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microprocessor testing (keyword)
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1
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
2
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
3
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
4
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
82
1.
microprocessor testing
2.
Implementation-Independent Testing of Microprocessors
3.
microprocessor
4.
microprocessor chips
5.
microprocessor systems
6.
microprocessor test
7.
shakti microprocessor
8.
accelerated testing
9.
acoustomechanical testing
10.
anaerobic testing
11.
aspect-oriented testing
12.
at-speed testing
13.
benchmark testing
14.
Berridge testing
15.
cancer genomic testing
16.
compliance testing
17.
compositional testing
18.
computer aided testing
19.
conformance testing
20.
courses on electronic testing and design
21.
cybersecurity testing
22.
D. non-destructive testing
23.
design field testing
24.
destructive testing
25.
eddy current testing
26.
eddy current testing (ECT)
27.
erosion testing
28.
fatigue testing
29.
fire testing
30.
hierarchical testing
31.
hypotheses testing
32.
integration testing
33.
laboratory scale testing
34.
load testing
35.
macro mechanical testing and green surface tribology
36.
material testing
37.
materials testing
38.
measurement and testing
39.
mechanical testing
40.
memory testing
41.
metamorphic testing
42.
model based testing
43.
model-based mutation testing
44.
model-based testing
45.
mutation testing
46.
network-testing
47.
non destructive testing
48.
nondestructive testing
49.
non-destructive testing
50.
on-site testing
51.
pin on disc wear testing
52.
PMU calibration testing
53.
PMU testing
54.
point-of-care testing
55.
processor core testing
56.
processor testing
57.
real-time HiL testing
58.
regression testing
59.
RISC processor testing
60.
robustness testing
61.
safety and security testing
62.
scenario testing
63.
scratch testing
64.
security testing
65.
small-scale fire testing
66.
software testing
67.
software-in-the-loop (SIL) testing
68.
stand-alone testing
69.
stress-testing
70.
substation testing methods
71.
system testing
72.
tensile testing
73.
testing
74.
testing methods
75.
testing of digital devices
76.
testing of generator
77.
testing of phasor measurement units
78.
two-dimensional array testing
79.
wafer testing
80.
wear testing
81.
vibration testing
82.
virtual testing
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