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journal article
Automated software-based in-field self-test program synthesis
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
International journal of microelectronics and computer science
2017
/
p. 57-64 : ill
journal article
2
book article
Automated software-based self-test generation for microprocessors
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
Proceedings of the 24st International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2017 : Bydgoszcz, Poland, June 19-21, 2014
2017
/
p. 453-458 : ill
https://doi.org/10.23919/MIXDES.2017.8005252
book article
3
book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
4
journal article
Software-based self-test generation for microprocessors with high-level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Brik, Marina
Proceedings of the Estonian Academy of Sciences
2014
/
p. 48-61 : ill
https://artiklid.elnet.ee/record=b2665215*est
journal article
5
book article
Software-based self-test generation for microprocessors with high-level decision diagrams
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Jasnetski, Artjom
;
Brik, Marina
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
6
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
Number of records 6, displaying
1 - 6
keyword
6
1.
microprocessor
2.
microprocessor chips
3.
microprocessor systems
4.
microprocessor test
5.
microprocessor testing
6.
shakti microprocessor
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