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Jenihhin, Maksim (author)
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201
book
2018 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC) : 30-31 October 2018, Tallinn, Estonia : proceedings in IEEE Xplore [Online resource]
2018
https://ieeexplore.ieee.org/xpl/conhome/8552599/proceeding
book
202
newspaper article
Töökindla arvutusriistvara keskuse juht Maksim Jenihhin
Jenihhin, Maksim
forte.delfi.ee
2024
Töökindla arvutusriistvara keskuse juht Maksim Jenihhin
newspaper article
203
journal article
Tööstusdoktorantuur projektis RESCUE
Jenihhin, Maksim
Mente et Manu
2017
/
lk. 21
http://www.ester.ee/record=b1242496*est
journal article
204
journal article EST
/
journal article ENG
Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
Cherezova, Natalia
;
Shibin, Konstantin
;
Jenihhin, Maksim
;
Jutman, Artur
Microelectronics reliability
2023
/
art. 115010, 10 p. : ill
https://doi.org/10.1016/j.microrel.2023.115010
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
205
journal article EST
/
journal article ENG
Understanding multidimensional verification : where functional meets non-functional
Lai, Xinhui
;
Balakrishnan, Aneesh
;
Lange, Thomas
;
Jenihhin, Maksim
;
Ghasempouri, Tara
;
Raik, Jaan
;
Alexandrescu, Dan
Microprocessors and microsystems
2019
/
art. 102867, 13 p. : ill
https://doi.org/10.1016/j.micpro.2019.102867
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Related publications
2
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid
206
book article
Universal mitigation of NBTI-induced aging by design randomization
Jenihhin, Maksim
;
Kamkin, Alexander
;
Navabi, Zainalabedin
;
Sadeghi-Kohan, Somayeh
Proceedings of 2016 IEEE East-West Design & Test Symposium (EWDTS) : Yerevan, Armenia, October 14-17, 2016
2017
/
[5] p. : ill
http://dx.doi.org/10.1109/EWDTS.2016.7807635
book article
207
book article
Unsupervised recycled FPGA detection using symmetry analysis
Tarique, Tanvir Ahmad
;
Ahmed, Foisal
;
Jenihhin, Maksim
;
Ali, Liakot
12th International Conference on Electrical and Computer Engineering : ICECE 2022
2022
/
p. 437-440
https://doi.org/10.1109/ICECE57408.2022.10088856
book article
208
book article
Upgrading QoSinNoC : efficient routing for mixed-criticality applications and power analysis
Avramenko, Serhiy
;
Azad, Siavoosh Payandeh
;
Violante, Massimo
;
Niazmand, Behrad
;
Raik, Jaan
;
Jenihhin, Maksim
Proceedings of the 2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 8-10, 2018, Verona, Italy
2018
/
p. 207-212 : ill
https://doi.org/10.1109/VLSI-SoC.2018.8644866
book article
209
book article
Using simulation statistics for bug localization in RTL designs
Tihhomirov, Valentin
;
Jenihhin, Maksim
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 107-110 : ill
book article
210
book article
Wafer-level die re-test success prediction using machine learning
Selg, Hardi
;
Jenihhin, Maksim
;
Ellervee, Peeter
21st IEEE Latin-American Test Symposium (LATS) 2020 : proceedings
2020
/
5 p
https://doi.org/10.1109/LATS49555.2020.9093672
book article
211
book article
VHDL design debug framework based on zamiaCAD
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2013 : Design Automation and Test in Europe, March 18-22, 2013, Grenoble, France
2013
/
[1] p. : ill
book article
212
newspaper article
Китайский ИИ сталкивается с ограничениями на Западе: введут ли их в Эстонии?
Kappi, A-M.
rus.postimees.ee
2025
Китайский ИИ сталкивается с ограничениями на Западе: введут ли их в Эстонии?
newspaper article
213
newspaper article
Профессор TalTech: закон об ИИ стал первым комплексным инструментом для защиты прав граждан
Jenihhin, Maksim
rus.err.ee
2025
Профессор TalTech: закон об ИИ стал первым комплексным инструментом для защиты прав гражданautor
newspaper article
214
newspaper article
«Сейчас время больших перемен»: профессор TalTech приоткрыл завесу тайны развития ИИ в Эстонии
Grebneva, N.
;
Jenihhin, Maksim
rus.postimees.ee
2025
«Сейчас время больших перемен»: профессор TalTech приоткрыл завесу тайны развития ИИ в Эстонии
newspaper article
Number of records 214, displaying
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1.
Jenihhin, Maksim
2.
Andrijaškin, Maksim
3.
Antonov, Maksim
4.
Butsenko, Maksim
5.
Dolinin, Maksim
6.
Gorev, Maksim
7.
Kuleša, Maksim
8.
Maksim, I.
9.
Maksim, Tiit
10.
Mõttus, Maksim
11.
Ošeka, Maksim
12.
Radzvilovits, Maksim
13.
Ruchkin, Maksim
14.
Saat, Maksim
15.
Sitnikov, Maksim
16.
Säkki, Maksim
17.
Zelenski, Maksim
name of the person
9
1.
Jenihhin, Maksim
2.
Jenihhin, Maksim, 1981-
3.
Antonov, Maksim
4.
Butsenko, Maksim
5.
Gorev, Maksim
6.
Gorki, Maksim, pseud., 1868-1936
7.
Ošeka, Maksim
8.
Ošeka, Maksim, 1988-
9.
Saat, Maksim
CV
9
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gazizov, Maksim 1918-?
5.
Oseka, Maksim
6.
Osheka, Maksim
7.
Ošeka, Maksim
8.
Saat, Maksim
9.
Säkki, Maksim
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