prindi

Software-based self-test generation for microprocessors with high-level decision diagrams

autor
Ubar, Raimund-Johannes
Tšertov, Anton
Jasnetski, Artjom
Brik, Marina
vastutusandmed
Raimund Ubar, Anton Tsertov, Artjom Jasnetski, Marina Brik
allikas
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
ilmumiskoht
[S.l.]
kirjastus/väljaandja
IEEE
ilmumisaasta
2014
leheküljed
[6] p. : ill
konverentsi nimetus, aeg
15th IEEE Latin-American Test Workshop, March 12-15, 2014
konverentsi toimumispaik
Fortaleza, Brazil
märksõna
mikroprotsessorid
testimine
otsustusdiagrammid
programmigeneraatorid
võtmesõna
microprocessor
software-based self-test (SBST)
test program generation
high-level decision diagrams
ISBN
978-1-4799-4711-9
märkused
Bibliogr.: 22 ref
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Ubar, R., Tsertov, A., Jasnetski, A., Brik, M. Software-based self-test generation for microprocessors with high-level decision diagrams // LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014. [S.l.] : IEEE, 2014. [6] p. : ill.