Otsing - TalTech teadusportaal

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201

artikkel ajakirjas EST / artikkel ajakirjas ENG

Symmetry in the narrow sense: on the linearity and time-invariance of DQ0 modelsSegev, Elior; Ofir, Ron; Belikov, Juri; Levron, YoashIEEE Transactions on Power Systems2023 / p. 1751-1754 https://doi.org/10.1109/TPWRS.2022.3229873 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

202

artikkel kogumikus

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

artikkel kogumikus

203

artikkel kogumikus

Synthesis of sequential circuits with dynamic power managementLensen, Harri; Kruus, Margus; Sudnitsõn, AleksanderProc. of 42nd International Scientific Conference of Riga Technical University : RTUCET'012001 / p. 81-86

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204

artikkel ajakirjas

Synthesis of sequential circuits with dynamic power managementLensen, Harri; Kruus, Margus; Sudnitsõn, AleksanderScientific proceedings of Riga Technical University. 7.serija, Telecommunications and electronics2001 / p. 81-86

artikkel ajakirjas

205

artikkel kogumikus

A system for teaching basic and advanced topics of IEEE 1149.1 boundary scan standard (extended abstract)Jutman, Artur; Rosin, Vjatšeslav; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of 16th EAEEIE Conference on Innovation in Education for Electrical and Information Engineering (EIE) : Lappeenranta, Finland, 6th-8th June 20052005 / [2] p. : ill

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206

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System level power-performance trade-offs in embedded systems using voltage and frequency scaling of off-chip buses and memoryPuttaswamy, Kiran; Choi, Kyu-Won; Park, Jun Cheol; Mooney III, Vincent J.; Chatterjee, Abhijit; Ellervee, PeeterISSS'02, October 2-4, 2002, Kyoto, Japan2002 / p. 225-230 : ill https://ieeexplore.ieee.org/document/1227182

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207

artikkel ajakirjas

System-level data format exploration for dynamically allocated data structuresEllervee, Peeter; Miranda, Miguel; Catthoor, Francky; Hemani, AhmedIEEE transactions on computer-aided design of integrated circuits and systems2001 / 12, p. 1469-1472 : ill https://ieeexplore.ieee.org/abstract/document/969440

artikkel ajakirjas

208

dissertatsioon

System-level design of timing-sensitive network-on-chip based dependable systems = Kiipvõrkudel põhinevate ajakriitiliste ja töökindlate süsteemide kõrgtaseme disainTagel, Mihkel2012 https://www.ester.ee/record=b2778263*est

dissertatsioon

209

artikkel ajakirjas

Z-RAM-mäluToomsalu, ArvoA & A2008 / 3, lk. 10-19 https://artiklid.elnet.ee/record=b1022321*est

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210

artikkel ajalehes

TalTech panustab kosmosevaldkonda kiipide, päikesepaneelide ja satelliitidegaNormak, Liisu KirkeTrialoog2025 https://trialoog.taltech.ee/taltech-panustab-kosmosevaldkonda-kiipide-paikesepaneelide-ja-satelliitidega/

artikkel ajalehes

211

artikkel ajalehes

TalTech professor: AI chip restrictions on Estonia won't make much differenceTammet, Tanelnews.err.ee2025 TalTech professor: AI chip restrictions on Estonia won't make much difference

artikkel ajalehes

212

artikkel ajalehes

TalTechi arvutisüsteemide professori uudne tehnoloogia raskendab spionaaži [Võrguväljaanne]Kald, Indrekituudised.ee2021 "TalTechi arvutisüsteemide professori uudne tehnoloogia raskendab spionaaži

artikkel ajalehes

213

artikkel ajalehes

Tammet: USA kiibipiirang Eestit ei mõjutaTammet, Tanelerr.ee2025 Tammet: USA kiibipiirang Eestit ei mõjuta

artikkel ajalehes

214

artikkel kogumikus

Targeting conditional operations in sequential test pattern generationRaik, Jaan; Ubar, Raimund-Johannes9th European Test Symposium : ETS'04 : Congress Center, Ajaccio, Corsica, France,May 23-26, 20042004 / p. 17-18 : ill https://www.researchgate.net/publication/239717327_Targeting_Conditional_Operations_in_Sequential_Test_Pattern_Generation

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215

artikkel kogumikus

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

artikkel kogumikus

216

artikkel kogumikus

Teaching digital test with BIST analyzerJutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 123-128 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610171

artikkel kogumikus

217

artikkel ajalehes

Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputadaPort, Kristjandelfi.ee2023 Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputada

artikkel ajalehes

218

artikkel ajalehes

Tehnikaülikooli teadlased loovad uue põlvkonna veakindlaid kiipeNõges, KrõõtMente et Manu2010 / lk. 2 https://www.ester.ee/record=b1242496*est

artikkel ajalehes

219

artikkel ajalehes

Tehnikaülikooli teadlaste juhtimisel luuakse uue põlvkonna veakindlaid kiipeStudioosus2010 / veebr., lk. 8 https://www.ester.ee/record=b1558644*est

artikkel ajalehes

220

artikkel ajakirjas

10th IEEE European Test SymposiumUbar, Raimund-Johannes; Prinetto, Paolo; Raik, JaanIEEE journal of design & test of computers2005 / p. 480-481 : phot http://dx.doi.org/10.1109/MDT.2005.106

artikkel ajakirjas

221

artikkel kogumikus

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

artikkel kogumikus

222

artikkel kogumikus

Test cost minimization for hybrid BISTJervan, Gert; Peng, Zebo; Ubar, Raimund-JohannesIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings2000 / p. 283-298 : ill https://ieeexplore.ieee.org/abstract/document/887168

artikkel kogumikus

223

artikkel ajakirjas

Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocolsBengtsson, Tomas; Kumar, Shashi; Ubar, Raimund-Johannes; Jutman, Artur; Peng, ZeboIET computers and digital techniques2008 / 6, p. 445-460 https://www.diva-portal.org/smash/record.jsf?dswid=-5073&aq2=%5B%5B%5D%5D&c=39&af=%5B%5D&searchType=SIMPLE&sortOrder2=title_sort_asc&language=en&pid=diva2%3A290043&aq=%5B%5B%7B%22personId%22%3A%22authority-person%3A23389%22%7D%5D%5D&sf=all&aqe=%5B%5D&sortOrder=author_sort_asc&onlyFullText=false&noOfRows=50

artikkel ajakirjas

224

artikkel kogumikus

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China2003 / p. 318-325 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

artikkel kogumikus

225

artikkel kogumikus

Test time minimization for hybrid BIST with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 112-116 : ill https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf

artikkel kogumikus

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