High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors

vastutusandmed
Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
allikas
2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings
ilmumiskoht
Danvers
kirjastus/väljaandja
ilmumisaasta
leheküljed
6 p. : ill
konverentsi toimumispaik
Baden-Baden, Germany
ISBN
978-1-7281-1173-5
märkused
Bibliogr.: 31 ref
TTÜ struktuuriüksus
keel
inglise
Oyeniran, A.S., Ubar, R., Jenihhin, M., Gürsoy, C., Raik, J. High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors // 2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings. Danvers : IEEE, 2019. 6 p. : ill. https://doi.org/10.1109/ETS.2019.8791526