Otsing - TalTech teadusportaal

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artikkel kogumikus

Analysis and improvement of resilience for long short-term memory neural networksAhmadilivani, Mohammad Hasan; Raik, Jaan; Daneshtalab, Masoud; Kuusik, Alar2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 https://doi.org/10.1109/DFT59622.2023.10313559

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Bidirectional solid-state DC circuit breaker for the protection of cesidential and Commercial DC buildingsAditya, P.; Yagna, V.; Banoth, T.; Chub, Andrii; Banavath, Satish Naik2023 IEEE 8th Southern Power Electronics Conference and 17th Brazilian Power Electronics Conference (SPEC/COBEP)2023 / 6 p https://doi.org/10.1109/SPEC56436.2023.10407460

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Comparison of (N+1) redundancy and fault tolerance approaches in single-stage series-connected isolated MVAC to LVDC convertersBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Blinov, Andrei; Bayhan, Sertac; Vinnikov, Dmitri2023 International Conference on Clean Electrical Power (ICCEP)2023 / p. 469-474 : ill https://doi.org/10.1109/ICCEP57914.2023.10247478

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How to prove that a circuit is fault-free?Ubar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey2012 / p. 427-430 : ill https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free

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artikkel kogumikus

On-chip sensors data collection and analysis for SoC health managementShibin, Konstantin; Jenihhin, Maksim; Jutman, Artur; Devadze, Sergei; Tsertov, Anton2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 / 6 p https://doi.org/10.1109/DFT59622.2023.10313562

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artikkel kogumikus

Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715

artikkel kogumikus

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

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artikkel kogumikus

RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

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artikkel kogumikus

Short-circuit fault detection and remedial in full-bridge rectifier of series resonant DC-DC converter based on inductor voltage signatureBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings2020 / 6 p. : ill https://doi.org/10.1109/RTUCON51174.2020.9316482

artikkel kogumikus

Seotud publikatsioonid 1

Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid

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artikkel ajakirjas

Tehissüsteemide veakindlusest : [TTÜ arvutitehnika instituudi teadustöödest]Ubar, Raimund-JohannesHorisont2006 / 2, lk. 64-69 : ill https://artiklid.elnet.ee/record=b2039558*est

artikkel ajakirjas

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artikkel ajakirjas EST / artikkel ajakirjas ENG

Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applicationsCherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, ArturMicroelectronics reliability2023 / art. 115010, 10 p. : ill https://doi.org/10.1016/j.microrel.2023.115010 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

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artikkel ajakirjas

Usaldusväärsus ja veakindlus infohankesüsteemidesMüürsepp, IvoA & A2011 / 2, lk. 28-46 : ill

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