High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
statement of authorship
Adeboye Stephen Oyeniran, Maksim Jenihhin, Jaan Raik, Raimund Ubar
source
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
publisher
year of publication
pages
p. 32-37
conference name, date
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 04-06 July 2022
conference location
Nicosia, Cyprus
subject term
keyword
fault diagnostic resolution
ISSN
2159-3477
2159-3469
ISBN
978-1-6654-6605-9
978-1-6654-6606-6
notes
Bibliogr.: 33 ref
scientific publication
teaduspublikatsioon
classifier
TTÜ department
language
inglise
Oyeniran, A.S., Jenihhin, M., Raik, J., Ubar, R. High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test // 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022. : IEEE, 2022. p. 32-37.