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1
dissertation
AC measurement converters : analog and digital solutions
Märtens, Olev
2000
http://www.ester.ee/record=b1707866*est
dissertation
2
book article
AG-model for design of testable controllers
Kasirova, Lilia
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 303-306: ill
book article
3
book article
Algorithms for hierarchical fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Klüver, B.
Proceedings of the 10th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2003 : Lodz, Poland, 26-28 June 2003
2003
/
p. 530-535 : ill
book article
4
book article
Alternative graph based test design in digital systems
Ubar, Raimund-Johannes
Proceedings of 11. NORCHIP seminar, Trondheim, Nov. 9-10, 1993
1993
/
p. 48-62
book article
5
book article
Alternative graphs and test pattern design in digital systems
Ubar, Raimund-Johannes
Proc. of the 6th Workshop on New Directions for Testing, Montreal, Canada, May 20-22, 1992
1992
book article
6
book article
Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systems
Ubar, Raimund-Johannes
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 285-292: ill
book article
7
book article
An educational environment for digital testing : hardware, tools, and web-based runtime platform
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Vislogubov, Vladislav
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 412-419 : ill
https://www.researchgate.net/profile/Artur-Jutman/publication/220880167_An_Educational_Environment_for_Digital_Testing_Hardware_Tools_and_Web-Based_Runtime_Platform/links/02e7e53c3c71b0b2a7000000/An-Educational-Environment-for-Digital-Testing-Hardware-Tools-and-Web-Based-Runtime-Platform.pdf
book article
8
book article
Applying FPGA partial reconfiguration for digital system simulation
Arhipov, Anton
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 145-148 : ill
book article
9
book article
Asynchronous e-learning resources for hardware design issues
Jutman, Artur
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Proceedings of the International Conference on Computer Systems and Technologies (e-learning) : CompSysTech'04 : Rousse, Bulgaria, 17-18 June
2004
/
p. IV.11-1 - IV.11-6 : ill
https://www.researchgate.net/publication/234797327_Asynchronous_e-learning_resources_for_hardware_design_issues
book article
10
book article
At-speed on-chip diagnosis of board-level interconnect faults
Jutman, Artur
Ninth IEEE European Test Symposium : ETS 2004 : 23-26 May 2004, Corsica, France : proceedings
2004
/
p. 2-7 : ill
https://www.researchgate.net/publication/4098807_At-speed_on-chip_diagnosis_of_board-level_interconnect_faults
book article
11
dissertation
At-speed testing and test quality evaluation for high-performance pipelined systems Töökiirusel testimine ja testi kvaliteedi hindamine kõrgjõudlus-konveierarhitektuuriga süsteemidele
Gorev, Maksim
2015
https://digi.lib.ttu.ee/i/?3953
dissertation
12
book article
Automated correction of design errors by edge redirection on high-level decision diagrams
Karputkin, Anton
;
Ubar, Raimund-Johannes
;
Tombak, Mati
;
Raik, Jaan
13th International Symposium on Quality Electronic Design (ISQED), 2012
2012
/
p. 686-693 : ill
https://ieeexplore.ieee.org/document/6113980
book article
13
book article
Automated test bench generation for high-level synthesis flow ABELITE
Viilukas, Taavi
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Baranov, Samary
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2011) : Sevastopol, Ukraine, September 9-12, 2011
2011
/
p. 13-16 : ill
https://ieeexplore.ieee.org/document/6116601
book article
14
book article
Back-traced deductive-parallel fault simulation for digital systems
Hahanov, Vladimir
;
Ubar, Raimund-Johannes
;
Hyduke, Stanley
Proceedings : Euromicro Symposium on Digital System Design : Belek-Antalya, Turkey, September 1st to 6th, 2003
2003
/
p. 370-377 : ill
https://ieeexplore.ieee.org/document/1231969
book article
15
book article
Berechnung von tests für die Fehlerdiagnose in Digitalsystem
Ubar, Raimund-Johannes
Internationales wissenschaftliches Kolloquium, 21. 1. November bis 5. November 1976, H. 2: Vortragsreihe A 2: Entwurf, Analyse und Einsatz von informationsverarbeitenden Systemen: IWK
1976
/
p. [?]
book article
16
book article
Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
;
Wuttke, Heinz-Dietrich
International Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal
2007
/
[7] p. : ill. [CD-ROM]
http://icee2007.dei.uc.pt/proceedings/papers/429.pdf
book article
17
book article
Built-in self diagnosis with multiple signature analyzers in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 29-34 : ill
book article
18
book article
CAD für Digitaltechnik - eine Programmfamilie für den Entwurf von Testmustern zum Test von Digitalschaltungen
Ubar, Raimund-Johannes
IBM Hochschulkongress '92: Offene Grenzen - offene Systeme, Dresden, 30.09-2.10.1992
1992
/
S.IV9 1-14
book article
19
journal article EST
/
journal article ENG
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Microprocessors and microsystems
2020
/
art. 103117, 12 p
https://doi.org/10.1016/j.micpro.2020.103117
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
20
journal article
Combining functional and structural approaches in test generation for digital systems
Ubar, Raimund-Johannes
Microelectronics reliability
1998
/
3, p. 317-329 : ill
journal article
21
book article
Comparison of two approaches to improve functional BIST fault coverage
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Gorev, Maksim
;
Mägi, Gunnar
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
2014
/
p. 105-108 : ill
book article
22
book article
Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600967
book article
23
book article
A constraint-driven gate-level test generator
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Krupnova, Helena
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 237-240: ill
book article
24
book article
Constraints analysis in hierarchical test generation for digital systems
Ubar, Raimund-Johannes
;
Krupnova, Helena
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 313-318: ill
book article
25
journal article
Decision diagrams - from a mathematical notion to engineering applications
Stankovic, Radomir S.
;
Ubar, Raimund-Johannes
;
Astola, Jaakko
Facta Universitatis [Niš]. Series electronics and energetics
2011
/
p. 281-301 : ill
http://dx.doi.org/10.2298/FUEE1103281S
journal article
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