Toggle navigation
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English
Intranet
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
English
Intranet
Andmebaasid
Publikatsioonid
Otsing
Valitud kirjed
0
high-level fault model (võtmesõna)
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Lisa tingimus
Liitotsing
filter
Tühista
×
teaviku laadid
raamat
..
artikkel ajakirjas
..
artikkel ajalehes
..
artikkel kogumikus
..
dissertatsioon
..
Open Access
..
Teaduspublikatsioon
..
aasta
ilmumisaasta
Toon andmeid..
autor
Toon andmeid..
TTÜ struktuuriüksus
Toon andmeid..
märksõna
Toon andmeid..
seeria-sari
Toon andmeid..
tema kohta
Toon andmeid..
võtmesõna
Toon andmeid..
Tühista
Kirjeid leitud
2
Vaata veel..
(1/206)
Ekspordi
ekspordi kõik päringu tulemused
(2)
Salvesta TXT fail
Salvesta PDF fail
prindi
Märgitud kirjetega toimetamiseks ava
valitud kirjed
kuva
Bibliokirje
Lühikirje
reasta
autor kasvavalt
autor kahanevalt
ilmumisaasta kasvavalt
ilmumisaasta kahanevalt
pealkiri kasvavalt
pealkiri kahanevalt
1
artikkel kogumikus
High-level combined deterministic and pseudo-exhuastive test generation for RISC processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
artikkel kogumikus
2
artikkel kogumikus
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
artikkel kogumikus
Kirjeid leitud 2, kuvan
1 - 2
võtmesõna
206
1.
high-level fault model
2.
high-level control fault model
3.
high-level functional fault model
4.
high-level fault coverage
5.
high-level fault simulation
6.
logic level and high level BDDs
7.
low-level fault redundancy
8.
fault analysis model
9.
functional fault model
10.
stuck-at fault model
11.
high level DD (HLDD)
12.
high level synthesis
13.
high-level control faults
14.
high-level decision diagram
15.
high-level decision diagrams
16.
high-level decision diagrams (HLDD) synthesis
17.
high-level expert group on AI
18.
High-Level Synthesis (HLS)
19.
high-level synthesis for test
20.
high-level test data generation
21.
high-frequency model
22.
High-Pressure High-Temperature Spark Plasma Sintering
23.
asynchronous fault detection
24.
automatic fault diagnosis
25.
bearing fault diagnosis
26.
bi-directional fault monitoring devices
27.
conditional fault collapsing
28.
control fault models
29.
critical path fault tracing
30.
cross-layer fault tolerance
31.
cross-layered fault management
32.
extended fault class
33.
fault currents
34.
fault analysis
35.
fault classification
36.
fault classification
37.
fault collapsing
38.
fault compensation
39.
fault coverage
40.
fault current and voltage measurements
41.
Fault current limite
42.
fault current limiter
43.
fault detection
44.
fault detection and diagnoses
45.
fault detection and diagnosis
46.
fault diagnosis
47.
fault diagnostic
48.
fault diagnostic resolution
49.
fault diagnostics
50.
fault dignosis
51.
fault effects
52.
fault emulation
53.
fault equivalence and dominance
54.
fault handling
55.
fault handling strategy
56.
fault indicator
57.
fault injection
58.
Fault Injection Simulation
59.
fault Interruption
60.
fault localization
61.
fault management
62.
fault masking
63.
fault modeling
64.
fault models
65.
fault monitoring
66.
fault prediction
67.
fault protection
68.
fault redundancy
69.
fault resilience
70.
fault ride through
71.
Fault ride through enhancement
72.
fault signal
73.
fault simulastion
74.
fault simulation
75.
fault simulation with critical path tracing
76.
fault tolerance
77.
fault tolerant
78.
fault tolerant control
79.
fault tolerant operation
80.
fault tolerant router design
81.
fault tolerant systems
82.
Fault Tree Analysis
83.
fault-injection attack
84.
fault-plane solution
85.
fault-resilience
86.
fault-resistant
87.
fault-ride-through (FRT)
88.
fault-tolerance
89.
fault-tolerant
90.
