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126
book article
Parallel critical path tracing fault simulation
Ubar, Raimund-Johannes
39. Internationales Wissenschaftliches Kolloquium : 27.-30.09.1994. Bd. 1, Vortragsreihen
1994
/
S. 399-404
book article
127
journal article
Parallel fault simulation in digital circuits
Aarna, Margit
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Scientific proceedings of Riga Technical University. 7. serija, Telecommunications and electronics
2001
/
p. 91-94 : ill
journal article
128
book article
Parallel fault simulation in digital circuits
Aarna, Margit
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proc. of 42nd International Scientific Conference of Riga Technical University
2001
/
p. 91-94
book article
129
book article
Probabilistic equivalence checking based on high-level decision diagrams
Karputkin, Anton
;
Ubar, Raimund-Johannes
;
Tombak, Mati
;
Raik, Jaan
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
2011
/
p. 423-428 : ill
https://ieeexplore.ieee.org/document/5783130
book article
130
book article
PSL assertions based verification with HLDD tools
Jenihhin, Maksim
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 17-20 : ill
book article
131
book article
Register transfer low power design based on controller decomposition
Sudnitsõn, Aleksander
MIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 2
2004
/
p. 735-738 : ill
https://ieeexplore.ieee.org/document/1314937
book article
132
book article
Research environment for teaching digital test
Ivask, Eero
;
Jutman, Artur
;
Orasson, Elmet
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Synergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 2
2004
/
p. 468-473 : ill
https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf
book article
133
journal article
Research in digital design and test at Tallinn University of Technology
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Jutman, Artur
;
Raik, Jaan
;
Ellervee, Peeter
;
Kruus, Margus
Radioelectronics & informatics
2008
/
p. 4-12 : ill
http://www.ewdtest.com/ri/%E2%84%96-1-40-january-march-2008/
journal article
134
book article
Research on digital system design and test at Tallinn University of Technology
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Hollstein, Thomas
;
Jervan, Gert
;
Jutman, Artur
;
Kruus, Margus
;
Raik, Jaan
Research in Estonia : present and future
2011
/
p. 184-205 : ill
book article
135
book
Ringhääling '99 : VI Rahvusvahelise Telekommunikatsioonipäeva konverentsi ettekannete materjalid
1999
https://www.ester.ee/record=b1260725*est
book
136
book
Ringhääling 2003 : X rahvusvahelise telekommunikatsioonipäeva materjalid : [16. mai 2003, Tallinn]
2003
http://www.ester.ee/record=b1782571*est
book
137
book article
RT-level test point insertion for sequential circuits
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings
2004
/
p. 34-40 : ill
https://ieeexplore.ieee.org/document/1428412
book article
138
book article
Scalable algorithm for structural fault collapsing in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Orasson, Elmet
;
Raik, Jaan
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea
2015
/
p. 171-176 : ill
book article
139
journal article
Second IEEE East-West Design and Test Workshop
Hahanov, Vladimir
;
Ubar, Raimund-Johannes
IEEE journal of design & test of computers
2004
/
p. 594
journal article
140
dissertation
Selected issues of modeling, verification and testing of digital systems
Jutman, Artur
2004
https://www.ester.ee/record=b1989760*est
dissertation
141
dissertation
Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemid
Kostin, Sergei
2012
https://www.ester.ee/record=b2757857*est
dissertation
142
book article
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
book article
143
book article
Sequential circuits BIST with status bit control
Raik, Jaan
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004
2004
/
p. 507-510 : ill
https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf
book article
144
book article
Simulation and automated test development system for digital devices
Birger, Alexander
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 293-295
book article
145
book
Sissejuhatus digitaaltehnikasse
Lehtla, Madis
2016
http://www.ester.ee/record=b4618200*est
book
146
book article EST
/
book article ENG
Small and medium-sized seaports on the digital track : tracing digitalisation across the South Baltic region by innovative auditing procedures
Philipp, Robert
;
Gerlitz, Laima
;
Moldabekova, Aisulu
Reliability and statistics in transportation and communication : Selected Papers from the 19th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’19, 16-19 October 2019, Riga, Latvia
2020
/
p. 351-362
https://doi.org/10.1007/978-3-030-44610-9_35
Article collection metrics at Scopus
Article at Scopus
book article EST
/
book article ENG
147
dissertation
Some new aspects of digital filtering
Trump, Tõnu
1993
http://www.ester.ee/record=b1065194*est
dissertation
148
dissertation
Some new aspects of digital filtering : a thesis ... for the degree of doctor of engineering
Trump, Tõnu
1993
http://www.ester.ee/record=b2677070*est
dissertation
149
book article
Structurally synthesized multiple input BDDs for simulation of digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009 : Yasmine Hammamet, Tunesia, 13-19 December, 2009
2009
/
p. 451-454 : ill
http://dx.doi.org/10.1109/ICECS.2009.5410895
book article
150
dissertation
Symbolic test generation for hierarchically modeled digital systems
Zaugarov, Viktor
1993
https://www.ester.ee/record=b2090336*est
dissertation
Number of records 216, displaying
126 - 150
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