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26
book article
Defect-oriented test generation and fault simulation in the environment of MOSCITO
Schneider, Andre
;
Diener, Karl-Heinz
;
Gramatova, Elena
;
Fisherova, Maria
;
Ivask, Eero
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
;
Kuzmicz, W.
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 303-306 : ill
book article
27
journal article
Design and verification of Cyber-Physical Systems using TrueTime, evolutionary optimization and UPPAAL
Balasubramaniyan, Sreram
;
Srinivasan, Seshadhri
;
Buonopane, Furio
;
Balasubramanian, Subathra
;
Vain, Jüri
;
Ramaswamy, Srini
Microprocessors and microsystems
2016
/
p. 37-48 : ill
http://dx.doi.org/10.1016/j.micpro.2015.12.006
journal article
28
book article
Design error diagnosis using backtrace algorithm on decision diagrams
Repinski, Urmas
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
p. 93-96
book article
29
book article
Diagnostic modeling of digital systems with multi-level decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Jenihhin, Maksim
Design and test technology for dependable systems-on-chip
2011
/
p. 92-118 : ill
https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams
book article
30
book article
Diagnostic modelling of digital systems with binary and high-level decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Kruus, Helena
;
Lensen, Harri
;
Evartson, Teet
Progress in industrial mathematics at ECMI 2006
2008
/
p. 902-907 : ill
https://link.springer.com/chapter/10.1007/978-3-540-71992-2_158
book article
31
journal article
Diagnostic modelling of digital systems with decision diagrams
Ubar, Raimund-Johannes
Вестник Томского государственного университета : приложение
2004
/
август, материалы международных, всесоюзных и региональных научных конференций, симпозиумов, школ, проводимых в ТГУ, с. 174-179 : ил
journal article
32
book article
Diagnostic modelling of digital systems with multi-level decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Evartson, Teet
;
Kruus, Margus
;
Lensen, Harri
Proceedings of the 17th IASTED International Conference on Modelling and Simulation : May 24-26, 2006, Montreal, Quebec, Canada
2006
/
p. 207-212 : ill
book article
33
newspaper article
Digievolutsiooni võimalused koolihariduses
Jürjo, Silvester
Studioosus
2015
/
lk. 20-21
https://www.ester.ee/record=b1558644*est
newspaper article
34
book
Digitaalseadmete simuleerimine : õppemetoodiline vahend
1989
https://www.ester.ee/record=b1221053*est
book
35
book
Digitaalseadmete struktuuri projekteerimine : õppevahend
Ariste, Andri
1978
https://www.ester.ee/record=b1305228*est
book
36
book
Digitaalsüsteemide diagnostika
Ubar, Raimund-Johannes
2005
http://www.ester.ee/record=b2097071*est
book
37
book article
Digitaalsüsteemide diagnostika Tallinna Tehnikaülikoolis
Ubar, Raimund-Johannes
Teadusmõte Eestis : tehnikateadused
2002
/
lk. 107-113 : ill
book article
38
book
Digitaaltehnika doktorantidele. Osa II, Kombinatsioon- ja järjendlülitused = Digital engineering. Part II, Combinational and sequential circuits [Võrguväljaanne]
Lehtla, Madis
2014
http://egdk.ttu.ee/files/2014/Digitaaltehnika_doktorantidele2.pdf
book
39
journal article
Digitaalteleviisorid
Schults, Eduard
Side. Raadio. Televisioon : infoseeria 10
1984
/
lk. 8-10 : ill
https://www.ester.ee/record=b1232303~S1*est
journal article
40
journal article
Digital design at microarch[i]tectural level based on quality relationship measures
Kruus, Margus
;
Lensen, Harri
;
Sudnitsõn, Aleksander
Успехи современного естествознания
2004
/
5, приложение 1, Материалы XXXI международной конференции и дискуссионного научного клуба : информационные технологии в науке, образовании, телекоммуникации и бизнесе : IT+SE'2004 : Украина, Крым, Ялта-Гурзуф, 18-27 мая 2004 года, с. 29-30
journal article
41
journal article
Digital electronics design and test at Computer Engineering Department of Tallinn University of Technology
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Ellervee, Peeter
The house magazine : the parlamentary weekly
2006
/
1198, p. 42 : ill
journal article
42
book article
Digital hardware organization course for SoC program
Ellervee, Peeter
;
Tenhunen, Hannu
2001 International Conference on Microelectronic Systems Education : June 17-18, 2001, Las Vegas, Nevada, USA : proceedings
2001
/
p. 26-27
https://ieeexplore.ieee.org/document/932402
book article
43
journal article EST
/
journal article ENG
Digital last planner system whiteboard for enabling remote collaborative design process planning and control
Pikas, Ergo
;
Pedo, Barbara
;
Tezel, Algan
;
Koskela, Lauri
;
Veersoo, Markus
Sustainability
2022
/
art. 12030
https://doi.org/10.3390/su141912030
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
44
book article
A digital measuring module for tool wear estimation
Otto, Tauno
;
Kurik, Lembit
;
Papstel, Jüri
DAAAM international scientific book 2003
2003
/
p. 435-444
book article
45
book article
Digital object memory based monitoring and assistance applications in manual work station
Aruväli, Tanel
14th International Symposium "Topical problems in the field of electrical and power engineering. Doctoral school of energy and geotechnology. II" : Pärnu, Estonia, January 13-18, 2014
2014
/
p. 274-276 : ill
book article
46
book article
Digital synthesis tools for education and research
Fomina, Jelena
;
Ellervee, Peeter
;
Kruus, Margus
;
Sudnitsõn, Aleksander
;
Tammemäe, Kalle
Proc. 18th International Conference on Systems for Automation of Engineering and Research (SAER'2004)
2004
/
p. 160-164
book article
47
book article
Distance-learning tools for digital design and test issues
Jutman, Artur
;
Kruus, Margus
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
IT+SE'2002 : Information Tec[h]nologies in Science, Education, Telecommunication, Business : proceedings = Информационные технологии в науке, образовании, телекоммуникации, бизнесе, Украина, Крым, Ялта-Гурзуф, 20-30 мая 2002 года : труды
2002
/
p. 269-272 : ill
book article
48
book article
Double phase fault collapsing with linear complexity in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Orasson, Elmet
;
Josifovska, Galina
;
Oyeniran, Adeboye Stephen
DSD 2015 : 18th Euromicro Conference on Digital Systems Design : 26-28 August 2015, Funchal, Madeira, Portugal
2015
/
p. 700-705 : ill
book article
49
journal article
Effect of keysight 3458A jitter on precision of phase difference measurement
Pokatilov, Andrei
;
Kübarsepp, Toomas
;
Vabson, Viktor
IEEE transactions on instrumentation and measurement
2016
/
p. 2595-2600 : ill
https://doi.org/10.1109/TIM.2016.2593965
journal article
50
book article
E-learning tool and excercises for teaching digital test
Ubar, Raimund-Johannes
;
Orasson, Elmet
Proceedings of the 2nd IEEE Conference on Signals, Systems, Decision and Information Technology : Sousse, Tunisia, 2003
2003
/
[6] p. : ill
https://pld.ttu.ee/dildis/publications/E-Learning%20tool%20and%20Excercises.pdf
book article
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