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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
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book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. BIP (Blended Intensive Program)
23. college program
24. master program
25. monitoring program
26. NATO. Science for Peace and Security Program
27. probabilistic relational program logic
28. program
29. program analysis
30. program debugging
31. program equivalence
32. program management
33. program packages
34. program transformation
35. program verification
36. SNAP program
37. stufy program
38. Activity-based demand generation
39. automated code generation
40. automatic code generation
41. Automatic generation control
42. automatic GUI model generation
43. building and urban form generation
44. business model generation
45. code generation
46. data set generation
47. decentralized key generation
48. disaster alert generation
49. distributed electricity generation
50. distributed generation
51. Distributed Generation (DG)
52. distributed generation systems
53. distributed power generation
54. distrubuted power generation
55. droplet generation
56. droplet generation rate control
57. electric power generation
58. electricity generation
59. energy generation
60. extreme penetration level of non synchronous generation
61. feasible path generation
62. fifth generation computer
63. fourth generation district heating
64. frequent item generation
65. generation
66. generation and transmission expansion planning
67. Generation Costs
68. generation of electric energy
69. generation scheduling
70. generation succession
71. heat generation
72. hydroelectric power generation
73. hydrogen generation
74. I–III generation
75. job generation
76. knowledge generation
77. multisine generation
78. next generation 4D printing
79. next generation sequencing
80. Next-generation probiotics
81. next-generation sequencing
82. oil-shale power generation
83. pattern Generation
84. photovoltaic (PV) generation
85. photovoltaic generation dispatch
86. power generation
87. power generation dispatch
88. power generation economics
89. power generation planning
90. PV generation
91. PV power generation
92. Renewable energy generation
93. renewable generation
94. residual generation
95. rule generation
96. Second generation bioethanol
97. second generation of tribology models
98. second generation sequencing
99. signal generation
100. silver generation
101. solar power generation
102. space generation advisory council
103. template based sql generation
104. trajectory generation
105. waste generation
106. wave generation
107. white light generation
108. wind energy generation
109. wind generation
110. wind power generation
111. 16S rRNA gene amplicon next-generation sequencing
112. 4GDH (4th generation district heating)
113. 4th generation district heating
114. 5th generation district heating
115. accelerated shelf-life test
116. antigen test
117. Applications in Test Engineering
118. ASTM G65 dry sand rubber wheel abrasion test
119. Automated Synthesis of Software-based Self-test
120. automated test environment
121. Auvergne test-bed
122. battery test
123. behavioral test
124. bending test
125. bit-error rate test
126. Board and System Test
127. board test
128. bounds test
129. built-in self-test
130. capillary condensation redistribution test
131. chi-square test
132. closed bottle test
133. cognitive screening test
134. compartment fire test
135. compartment test
136. cone penetration test (CPT)
137. COVID-19 antigen test
138. cutting test
139. cybersecurity test bed
140. DDR4 interconnect test
141. design and test
142. design-for-test
143. deterministic test sequences
144. diagnostic test
145. digital test
146. Digital test and testable design
147. double-pulse test
148. drawing test
149. dry droplet antimicrobial test
150. embedded test
151. fan pressurisation test
152. final test result prediction
153. four-point bending test
154. FPGA based test
155. FPGA-Assisted Test
156. FPGA-centric test
157. functional self-test
158. Granger causality test
159. hardness test
160. high-level synthesis for test
161. high-speed serial link test
162. IEEE 9 bus test system
163. in situ tensile test in SEM
164. industrial field test
165. in-situ tensile test in SEM
166. Johansen cointegration test
167. Kolmogorov-Smirnov test
168. load test
169. logic built-in self-test
170. Luria alternating series test
171. Mann–Kendall test
172. Mann-Kendall trend test
173. memory interconnect test
174. microprocessor test
175. Model test
176. multiplier test
177. orthogonal test
178. package test analysis
179. parallel design and test
180. performance test
181. piezocone penetration test (CPTu)
182. Point Load Test index
183. pressurisation test
184. processor-centric board test
185. progressive damage test
186. pseudo-exhaustive test
187. purity test
188. real-time room temperature test
189. rolling thin film oven test
190. rtioco-based timed test sequences
191. seasonal Mann Kendall test
192. seismic piezocone penetration test
193. self-test
194. self-test architectures
195. sentence writing test
196. serial sevens test
197. ship towing test tank
198. similar material simulation test
199. small-scale fire test
200. small‐scale test
201. software based self-test
202. software-based self-test
203. software-based self-test (SBST)
204. soil phosphorus (P) test
205. standard test method
206. static load test
207. static-dynamic probing test (SDT)
208. stress test
209. system level test
210. teaching design and test of systems
211. tensile test
212. tensile test
213. test
214. test and evaluation platform
215. test automation
216. test bench
217. test coverage
218. test driven development
219. test driven modelling
220. test embankment
221. test equipment
222. test groups
223. test model design
224. test optimization
225. test packets
226. test path synthesis
227. test patterns
228. test point insertion
229. test reference year
230. test replication
231. test scenario description language
232. test-bed
233. test-chips
234. test-house
235. test-pattern
236. test-suite reduction
237. Three-point bending test
238. unit root test
239. usability platform test
240. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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