Otsing - TalTech teadusportaal

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526

artikkel kogumikus

Sequential circuits BIST synthesis from signal specificationsRaik, Jaan; Jenihhin, Maksim; Adelbert, RainProceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 20052005 / p. 196-199 : ill https://ieeexplore.ieee.org/document/1597023

artikkel kogumikus

527

artikkel kogumikus

Sequential circuits BIST with status bit controlRaik, Jaan; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 20042004 / p. 507-510 : ill https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf

artikkel kogumikus

528

artikkel kogumikus

Sequential test set compaction in LFSR reseedingJutman, Artur; Aleksejev, Igor; Raik, JaanDesign and test technology for dependable systems-on-chip2011 / p. 476-493 : ill https://ieeexplore.ieee.org/document/4738292

artikkel kogumikus

529

artikkel kogumikus

A set of tools for estimating quality of built-in self-test in digital circuitsJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the International Symposium on Signals, Circuits and Systems, Iasi (Romania), October 2-3, 19971997 / p. 362-365

artikkel kogumikus

530

artikkel kogumikus

Shift register based TPG for at-speed interconnect BISTJutman, ArturMIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 22004 / p. 751-754 : ill https://ieeexplore.ieee.org/document/1314941?signout=success

artikkel kogumikus

531

artikkel kogumikus

Simulation and automated test development system for digital devicesBirger, AlexanderBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 293-295

artikkel kogumikus

532

artikkel ajakirjas

Simulation of wear in a rolling-sliding contact by a semi-Winkler model and the Archard's wear lawTelliskivi, TanelWear2004 / 7/8, p. 817-831 : ill https://www.sciencedirect.com/science/article/abs/pii/S0043164803005246

artikkel ajakirjas

533

artikkel ajakirjas EST / artikkel ajakirjas ENG

Single-stage buck–boost inverters: a state-of-the-art surveyAzizi, Mohammadreza; Husev, Oleksandr; Vinnikov, DmitriEnergies2022 / art. 1622 https://doi.org/10.3390/en15051622 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

534

artikkel ajakirjas

Sisseehitatud isetestimine digitaalsüsteemidesKruus, HelenaA & A2011 / lk. 32-37 : ill https://artiklid.elnet.ee/record=b2472216*est

artikkel ajakirjas

535

artikkel kogumikus

Smooth coordination and management of impact of EstLink 2 transmission testing on electricity markets, power system operations and system technical performanceRauhala, T.; Laasonen, M.; Kilter, JakoCIGRE Session 2016 : 21-26 August 2016, Paris, France2016 / p. 1-11

artikkel kogumikus

536

artikkel kogumikus

SoC and board modeling for processor-centric board testingTšertov, Anton; Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei14th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2011 : 31 August - 2 September 2011, Oulu, Finland : proceedings2011 / p. 575-582 : ill https://ieeexplore.ieee.org/document/6037463

artikkel kogumikus

537

artikkel kogumikus

SoC and NoC test technology [Electronic resource] : [PowerPoint presentation]Raik, JaanDesign and Test Technology for Dependable Hardware/Software Systems : DEDIS/DAAD Summer Academy : BTU Cottbus, Sept. 1st-12th, 20082008 / [41] p. : ill. [CD-ROM]

artikkel kogumikus

538

artikkel kogumikus

Soft-sensor approach in characterization of VRLA batteriesTenno, Ander; Tenno, Robert; Suntio, TeuvoProc. INTELEC 20012001 / p. 554-562 https://ieeexplore.ieee.org/document/988617/similar#similar

artikkel kogumikus

539

artikkel kogumikus

Software environment for synthesis of testable FSM through decompositionDevadze, Sergei; Sudnitsõn, Aleksander2008 26th International Conference on Microelectronics (MIEL 2008) : proceedings2008 / p. 433-436 https://ieeexplore.ieee.org/document/4559314

artikkel kogumikus

540

dissertatsioon

Software-based self-test for microprocessors with high-level decision diagrams = Mikroprotsessorite tarkvara-põhine enesetestimine kõrgtasandi otsustusdiagrammide põhjalJasnetski, Artjom2018 https://digi.lib.ttu.ee/i/?10629 https://www.ester.ee/record=b5151486*est

dissertatsioon

541

artikkel kogumikus

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

artikkel kogumikus

542

artikkel ajakirjas EST / artikkel ajakirjas ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

543

raamat

Software-based self-test with decision diagrams for microprocessorsUbar, Raimund-Johannes; Jasnetski, Artjom; Tšertov, Anton; Oyeniran, Adeboye Stephen2018

raamat

544

artikkel ajalehes

Solaride lõpetas testsõidu maastikupõlengu tõttuHansar, Helinapostimees.ee2023 Solaride lõpetas testsõidu maastikupõlengu tõttu

artikkel ajalehes

545

artikkel kogumikus

Some aspects about insulator puncture testsAnnus, Aleksander; Metusala, Tiit; Oidram, Rein; Tapupere, OlevStockholm Power Tech, June 18-22 1995 : International Symposium on Electric Power Engineering. High-voltage technology1995 / p. 18-21: ill

artikkel kogumikus

546

artikkel kogumikus

Some aspects of testing speaking skills in UKPutrova, M.; Gridneva, I.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 74-76

artikkel kogumikus

547

artikkel kogumikus EST / artikkel kogumikus ENG

Special session : approximation and fault resiliency of DNN acceleratorsAhmadilivani, Mohammad Hasan; Barbareschi, Mario; Barone, Salvatore; Bosio, Alberto; Daneshtalab, Masoud; Torca, Salvatore Della; Gavarini, Gabriele; Jenihhin, Maksim; Raik, Jaan; Taheri, Mahdi2023 IEEE 41st VLSI Test Symposium (VTS) : proceedings2023 / 10 p. : ill https://doi.org/10.1109/VTS56346.2023.10140043 Conference proceeding at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

Seotud publikatsioonid 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

548

artikkel kogumikus

Statistical strength of brittle materials : test methods and weibull modulusPreis, IrinaProceedings of the 3rd International Conference Industrial Engineering - New Challenges to SME : 25-27 April 2002, Tallinn, Estonia2002 / p. 205-208 : ill

artikkel kogumikus

549

artikkel kogumikus

Step-wise approximated multi-cycle sine wave for dynamic tests of AD convertersLand, RaulXVI IMEKO World Congress : IMEKO2000 : proceedings of the 5th Workshop on ADC Modelling and Testing (EWADC'2000) : Vienna, Austria, Sept. 25-28, 20002000 / p. 217-220

artikkel kogumikus

550

artikkel kogumikus

Structural fault collapsing by superposition of BDDs for test generation in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA2010 / p. 250-257 : ill https://ieeexplore.ieee.org/document/5450451

artikkel kogumikus

testimine (märksõna)

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