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151
dissertation
Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees
Perez, Tiago Diadami
2023
https://doi.org/10.23658/taltech.4/2023
https://digikogu.taltech.ee/et/Item/440f41fd-0950-4b5c-8e47-4f75a754cdae
https://www.ester.ee/record=b5536743*est
dissertation
Seotud publikatsioonid
6
Side-channel Trojan insertion - a practical foundry-side attack via ECO
G-GPU : a fully-automated generator of GPU-like ASIC accelerators
A survey on split manufacturing : attacks, defenses, and challenges
A pragmatic methodology for blind hardware trojan insertion in finalized layouts
Hardware trojan insertion in finalized layouts : from methodology to a silicon demonstration
A side-channel hardware trojan in 65nm CMOS with 2μW precision and multi-bit leakage capability
152
book article
Shift register based TPG for at-speed interconnect BIST
Jutman, Artur
MIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 2
2004
/
p. 751-754 : ill
https://ieeexplore.ieee.org/document/1314941?signout=success
book article
153
book article EST
/
book article ENG
Side-channel attacks on triple modular redundancy schemes
Almeida, Felipe
;
Aksoy, Levent
;
Raik, Jaan
;
Pagliarini, Samuel Nascimento
2021 IEEE 30th Asian Test Symposium ATS 2021 : proceedings
2021
/
p. 79-84 : ill
https://doi.org/10.1109/ATS52891.2021.00026
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
154
book article
A side-channel hardware trojan in 65nm CMOS with 2μW precision and multi-bit leakage capability
Perez, Tiago Diadami
;
Pagliarini, Samuel Nascimento
2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) : 17-20 January 2022 : Taipei, Taiwan
2022
/
p. 9-10 : ill
https://doi.org/10.1109/ASP-DAC52403.2022.9712490
book article
Seotud publikatsioonid
1
Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees
155
book article EST
/
book article ENG
Side-channel Trojan insertion - a practical foundry-side attack via ECO
Perez, Tiago Diadami
;
Imran, Malik
;
Vaz, Pablo
;
Pagliarini, Samuel Nascimento
2021 IEEE International Symposium on Circuits and Systems (ISCAS), Daegu, Korea, May 22-28, 2021 : proceedings
2021
/
5 p. : ill
https://doi.org/10.1109/ISCAS51556.2021.9401481
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Seotud publikatsioonid
1
Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees
156
journal article
Silicon integrated circuit fabrication process modeling and simulation
Rang, Toomas
;
Tarnay, K.
;
Mizsei, Janos
Periodica polytechnica. Electrical engineering = Электротехника
1980
/
p. 109-113
https://www.ester.ee/record=b1198855*est
journal article
157
book article
A simulation framework for 3-dimension networks-on-chip with different vertical channel density configurations
Ying, Haoyuan
;
Jaiswal, Ashok
;
Abd El Ghany, Mohamed A
;
Hollstein, Thomas
;
Hofmann, Klaus
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
/
p. 83-88 : ill
book article
158
journal article EST
/
journal article ENG
Split-chip design to prevent IP reverse engineering
Pagliarini, Samuel Nascimento
;
Sweeney, Joseph
;
Mai, Ken
;
Blanton, Shawn
;
Mitra, Subhasish
;
Pileggi, Larry
IEEE Design and Test
2020
/
p. 109-118
https://doi.org/10.1109/MDAT.2020.3033255
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
159
book article
Steady state analysis of an output signal based combination of two NLMS adaptive filters
Trump, Tõnu
17th European Signal Processing Conference (EUSIPCO 2009) : 24-28 August 2009
2009
/
p. 1720-1724
https://ieeexplore.ieee.org/document/7077570
book article
160
book article
Steady state analysis of the galvanically isolated DC/DC converter with a commutating LC filter [Electronic resource]
