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1
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
2
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
3
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
4
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
81
1.
microprocessor testing
2.
microprocessor
3.
microprocessor chips
4.
microprocessor systems
5.
microprocessor test
6.
shakti microprocessor
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
at-speed testing
12.
benchmark testing
13.
Berridge testing
14.
cancer genomic testing
15.
compliance testing
16.
compositional testing
17.
computer aided testing
18.
conformance testing
19.
courses on electronic testing and design
20.
cybersecurity testing
21.
D. non-destructive testing
22.
design field testing
23.
destructive testing
24.
eddy current testing
25.
eddy current testing (ECT)
26.
erosion testing
27.
fatigue testing
28.
fire testing
29.
hierarchical testing
30.
hypotheses testing
31.
integration testing
32.
laboratory scale testing
33.
load testing
34.
macro mechanical testing and green surface tribology
35.
material testing
36.
materials testing
37.
measurement and testing
38.
mechanical testing
39.
memory testing
40.
metamorphic testing
41.
model based testing
42.
model-based mutation testing
43.
model-based testing
44.
mutation testing
45.
network-testing
46.
non destructive testing
47.
nondestructive testing
48.
non-destructive testing
49.
on-site testing
50.
pin on disc wear testing
51.
PMU calibration testing
52.
PMU testing
53.
point-of-care testing
54.
processor core testing
55.
processor testing
56.
real-time HiL testing
57.
regression testing
58.
RISC processor testing
59.
robustness testing
60.
safety and security testing
61.
scenario testing
62.
scratch testing
63.
security testing
64.
small-scale fire testing
65.
software testing
66.
software-in-the-loop (SIL) testing
67.
stand-alone testing
68.
stress-testing
69.
substation testing methods
70.
system testing
71.
tensile testing
72.
testing
73.
testing methods
74.
testing of digital devices
75.
testing of generator
76.
testing of phasor measurement units
77.
two-dimensional array testing
78.
wafer testing
79.
wear testing
80.
vibration testing
81.
virtual testing
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