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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article
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journal article

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est

journal article
4

book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. high-level test data generation
10. highlevel test generation
11. implementation-independent test generation
12. offline test generation
13. provably correct test generation
14. test generation
15. test generation and fault diagnosis
16. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
17. Apollo program
18. automatic program synthesis
19. Baltic-wide HELCOM COMBINE monitoring program
20. college program
21. master program
22. monitoring program
23. NATO. Science for Peace and Security Program
24. probabilistic relational program logic
25. program
26. program analysis
27. program equivalence
28. program management
29. program packages
30. program transformation
31. program verification
32. SNAP program
33. stufy program
34. Activity-based demand generation
35. automatic code generation
36. Automatic generation control
37. automatic GUI model generation
38. building and urban form generation
39. business model generation
40. code generation
41. disaster alert generation
42. distributed electricity generation
43. distributed generation
44. Distributed Generation (DG)
45. distributed generation systems
46. distributed power generation
47. distrubuted power generation
48. droplet generation
49. droplet generation rate control
50. electric power generation
51. electricity generation
52. energy generation
53. extreme penetration level of non synchronous generation
54. feasible path generation
55. fifth generation computer
56. fourth generation district heating
57. frequent item generation
58. generation
59. generation and transmission expansion planning
60. Generation Costs
61. generation of electric energy
62. generation succession
63. heat generation
64. hydroelectric power generation
65. hydrogen generation
66. I–III generation
67. job generation
68. multisine generation
69. next generation 4D printing
70. next generation sequencing
71. Next-generation probiotics
72. next-generation sequencing
73. oil-shale power generation
74. pattern Generation
75. photovoltaic (PV) generation
76. photovoltaic generation dispatch
77. power generation
78. power generation dispatch
79. power generation economics
80. power generation planning
81. PV generation
82. PV power generation
83. Renewable energy generation
84. renewable generation
85. residual generation
86. Second generation bioethanol
87. second generation of tribology models
88. second generation sequencing
89. silver generation
90. solar power generation
91. space generation advisory council
92. template based sql generation
93. trajectory generation
94. waste generation
95. wave generation
96. white light generation
97. wind energy generation
98. wind generation
99. wind power generation
100. 16S rRNA gene amplicon next-generation sequencing
101. 4GDH (4th generation district heating)
102. 4th generation district heating
103. 5th generation district heating
104. accelerated shelf-life test
105. antigen test
106. ASTM G65 dry sand rubber wheel abrasion test
107. automated test environment
108. Auvergne test-bed
109. battery test
110. behavioral test
111. bending test
112. bit-error rate test
113. Board and System Test
114. board test
115. bounds test
116. built-in self-test
117. capillary condensation redistribution test
118. chi-square test
119. closed bottle test
120. cognitive screening test
121. compartment fire test
122. compartment test
123. cone penetration test (CPT)
124. COVID-19 antigen test
125. cutting test
126. cybersecurity test bed
127. DDR4 interconnect test
128. design and test
129. design-for-test
130. deterministic test sequences
131. diagnostic test
132. digital test
133. Digital test and testable design
134. double-pulse test
135. drawing test
136. dry droplet antimicrobial test
137. embedded test
138. fan pressurisation test
139. final test result prediction
140. four-point bending test
141. FPGA based test
142. FPGA-Assisted Test
143. FPGA-centric test
144. functional self-test
145. Granger causality test
146. hardness test
147. high-level synthesis for test
148. high-speed serial link test
149. IEEE 9 bus test system
150. in situ tensile test in SEM
151. industrial field test
152. in-situ tensile test in SEM
153. Johansen cointegration test
154. Kolmogorov-Smirnov test
155. load test
156. logic built-in self-test
157. Luria alternating series test
158. Mann–Kendall test
159. memory interconnect test
160. microprocessor test
161. Model test
162. multiplier test
163. orthogonal test
164. package test analysis
165. parallel design and test
166. performance test
167. piezocone penetration test (CPTu)
168. Point Load Test index
169. pressurisation test
170. processor-centric board test
171. progressive damage test
172. pseudo-exhaustive test
173. purity test
174. rtioco-based timed test sequences
175. seasonal Mann Kendall test
176. seismic piezocone penetration test
177. self-test
178. self-test architectures
179. sentence writing test
180. serial sevens test
181. ship towing test tank
182. similar material simulation test
183. small-scale fire test
184. small‐scale test
185. software based self-test
186. software-based self-test
187. software-based self-test (SBST)
188. soil phosphorus (P) test
189. standard test method
190. static load test
191. static-dynamic probing test (SDT)
192. stress test
193. system level test
194. teaching design and test of systems
195. tensile test
196. test
197. test and evaluation platform
198. test bench
199. test coverage
200. test driven development
201. test driven modelling
202. test embankment
203. test equipment
204. test groups
205. test model design
206. test optimization
207. test packets
208. test path synthesis
209. test patterns
210. test point insertion
211. test reference year
212. test replication
213. test scenario description language
214. test-bed
215. test-chips
216. test-house
217. test-pattern
218. test-suite reduction
219. Three-point bending test
220. unit root test
221. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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