New categories of Safe Faults in a processor-based Embedded System

vastutusandmed
C. Gursoy, M. Jenihhin, A.S. Oyeniran, D. Piumatti, J. Raik, M. Sonza Reorda, R. Ubar
allikas
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
ilmumiskoht
Danvers
kirjastus/väljaandja
ilmumisaasta
leheküljed
4 p. : ill
konverentsi nimetus, aeg
22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 24-26 April 2019
konverentsi toimumispaik
Cluj-Napoca, Romania
ISSN
2473-2117
ISBN
978-1-7281-0073-9
märkused
Bibliogr.: 17 ref
TTÜ struktuuriüksus
keel
inglise
Gürsoy, C., Jenihhin, M., Oyeniran, A.S., Piumatti, D., Raik, J., Sonza Reorda, M., Ubar, R. New categories of Safe Faults in a processor-based Embedded System // 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings. Danvers : IEEE, 2019. 4 p. : ill.