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microprocessor testing (keyword)
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1
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
2
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
3
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
4
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
80
1.
microprocessor testing
2.
microprocessor
3.
microprocessor chips
4.
microprocessor systems
5.
microprocessor test
6.
shakti microprocessor
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
at-speed testing
12.
benchmark testing
13.
Berridge testing
14.
cancer genomic testing
15.
compliance testing
16.
compositional testing
17.
computer aided testing
18.
conformance testing
19.
courses on electronic testing and design
20.
cybersecurity testing
21.
D. non-destructive testing
22.
design field testing
23.
destructive testing
24.
eddy current testing
25.
eddy current testing (ECT)
26.
erosion testing
27.
fatigue testing
28.
fire testing
29.
hierarchical testing
30.
hypotheses testing
31.
integration testing
32.
laboratory scale testing
33.
load testing
34.
macro mechanical testing and green surface tribology
35.
material testing
36.
materials testing
37.
measurement and testing
38.
mechanical testing
39.
memory testing
40.
metamorphic testing
41.
model based testing
42.
model-based mutation testing
43.
model-based testing
44.
mutation testing
45.
network-testing
46.
non destructive testing
47.
nondestructive testing
48.
non-destructive testing
49.
on-site testing
50.
pin on disc wear testing
51.
PMU calibration testing
52.
PMU testing
53.
point-of-care testing
54.
processor core testing
55.
processor testing
56.
real-time HiL testing
57.
regression testing
58.
RISC processor testing
59.
robustness testing
60.
scenario testing
61.
scratch testing
62.
security testing
63.
small-scale fire testing
64.
software testing
65.
software-in-the-loop (SIL) testing
66.
stand-alone testing
67.
stress-testing
68.
substation testing methods
69.
system testing
70.
tensile testing
71.
testing
72.
testing methods
73.
testing of digital devices
74.
testing of generator
75.
testing of phasor measurement units
76.
two-dimensional array testing
77.
wafer testing
78.
wear testing
79.
vibration testing
80.
virtual testing
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