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326

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Motor Mode Analysis of Exterior-Rotor PM Machine with Gramme's WindingNukki,Rene; Kilk, Aleksander; Saarts, Samo; Tiimus, KristjanElektronika ir elektrotechnika = Electronics and electrical engineering2017 / p. 21-25 : ill http://dx.doi.org/10.5755/j01.eie.23.1.17579

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327

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Mudelipõhine testimineKull, AndresTallinna Tehnikaülikooli aastaraamat 20102011 / lk. 115-118

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328

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Mudelipõhine testimine : kas teoreetikute näpuharjutus või testimise homne päev?Markvardt, MailiA & A2010 / 3, lk. 48-56 https://artiklid.elnet.ee/record=b2183739*est

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329

book article EST / book article ENG

Multi-fragment Markov model guided online test generation for MPSoCVain, Jüri; Tsiopoulos, Leonidas; Kharchenko, Vyacheslav; Apneet Kaur; Jenihhin, Maksim; Raik, JaanICTERI 2017 : ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer : proceedings of the 13th International Conference on ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer, Kyiv, Ukraine, May 15-18, 20172017 / p. 594-607 : ill http://www.scopus.com/inward/record.uri?eid=2-s2.0-85020540459&partnerID=40&md5=af226e25c344c52689f23bf5c39cc267 http://ceur-ws.org/Vol-1844/10000594.pdf Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

330

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Multi-level test generation and fault diagnosis for finite state machinesUbar, Raimund-Johannes; Brik, MarinaDependable computing : proceedings / EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 19961996 / p. 264-281: ill

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331

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Multi-level test generation and fault diagnosis in digital systemsUbar, Raimund-Johannes1992

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332

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Multi-level test generation for digital systems at system, circuit and defect levelsUbar, Raimund-JohannesProceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 20012001 / p. 286-288

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333

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Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

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334

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Multiple fault analyses in logic circuitsUbar, Raimund-JohannesIFAC-Symposium Discrete Systems : Dresden, 14.-19. 3. 771977 / p. [?]

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335

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Multiple stuck-at-fault detection theoremUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 / p. 236-241 : ill

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336

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Multiple-objective backtrace for solving test generation constraintsMekler, A.; Raik, JaanInternational Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings2003 / p. 123-126 : ill https://ieeexplore.ieee.org/document/1267732

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337

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Multiscale memristive properties of skin induced by memory effects of cyclic stress-relaxation loadings : data fusion from ground truth nonlinear acousto-mechanical testingDos Santos, Serge; Masood, Ali; Lints, Martin; Salupere, Andrus; Kozena, Colette; Kus, VaclavICSV 2018: 25th International Congress on Sound and Vibration (ICSV25), Hiroshima, Japan, 8-12 July, 2018 : proceedings. Vol. 12018 / p. 1965-1972 : ill http://toc.proceedings.com/40638webtoc.pdf https://www.researchgate.net/publication/326668548_MULTISCALE_MEMRISTIVE_PROPERTIES_OF_SKIN_INDUCED_BY_MEMORY_EFFECTS_OF_CYCLIC_STRESS-RELAXATION_LOADINGS_DATA_FUSION_FROM_GROUND_TRUTH_NONLINEAR_ACOUSTO-MECHANICAL_TESTING

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338

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Multi-view modeling for MPSoC design aspects [Online resource]Vain, Jüri; Apneet Kaur; Tsiopoulos, Leonidas; Raik, Jaan; Jenihhin, MaksimBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600986

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339

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Mutation analysis for systemC designs at TLMGuarnieri, Valerio; Bombieri, Nicola; Pravadelli, Graziano; Fummi, Franco; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 20112011 / [6] p https://ieeexplore.ieee.org/document/5985925

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340

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Mutations for testing hardware and correcting design errorsHantson, HannoInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 105-108 : ill

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341

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Nanoindentation testing and modeling of chromium carbide based compositesHussainova, Irina; Hamed, Elham; Jasiuk, IwonaMechanics of composite materials2011 / p. 667-678 : ill

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342

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Nanomaterials Al-Al4-C3 studied by "In-situ Tensile Test in SEM"Besterci, Michal; Velgosova, Oksana; Ivan, Jozef; Hvizdoš, Pavol; Kvackaj, Tibor; Kulu, Priit18th International Baltic Conference : Engineering Materials & Tribology : BALTMATTRIB-2009 : October 22-23, 2009, Tallinn, Estonia : abstracts2009 / p. 73

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343

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Narkotestri arendamine narkootikumide tuvastamiseks süljesSaar-Reismaa, Piret; Erme, E.; Kulp, Maria; Gorbatšova, Jelena; Kaljurand, Mihkel; Vaher, Merike; Mazina-Šinkar, JekaterinaXXXIV Eesti keemiapäevad : 100. aastapäeva teaduskonverentsi teesid2019 / lk. 27 https://www.ester.ee/record=b5208044*est

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344

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Natural apeaking and how to assess itPajupuu, Hille; Kerge, Krista; Meister, Lya; Asu, Eva Liina; Alp, PilviTrames2010 / 2, p. 120-140 : ill https://www.researchgate.net/publication/238451077_Natural_speaking_and_how_to_assess_it

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345

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New built-in self-test scheme for SoC interconnectJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanThe 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV2005 / p. 19-24 : ill https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect

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346

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New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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347

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New foreign language text-books as objects of testingRapoport, I.; Petrova, N.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 77

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348

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New method of testability calculation to guide RT-level test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-Johannes4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 20032003 / p. 46-51 : ill https://link.springer.com/article/10.1007/s10836-005-5288-5

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349

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New system of testing pupils' abilities in British schoolsGizatullin, N.; Koptelova, N.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 36-37

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350

book article EST / book article ENG

A new test suite reduction approach based on hypergraph minimal transversal miningTrabelsi, Shaima; Bennani, Mohamed Taha; Ben Yahia, SadokFuture Data and Security Engineering : 6th International Conference, FDSE 2019, Nha Trang City, Vietnam, November 27–29, 2019, Proceedings2019 / p. 15-30 https://doi.org/10.1007/978-3-030-35653-8_2 Conference proceeding at Scopus Article at Scopus Conference proceeding at WOS Article at WOS

book article EST / book article ENG

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