Fault-tolerant (FT) converters
91.
fault-tolerant control
92.
fault-tolerant converter
93.
Katun fault
94.
no fault found
95.
No-Fault-Found
96.
open circuit fault
97.
parallel fault-simulation
98.
short circuit fault
99.
test generation and fault diagnosis
100.
transient fault mitigation
101.
transmission lines fault
102.
absolute sea level
103.
airport level of service
104.
arousal level
105.
assurance level
106.
behaviour level test generation
107.
bi-level optimization
108.
CO2 level in classrooms
109.
CO2 level in classrooms and kindergartens
110.
confidence level
111.
country-level logistics
112.
customer compatibility level
113.
deep level
114.
deep level traps
115.
determination of the CO2 level
116.
determining the level of creatine
117.
digitalisation level
118.
distribution-level phasor measurement units (D-PMUs)
119.
exposure level
120.
extreme penetration level of non synchronous generation
121.
extreme water level
122.
gate-level analysis
123.
gate-level circuit abstraction
124.
gate-level netlist
125.
graduate level
126.
hierarchical two-level analysis
127.
improvement of safety level at enterprises
128.
improvement of safety level at SMEs
129.
level control
130.
level set
131.
level(s) methodology
132.
level-crossing ADC
133.
level-crossing analog-to-digital converters
134.
level-crossing analogue-to-digital converters (ADC)
135.
logic level
136.
lower trophic level models
137.
low-level control system transportation
138.
low-level radiation
139.
Low-level RF EMF
140.
macro-level industry influences
141.
mean sea level
142.
module level power electronics (MLPE)
143.
module-level power electronics (MLPE)
144.
multi-level governance
145.
multi-level inverter
146.
multi-level modeling
147.
multi-level perspective
148.
multi-level perspective of sustainability transitions
149.
multi-level selection and processing environment
150.
operational level (OL)
151.
Price level
152.
Process/Product Sigma Performance Level (PSPL)
153.
PV module level power electronics
154.
register transfer and gate level simulation
155.
Register Transfer Level - RTL
156.
register transfer level modeling decision diagams
157.
register-transfer level
158.
relative sea level
159.
relative sea-level change
160.
RH level
161.
school-level policies
162.
sea level
163.
sea level rise
164.
sea level series
165.
sea level trend
166.
sea level: variations and mean
167.
sea-level
168.
sea-level changes
169.
sea-level equation
170.
Sea-level indicator
171.
sea-level prediction
172.
sea-level rise
173.
sea-level trend
174.
seven-level multilevel
175.
skin conductance level
176.
software level TMR
177.
steel-level bureaucracy
178.
strategic level decision makers
179.
system level hazards
180.
system level test
181.
system planning level
182.
system-level analysis
183.
system-level evaluation
184.
task-level uninterrupted presence
185.
three-level
186.
three-level inverter
187.
three-level neutral-point-clamped inverter
188.
three-level NPC inverter
189.
three-level T-type
190.
three-level T-type inverter
191.
three-level T-type quasi-impedance-source inverter (3L-T-type qZSI)
192.
three-level voltage inverter
193.
Tool Confidence Level
194.
top-level domain
195.
transaction-level modeling
196.
treatment level
197.
two-level inverter
198.
undergraduate level
199.
water level
200.
water level fluctuation
201.
water level measurements
202.
water level reconstruction
203.
water-level changes
204.
voltage level
205.
voltage level optimisation
206.
3-level T-type inverter
×
vaste
algab
lõpeb
sisaldab
reasta
Relevantsuse alusel
kasvavalt
kahanevalt
ilmumisaasta
autor
TTÜ struktuuriüksus
märksõna
seeria-sari
tema kohta
võtmesõna
Otsing
Valikud
0
ilmumisaasta
AND
OR
NOT
autor
AND
OR
NOT
TTÜ struktuuriüksus
AND
OR
NOT
märksõna
AND
OR
NOT
seeria-sari
AND
OR
NOT
tema kohta
AND
OR
NOT
võtmesõna
AND
OR
NOT