GA-based test generation for sequential circuits

vastutusandmed
M. Brik, J. Raik, R. Ubar, E. Ivask
ilmumiskoht
[Kharkov]
ilmumisaasta
leheküljed
p. 30-34
konverentsi nimetus, aeg
2nd East-West Design & Test Workshop, 23-26 September, 2004
konverentsi toimumispaik
Yalta, Alushta, Crimea, Ukraine
ISBN
966-659-088-3
TTÜ struktuuriüksus
keel
inglise
Brik, M., Raik, J., Ubar, R.-J., Ivask, E. GA-based test generation for sequential circuits // Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004. [Kharkov], 2004. p. 30-34.