
127.
test generation
128.
test generation and fault diagnosis
129.
Test Group Generation for Detecting Multiple Faults
130.
test groups
131.
test model design
132.
test optimization
133.
test packets
134.
test path synthesis
135.
test patterns
136.
test point insertion
137.
test program generation
138.
test reference year
139.
test replication
140.
test scenario description language
141.
test-bed
142.
test-chips
143.
test-house
144.
test-pattern
145.
test-suite reduction
146.
Three-point bending test
147.
unit root test
148.
usability platform test
149.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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