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551

journal article

PSL assertion checking using temporally extended high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2009 / 6, p. 289-300 : ill https://pld.ttu.ee/home/maksim/phd_papers/%5B11%5D%20latw%2708.pdf

journal article

552

book article

PSL assertion checking with temporally extended high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 49-54 : ill https://pld.ttu.ee/~maksim/phd_papers/%5B11%5D%20latw%2708.pdf

book article

553

newspaper article

Pöidlasuurune hiiglaneUbar, Raimund-JohannesSõnumileht1998 / 1. märts, lk. 8: ill https://artiklid.elnet.ee/record=b1761233*est

newspaper article

554

newspaper article

Pöördumine Haridus- ja Teadusministri ning Riigikogu kultuurikomisjoni esimehe poole : [doktorikoolide probleemist]Arro, Ilmar; Kaljurand, Mihkel; Kallavus, Urve; Kübarsepp, Jakob; Lille, Ülo; Lopp, Margus; Mellikov, Enn; Min, Mart; Rang, Toomas; Rüstern, Ennu; Taklaja, Andres; Tamm, Toomas; Tammet, Tanel; Tepandi, Jaak; Ubar, Raimund-Johannes; Öpik, AndresMente et Manu2005 / 18. mai. lk. 1 https://www.ester.ee/record=b1242496*est

newspaper article

555

book article

Pöördumine Haridus- ja Teadusministri ning Riigikogu kultuurikomisjoni esimehe poole : [doktorikoolide probleemist]Arro, Ilmar; Kaljurand, Mihkel; Kallavus, Urve; Kübarsepp, Jakob; Lille, Ülo; Lopp, Margus; Mellikov, Enn; Min, Mart; Rang, Toomas; Rüstern, Ennu; Taklaja, Andres; Tamm, Toomas; Tammet, Tanel; Tepandi, Jaak; Ubar, Raimund-Johannes; Öpik, AndresTallinna Tehnikaülikooli aastaraamat 20052006 / lk. 430-431

book article

556

book article

Quo vadis, tehnikakõrgharidus? : [kõne inseneride päeva tähistamisel Eesti Inseneride Liidus 9. detsembril 2011 Eesti Teaduste Akadeemia saalis Toompeal]Ubar, Raimund-JohannesTallinna Tehnikaülikooli aastaraamat 20112012 / lk. 296-307

book article

557

newspaper article

Rahvusvaheline konverents ja magistrikraadidUbar, Raimund-JohannesTehnikaülikool1997 / 1. dets., lk. 3: ill https://www.ester.ee/record=b5309277*est

newspaper article

558

book article

Raimund Ubari lühisõnavõtt : riigi teadus-, kultuuri- ja spordipreemiate ning F.J.Wiedemanni keeleauhinna kätteandmisel 24. veebruaril 2016. aastalUbar, Raimund-JohannesRaimund-Johannes Ubar. Bibliograafia2016 / lk. 45-46

book article

559

book article

Register-transfer level deductive fault simulation using decision diagramsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-JohannesBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 193-196 : ill

book article

560

journal article

Reisikirjad võõrsiltUbar, Raimund-JohannesHorisont1995 / 1, lk. 54-58; 2, lk. 35-39; 3, lk. 59-62; 4, lk. 51-54; 5, lk. 51-54; 6, lk. 51-55: ill https://artiklid.elnet.ee/record=b2029755*est

journal article

561

book article EST / book article ENG

Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programsPellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; Sonza Reorda, Matteo; Tihhomirov, Valentin; Ubar, Raimund-Johannes2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan2016 / p. 304-309 : ill https://doi.org/10.1109/ATS.2016.57 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

562

newspaper article

Rektor Andres Keevallik saab 24. veebruaril 70aastaseksHazak, Gabriel; Ubar, Raimund-Johannes; Kattel, RainerMente et Manu2013 / lk. 16 : fot https://www.ester.ee/record=b1242496*est

newspaper article

563

book article

Remarks on different decision diagramsStankovic, Radomir S.; Ubar, Raimund-Johannes; Astola, JaakkoProceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland2011 / p. 99-110 : ill

book article

564

book article

Remote and virtual laboratories in problem-based learning scenariosWuttke, Heinz-Dietrich; Ubar, Raimund-Johannes; Henke, Karsten2010 IEEE International Symposium on Multimedia ISM 2010 : 13-15 December 2010, Taichung, Taiwan : proceedings2010 / p. 377-382 : ill http://dx.doi.org/10.1109/ISM.2010.63

book article

565

book article

Removing design errors from digital circuitsUbar, Raimund-JohannesProc. of the 4th International Conference on New Information Technologies. Vol. 12000 / p. 118-125

book article

566

book article

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article

567

book article

Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715

book article

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

568

book article

Representing transparency conditions in test generation for VLSI by decision diagramsUbar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 213-216

book article

569

book article

Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-Dietrich34th ASEE/IEEE Frontiers in Education Conference : October 20-23, 2004, Savannah, GA2004 / p. S3F-18-S3F-23 : ill http://dx.doi.org/10.1109/FIE.2004.1408779

book article

570

book article

Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the Eighth IASTED International Conference on Computers and Advanced Technology in Education : August 29-31, 2005, Oranjestad, Aruba2005 / p. 232-237 : ill https://ieeexplore.ieee.org/document/1408779

book article

571

book article

Research and training scenarios for design and test of SOC [Electronic resource]Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichWCETE 2004 : World Congress on Engineering and Technology Education : Engineering Education in the Changing Society : March 14-17, 2004, Guaruja/Santos, Brazil2004 / p. 320-324 : ill. [CD-ROM]

book article

572

book article

Research environment for teaching digital testIvask, Eero; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 468-473 : ill https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf

book article

573

journal article

Research in digital design and test at Tallinn University of TechnologyUbar, Raimund-Johannes; Jervan, Gert; Jutman, Artur; Raik, Jaan; Ellervee, Peeter; Kruus, MargusRadioelectronics & informatics2008 / p. 4-12 : ill http://www.ewdtest.com/ri/%E2%84%96-1-40-january-march-2008/

journal article

574

book article

Research on digital system design and test at Tallinn University of TechnologyUbar, Raimund-Johannes; Ellervee, Peeter; Hollstein, Thomas; Jervan, Gert; Jutman, Artur; Kruus, Margus; Raik, JaanResearch in Estonia : present and future2011 / p. 184-205 : ill

book article

575

book article

Reseeding using compaction of pre-generated LFSR sequencesJutman, Artur; Aleksejev, Igor; Raik, Jaan; Ubar, Raimund-JohannesICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : 31st August to 3rd September 2008, Malta : conference guide2008 / p. 215

book article

Ubar, Raimund-Johannes (TTÜ author)

types of item

CV 63

author 57

name of the person 28

subject term 1