Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chips

vastutusandmed
J.Raik, V.Govind, R.Ubar
ajakirja aastakäik number kuu
Vol. 3
ilmumisaasta
leheküljed
5, p. 476-486 : ill
ISSN
1751-8601
märkused
Bibliogr.: 22 ref
keel
inglise
Raik, J., Govind, V., Ubar, R.-J. Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chips // IET computers and digital techniques (2009) Vol. 3, 5, p. 476-486 : ill. http://dx.doi.org/10.1049/iet-cdt.2008.0096