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51

book article

Distance-learning tools for digital design and test issuesJutman, Artur; Kruus, Margus; Sudnitsõn, Aleksander; Ubar, Raimund-JohannesIT+SE'2002 : Information Tec[h]nologies in Science, Education, Telecommunication, Business : proceedings = Информационные технологии в науке, образовании, телекоммуникации, бизнесе, Украина, Крым, Ялта-Гурзуф, 20-30 мая 2002 года : труды2002 / p. 269-272 : ill

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52

book article

Double phase fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Adeboye StephenDSD 2015 : 18th Euromicro Conference on Digital Systems Design : 26-28 August 2015, Funchal, Madeira, Portugal2015 / p. 700-705 : ill

book article

53

journal article EST / journal article ENG

Effect of keysight 3458A jitter on precision of phase difference measurementPokatilov, Andrei; Kübarsepp, Toomas; Vabson, ViktorIEEE transactions on instrumentation and measurement2016 / p. 2595-2600 : ill https://doi.org/10.1109/TIM.2016.2593965 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

54

book article

E-learning tool and excercises for teaching digital testUbar, Raimund-Johannes; Orasson, ElmetProceedings of the 2nd IEEE Conference on Signals, Systems, Decision and Information Technology : Sousse, Tunisia, 20032003 / [6] p. : ill https://pld.ttu.ee/dildis/publications/E-Learning%20tool%20and%20Excercises.pdf

book article

55

book article

E-learning tools for digital testDevadze, Sergei; Gorjachev, R.; Jutman, Artur; Orasson, Elmet; Rosin, Vjatšeslav; Ubar, Raimund-JohannesProc. III International Conference "Distance Learning - Educational Sphere of XXI Century" : Minsk, Belorussia, 20032003 / p. 336-342

book article

56

book article

Embedded diagnosis in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2008 26th International Conference on Microelectronics : Niš, Serbia, 11-14 May 2008 : proceedings. Vol. 22008 / p. 421-424 : ill

book article

57

book article

Embedded diagnosis in digital systemsKostin, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 81-84 : ill

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58

journal article

Embedded fault diagnosis in digital systems with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanMicroprocessors and microsystems2008 / 5/6, p. 279-287 : ill

journal article

59

journal article

Environment for the analysis of functional self-test quality in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Kruus, Helena; Aarna, Margit; Devadze, SergeiProceedings of the Estonian Academy of Sciences2014 / p. 151-162 : ill https://artiklid.elnet.ee/record=b2673964*est

journal article

60

book article

Equivalent transformations of structurally synthesized BDDs and applicationsJürimägi, Lembit; Ubar, Raimund-Johannes; Viies, Vladimir2019 8th Mediterranean Conference on Embedded Computing (MECO)2019 / 6 p. : ill https://doi.org/10.1109/MECO.2019.8760283

book article

61

newspaper article

Estonia huku uurimine jätkub, kuigi valitsus pole lisaraha veel eraldanud [Võrguväljaanne]Linnart, Marterr.ee2022 Estonia huku uurimine jätkub, kuigi valitsus pole lisaraha veel eraldanud

newspaper article

62

journal article

EUROCHIP - kursus digitaalsüsteemide kõrgtaseme sünteesist : [Leuven, Belgia : aug.-sept.]Tammemäe, KalleArvutustehnika ja Andmetöötlus1994 / 11, lk. 15-21

journal article

63

book article

Evaluation of the latency components in MPEG-4 DVB-T systemÄniline, JannoInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 77-80

book article

64

book article

Fast RTL fault simulation using decision diagrams and bitwise set operationsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-Johannes; Ellervee, Peeter2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada2011 / p. 164-170 https://ieeexplore.ieee.org/document/6104440

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65

book article

Fault modeling and diagnosis in digital systemsUbar, Raimund-JohannesCREDES Summer School : Dependable Systems Design : handouts2011 / p. 91-106 : ill

book article

66

dissertation

Fault simulation and code coverage analysis of RTL designs using high-level decision diagrams = Rikete simuleerimine ja koodikatte analüüs register-siirde tasemel kasutades kõrgtaseme otsustusdiagrammeReinsalu, Uljana2013 https://www.ester.ee/record=b2963595*est

dissertation

67

dissertation

Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimineDevadze, Sergei2009 https://digi.lib.ttu.ee/i/?445 https://www.ester.ee/record=b2508727*est

dissertation

68

book article

Foreword to the 12th IEEE DDECS SymposiumPliva, Zdenek; Manhaeve, Hans; Renovell, Michel; Novak, Ondrej; Ubar, Raimund-Johannes; Drabkova, JindraProceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 15-17, 2009, Liberec, Czech Republic2009 / p. iii http://dx.doi.org/10.1109/DDECS.2009.5012081

book article

69

dissertation

Formal verification and error correction on high-level decision diagrams = Formaalne verifitseerimine ja vigade parandamine kõrgtasemelistel otsustusdiagrammidelKarputkin, Anton2012

dissertation

70

book article

FPGA based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 59-62 https://ieeexplore.ieee.org/abstract/document/1423822

book article

71

book article

Functional level test set generation methodsUbar, Raimund-JohannesProceedings of the 12th Conference on Fault-Tolerant Systems and Diagnostics, Prague, Czechoslovakia, September, 19891989 / p. 46-55

book article

72

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article

73

book article

Functional specification and testing of digital systemsUbar, Raimund-JohannesMultimicroprocessor systems: Proceedings of the 3rd Symposium, Stralsund, oct. 16-20, 1989, Vol 11989 / p. 207-217

book article

74

book article

Functional test program generation for digital systemsUbar, Raimund-Johannes; Dušina, Julia; Krupnova, Helena; Storožev, Sergei; Zaugarov, ViktorTestmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 19941994 / p. 14-18: ill

book article

75

book article

GA-based test generation for sequential circuitsBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 30-34

book article

digitaaltehnika (subject term)

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subject term 1