Zakis, Janis
;
Vinnikov, Dmitri
;
Rankis, Ivars
2012 IEEE International Conference on Industrial Technology : proceedings CD
2012
/
p. 838-843 : ill [CD-ROM]
https://ieeexplore.ieee.org/document/6210041
book article
161
book article
Structurally synthesized multiple input BDDs for simulation of digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009 : Yasmine Hammamet, Tunesia, 13-19 December, 2009
2009
/
p. 451-454 : ill
http://dx.doi.org/10.1109/ICECS.2009.5410895
book article
162
journal article EST
/
journal article ENG
A survey on split manufacturing : attacks, defenses, and challenges
Perez, Tiago Diadami
;
Pagliarini, Samuel Nascimento
IEEE Access
2020
/
p. 184013-184035
https://doi.org/10.1109/ACCESS.2020.3029339
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees
163
book
Süvatehnoloogiate alternatiivsed arengutrajektoorid ja nende tähendus Eestile : lõpparuanne
Koppel, Kaupo
;
Kuusik, Alar
;
Arrak, Kadri
;
Raik, Jaan
;
Niidu, Allan
;
Kõks, Kerttu-Liis
;
Lahtvee, Petri-Jaan
2023
https://media.voog.com/0000/0037/5345/files
book
164
journal article EST
/
journal article ENG
Symmetry in the narrow sense: on the linearity and time-invariance of DQ0 models
Segev, Elior
;
Ofir, Ron
;
Belikov, Juri
;
Levron, Yoash
IEEE Transactions on Power Systems
2023
/
p. 1751-1754
https://doi.org/10.1109/TPWRS.2022.3229873
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
165
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
166
book article
Synthesis of sequential circuits with dynamic power management
Lensen, Harri
;
Kruus, Margus
;
Sudnitsõn, Aleksander
Proc. of 42nd International Scientific Conference of Riga Technical University : RTUCET'01
2001
/
p. 81-86
book article
167
journal article
Synthesis of sequential circuits with dynamic power management
Lensen, Harri
;
Kruus, Margus
;
Sudnitsõn, Aleksander
Scientific proceedings of Riga Technical University. 7.serija, Telecommunications and electronics
2001
/
p. 81-86
journal article
168
journal article
System-level data format exploration for dynamically allocated data structures
Ellervee, Peeter
;
Miranda, Miguel
;
Catthoor, Francky
;
Hemani, Ahmed
IEEE transactions on computer-aided design of integrated circuits and systems
2001
/
12, p. 1469-1472 : ill
https://ieeexplore.ieee.org/abstract/document/969440
journal article
169
dissertation
System-level design of timing-sensitive network-on-chip based dependable systems = Kiipvõrkudel põhinevate ajakriitiliste ja töökindlate süsteemide kõrgtaseme disain
Tagel, Mihkel
2012
https://www.ester.ee/record=b2778263*est
dissertation
170
journal article
Z-RAM-mälu
Toomsalu, Arvo
A & A
2008
/
3, lk. 10-19
https://artiklid.elnet.ee/record=b1022321*est
journal article
171
newspaper article
TalTechi arvutisüsteemide professori uudne tehnoloogia raskendab spionaaži [Võrguväljaanne]
Kald, Indrek
ituudised.ee
2021
"TalTechi arvutisüsteemide professori uudne tehnoloogia raskendab spionaaži
newspaper article
172
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
173
book article
Teaching digital test with BIST analyzer
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
2008
/
p. 123-128 : ill
http://dx.doi.org/10.1109/EAEEIE.2008.4610171
book article
174
newspaper article
Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputada
Port, Kristjan
delfi.ee
2023
Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputada
newspaper article
175
newspaper article
Tehnikaülikooli teadlased loovad uue põlvkonna veakindlaid kiipe
Nõges, Krõõt
Mente et Manu
2010
/
lk. 2
https://www.ester.ee/record=b1242496*est
newspaper article
Number of records 205, displaying
151 - 175
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