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microprocessor testing (keyword)
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1
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
2
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
3
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
4
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
89
1.
microprocessor testing
2.
Implementation-Independent Testing of Microprocessors
3.
microprocessor
4.
microprocessor architecture
5.
microprocessor chips
6.
microprocessor systems
7.
microprocessor test
8.
shakti microprocessor
9.
accelerated testing
10.
acoustomechanical testing
11.
anaerobic testing
12.
aspect-oriented testing
13.
assessment and testing
14.
at-speed testing
15.
benchmark testing
16.
Berridge testing
17.
burst testing
18.
cancer genomic testing
19.
compliance testing
20.
compositional testing
21.
computer aided testing
22.
cone heater testing
23.
conformance testing
24.
courses on electronic testing and design
25.
cybersecurity testing
26.
D. non-destructive testing
27.
deformation testing
28.
design field testing
29.
destructive testing
30.
eddy current testing
31.
eddy current testing (ECT)
32.
erosion testing
33.
fatigue testing
34.
fire testing
35.
hierarchical testing
36.
hypotheses testing
37.
integration testing
38.
laboratory scale testing
39.
load testing
40.
macro mechanical testing and green surface tribology
41.
material testing
42.
materials testing
43.
measurement and testing
44.
mechanical testing
45.
memory testing
46.
metamorphic testing
47.
model based testing
48.
model-based mutation testing
49.
model-based testing
50.
mutation testing
51.
network-testing
52.
non destructive testing
53.
nondestructive testing
54.
non-destructive testing
55.
on-site testing
56.
pin on disc wear testing
57.
PMU calibration testing
58.
PMU testing
59.
point-of-care testing
60.
processor core testing
61.
processor testing
62.
real-time HiL testing
63.
regression testing
64.
RISC processor testing
65.
robustness testing
66.
safety and security testing
67.
scenario testing
68.
scratch testing
69.
security testing
70.
shear testing
71.
small-scale fire testing
72.
software testing
73.
software-in-the-loop (SIL) testing
74.
stand-alone testing
75.
stress-testing
76.
substation testing methods
77.
system testing
78.
tensile testing
79.
testing
80.
testing methods
81.
testing of digital devices
82.
testing of generator
83.
testing of phasor measurement units
84.
two-dimensional array testing
85.
ultrasonic testing
86.
wafer testing
87.
wear testing
88.
vibration testing
89.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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