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526

book article

Optimization of structurally synthesized BDDsUbar, Raimund-Johannes; Vassiljeva, T.; Raik, Jaan; Jutman, Artur; Tombak, Mati; Peder, AhtiProceedings of the Fourth IASTED International Conference on Modelling, Simulation, and Optimization : August 17-19, 2004, Kavai, Hawaii, USA2004 / p. 234-240 : ill

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527

book article

Optimization of the store-and-generate based built-in self-testUbar, Raimund-Johannes; Jervan, Gert; Kruus, Helena; Orasson, Elmet; Aleksejev, IgorBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 199-202 : ill

book article

528

journal article

Otstarbeka, õiglase ja efektiivse Eesti eestUbar, Raimund-JohannesTehnikaülikool1995 / 23. jaan., lk. 3-5 https://www.ester.ee/record=b5309277*est

journal article

529

book article

Otstarbeka, õiglase ja tõhusa Eesti suunasUbar, Raimund-JohannesInsenerikultuur Eestis. 21995 / lk. 179-185 https://www.ester.ee/record=b1063622*est

book article

530

journal article

Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 303-324 : ill http://dx.doi.org/10.2298/FUEE1103303U

journal article

531

book article

Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesProceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland2011 / p. 1-10 : ill

book article

532

book article

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 20042004 / p. 253-258 : ill https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

book article

533

book article

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 20042004 / p. 173-176 https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

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534

book article

Parallel critical path tracing fault simulationUbar, Raimund-Johannes39. Internationales Wissenschaftliches Kolloquium : 27.-30.09.1994. Bd. 1, Vortragsreihen1994 / S. 399-404

book article

535

book article

Parallel critical path tracing fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanProceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 20182018 / p. 305-310 : ill https://doi.org/10.23919/MIXDES.2018.8436880

book article

536

book article

Parallel exact critical path tracing fault simulation with reduced memory requirementsDevadze, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 20092009 / p. 155-160 : ill https://ieeexplore.ieee.org/document/4938046

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537

book article

Parallel fault analysis on structurally synthesized BDDsDevadze, Sergei; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 47-50 : ill

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538

book article

Parallel fault backtracing for calculation of fault coverageUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur43rd International Conference on Microelectronics, Devices and Materials and the Workshop on Electronic Testing : September 12. - September 14.2007, Bled, Slovenia : MIDEM conference 2007 proceedings2007 / p. 165-170 : ill

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539

book article

Parallel fault backtracing for calculation of fault coverageUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturProceedings of the ASP-DAC 2008 : [13th] Asia and South Pacific Design Automation Conference 2008 : January 21-24, 2008, COEX, Seoul, Korea2008 / p. 667-672 : ill

book article

540

book article

Parallel fault simulation in digital circuitsAarna, Margit; Raik, Jaan; Ubar, Raimund-JohannesProc. of 42nd International Scientific Conference of Riga Technical University2001 / p. 91-94

book article

541

journal article

Parallel fault simulation in digital circuitsAarna, Margit; Raik, Jaan; Ubar, Raimund-JohannesScientific proceedings of Riga Technical University. 7. serija, Telecommunications and electronics2001 / p. 91-94 : ill

journal article

542

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

543

book article

Parallel X-fault simulation with critical path tracing technique [Electronic resource]Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturDATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 20102010 / p. 879-884 [CD-ROM]

book article

544

book

Pildikesi poolest sajandist : arvutitehnika instituudi luguUbar, Raimund-Johannes2016 http://www.ester.ee/record=b4639382*est

book

545

book article

Pipelined execution of data-parallel algorithmsGorev, Maksim; Ubar, Raimund-JohannesBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 109-112 : ill

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546

book article

Practical works for on-line teaching design and test of digital circuitsJutman, Artur; Ubar, Raimund-Johannes; Hahanov, V.; Skvortsova, O.The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume III2002 / p. 1223-1226 : ill http://dx.doi.org/10.1109/ICECS.2002.1046474

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547

book article

PrefaceUbar, Raimund-Johannes; Raik, Jaan; Vierhaus, Heinrich TheodorDesign and test technology for dependable systems-on-chip2011 / p. xxii-xxviii

book article

548

journal article EST / journal article ENG

PrefaceLyapin, Alexandr; Murgul, Vera; Beskopylny, A.N.; Porksheyan, V.M.; Komakhidze, M.G.; Sukhinov, A.I.; Chetverushkin, B.N.; Avetisyan, A.I.; Kalyaev, I.A; Ubar, Raimund-JohannesJournal of Physics: Conference Series2021 / art. 011001, 1 p https://doi.org/10.1088/1742-6596/2131/1/011001 Conference proceedings at Scopus Article at Scopus

journal article EST / journal article ENG

549

journal article

Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvementBlyzniuk, M.; Kazymyra, I.; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2001 / p. 2023-2040 : ill

journal article

550

book article

Probabilistic equivalence checking based on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 423-428 : ill

book article

Ubar, Raimund-Johannes (TTÜ author)

types of item

author 56

CV 56

name of the person 27

subject term 1