Searching - TalTech Research Portal

display

sort

101

journal article

Embedded fault diagnosis in digital systems with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanMicroprocessors and microsystems2008 / 5/6, p. 279-287 : ill

journal article

102

book article

Embedded instrumentation toolbox for screening marginal defects and outliers for productionOdintsov, Sergei; Jutman, Artur; Devadze, Sergei; Aleksejev, IgorIEEE AUTOTESTCON 2017 : Schaumburg, USA, Sept 11-14, 2017 : proceedings2017 / p. 336-334 : ill https://doi.org/10.1109/AUTEST.2017.8080516

book article

103

book article

Encoderless rotor position estimation of a switched reluctance drive operated under model predictive controlAnuchin, Alecksey; Shpak, Dmitry; Demidova, Galina2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings2020 https://doi.org/10.1109/RTUCON51174.2020.9316621

book article

104

journal article

Environment for the analysis of functional self-test quality in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Kruus, Helena; Aarna, Margit; Devadze, SergeiProceedings of the Estonian Academy of Sciences2014 / p. 151-162 : ill https://artiklid.elnet.ee/record=b2673964*est

journal article

105

journal article EST / journal article ENG

Estimating time constants for underfloor heating controlKull, Tuule Mall; Thalfeldt, Martin; Kurnitski, JarekJournal of physics : conference series2019 / art. 012121, 6 p. : ill https://doi.org/10.1088/1742-6596/1343/1/012121 Conference proceeding at Scopus Article at Scopus Article at WOS

journal article EST / journal article ENG

106

book article

Estimation of complex derivatives and application for fault diagnosisBaraškova, Tatjana; Arjassov, Gennadi; Gornostajev, DmitriAnnals of DAAAM for 2012 & Proceedings of the 23rd International DAAAM Symposium : Intelligent Manufacturing & Automation2012 / p. 0469-0472 : ill. [CD-ROM] https://www.daaam.info/Downloads/Pdfs/proceedings/proceedings_2012/109.pdf

book article

107

book article

Estimation of complex derivatives application for fault diagnosisBaraškova, Tatjana; Pascault, D.17th International conference on "Mathematical Modelling and Analysis" : June 6-9, 2012, Tallinn, Estonia : abstracts2012 / p. 19

book article

108

journal article

Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanInternational journal of microelectronics and computer science2018 / p. 9−18 https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1 https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf

journal article

109

book article

Extended checkers for control part of routers in network-on-chipsHariharan, Ranganathan; Niazmand, Behrad; Hollstein, Thomas; Raik, Jaan; Jervan, GertMEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France2015 / p. 36-39 : ill

book article

110

book article

Extended checkers for logic-based distributed routing in network-on-chipsNiazmand, Behrad; Hariharan, Ranganathan; Govind, Vineeth; Jervan, Gert; Hollstein, Thomas; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 83-86 : ill

book article

111

book article

Extended checkers for logic-based distributed routing in network-on-chipsNiazmand, Behrad; Hariharan, Ranganathan; Govind, Vineeth; Jervan, Gert; Hollstein, Thomas; Raik, JaanBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 77-80 : ill

book article

112

book article EST / book article ENG

Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, JaanVLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers2016 / p. 23-45 : ill https://doi.org/10.1007/978-3-319-46097-0_2 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

113

book article

Fault diagnosis in integrated circuits with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Evartson, Teet; Lensen, Harri10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 604-610 : ill http://dx.doi.org/10.1109/DSD.2007.4341530

book article

114

journal article

Fault diagnosis in VLSI devicesUbar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering1995 / 1, p. 51-67

journal article

115

book article

Fault diagnosis of additional vibration in Cartesian robotAutsou, Siarhei21st International Symposium "Topical problems in the field of electrical and power engineering. Doctoral school of energy and geotechnology. III" : Pärnu, Estonia, June 15-18, 20222022 / p. 21-22 : ill https://www.ester.ee/record=b5504019*est

book article

116

book article

Fault diagnosis of output-side diode-bridge in isolated DC-DC series resonant converterBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2022 IEEE 7th International Energy Conference (ENERGYCON)2022 https://doi.org/10.1109/ENERGYCON53164.2022.9830339

book article

117

book article

Fault modeling and diagnosis in digital systemsUbar, Raimund-JohannesCREDES Summer School : Dependable Systems Design : handouts2011 / p. 91-106 : ill

book article

118

book article

Fault simulation with parallel exact critical path tracing in multiple core environmentGorev, Maksim; Ubar, Raimund-Johannes; Devadze, SergeiProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 9-13 March 2015, Grenoble, France2015 / p. 1180-1185 : ill

book article

119

journal article

Fehlerbestimmung in kombinatorischen Scaltungen durch Lösung der Booleschen DifferentialgleichungenUbar, Raimund-JohannesNachrichtentechnik, Elektronik : technisch-wissenschaftlishe Zeitschrift für die gesamte elektronische Nachrichtentechnik1978 / p. 330-334 : ill https://www.ester.ee/record=b1550811*est

journal article

120

book article

Finite element analysis based technique implementation for fault diagnostic of electrical machinesAkbar, Siddique22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III : Pärnu, Estonia, August 23-26, 20232023 / p. 103-104 https://www.ester.ee/record=b5570906*est

book article

121

journal article EST / journal article ENG

FOPID controllers and their industrial applications: a survey of recent resultsTepljakov, Aleksei; Alagoz, Baris Baykant; Petlenkov, EduardIFAC-PapersOnLine2018 / p. 25-30 https://doi.org/10.1016/j.ifacol.2018.06.014 Conference proceedings at Scopus Article at Scopus Article at WOS

journal article EST / journal article ENG

122

book article

A framework for area-efficient concurrent online checkers designSaltarelli, Pietro; Niazmand, Behrad; Hariharan, Ranganathan; Raik, Jaan; Jervan, Gert; Hollstein, ThomasMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 64-69 : ill

book article

123

book article

A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routersSaltarelli, Pietro; Niazmand, Behrad; Raik, Jaan; Govind, Vineeth; Hollstein, Thomas; Jervan, Gert; Hariharan, RanganathanNOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 20152015 / [8] p. : ill http://dx.doi.org/10.1145/2786572.2788713

book article

124

book article

A framework for comprehensive automated evaluation of concurrent online checkersSaltarelli, Pietro; Niazmand, Behrad; Raik, Jaan; Hariharan, Ranganathan; Jervan, Gert; Hollstein, ThomasEuromicro Conference on Digital System Design : DSD 2015 : 26-28 August 2015, Funchal, Madeira, Portugal : proceedings2015 / p. 288-292 : ill http://dx.doi.org/10.1109/DSD.2015.15

book article

125

book article

From online fault detection to fault management in network-on-chips : a ground-up approachAzad, Siavoosh Payandeh; Niazmand, Behrad; Janson, Karl; Nevin, George; Oyeniran, Adeboye Stephen; Putkaradze, Tsotne; Apneet Kaur; Raik, Jaan; Jervan, Gert; Ubar, Raimund-Johannes; Hollstein, ThomasProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 48-53 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

book article

diagnostika (tehnika) (subject term)

types of item

subject term 38

keyword 1

TTÜ subject term 1