High-level test generation for processing elements in many-core systems
author
Oyeniran, Adeboye Stephen
Ubar, Raimund-Johannes
Azad, Siavoosh Payandeh
Raik, Jaan
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Siavoosh Payandeh Azad, Jaan Raik
source
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
location of publication
[S.l.]
publisher
IEEE
year of publication
2017
pages
8 p. : ill
conference name, date
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017
conference location
Madrid, Spain
url
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
subject term
tarkvaraarendus
tarkvara
testimine
rikked
keyword
processor core testing
high-level control faults
test generation
high-level fault coverage
fault redundancy
ISBN
978-1-5386-3344-1/17
notes
Bibliogr.: 29 ref
TTÜ department
arvutisüsteemide instituut
language
inglise