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301
book article
High-level test synthesis with hierarchical test generation
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Raik, Jaan
;
Ubar, Raimund-Johannes
17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings
1999
/
p. 291-296
book article
302
journal article
Hiired laboris : [arvutihiirte testist TTÜ mehaanikateaduskonna laboris]
Urbas, Ando
;
Einama, Kaido
Arvutimaailm
2010
/
11, lk. 40-45 : ill
journal article
303
book article
How to generate high quality tests for digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Kruus, Helena
;
Raik, Jaan
2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 2
2004
/
p. 459-462 : ill
http://dx.doi.org/10.1109/SMICND.2004.1403048
book article
304
book article
How to generate test data for applications using relational databases
Tamme, Risto
Eleventh Estonian Winter School in Computer Science (EWSCS'06) : Park Hotel Palmse, Lahemaa, Estonia : March 5-10, 2006
2006
/
[1] p
book article
305
journal article
Hädavalgustuse automaattestimise näide
Tamm, Tiiu
Elektriala
2015
/
lk. 22-23 : ill
https://artiklid.elnet.ee/record=b2721082*est
journal article
306
book article
A hybrid BIST architecture and its optimization for SoC testing
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Kruus, Helena
Proceedings of the 3rd International Symposium on Quality Electronic Design : ISQED 2002, March 18-21, 2002, San Jose, California
2002
/
p. 273-279 : ill
https://ieeexplore.ieee.org/document/996750
book article
307
journal article
Hybrid BIST methodology for testing core-based systems
Jervan, Gert
;
Ubar, Raimund-Johannes
;
Peng, Zebo
Proceedings of the Estonian Academy of Sciences. Engineering
2006
/
3-2, p. 300-322 : ill
journal article
308
book article
Hybrid BIST optimization for core-based systems with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
DELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : 28-30 January 2004, Perth, Australia : proceedings
2004
/
p. 3-8 : ill
https://ieeexplore.ieee.org/document/1409808
book article
309
book article
Hybrid BIST optimization using reseeding and test set compaction
Jervan, Gert
;
Orasson, Elmet
;
Kruus, Helena
;
Ubar, Raimund-Johannes
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 596-603 : ill
http://dx.doi.org/10.1109/DSD.2007.4341529
book article
310
journal article
Hybrid BIST optimization using reseeding and test set compaction
Jervan, Gert
;
Orasson, Elmet
;
Kruus, Helena
;
Ubar, Raimund-Johannes
Microprocessors and microsystems
2008
/
5/6, p. 254-262 : ill
https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288
journal article
311
book article
Hybrid BIST scheduling for NoC-based SoCs
Jervan, Gert
;
Shchenova, Tatjana
;
Ubar, Raimund-Johannes
Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006
2006
/
p. 141-144 : ill
https://ieeexplore.ieee.org/document/4126966
book article
312
book article
Hybrid BIST time minimization for core-based systems with STUMPS architecture
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 November 2003, Boston, Massachusetts : proceedings
2003
/
p. 225-232 : ill
https://ieeexplore.ieee.org/document/1250116
book article
313
dissertation
Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseks
Orasson, Elmet
2007
https://www.ester.ee/record=b2305436*est
dissertation
314
book
Hybrid built-in self-test and test generation techniques for digital systems
Jervan, Gert
2005
https://www.ester.ee/record=b2177537*est
book
315
book article
Hybrid functional BIST for digital systems
Mazurova, Natalja
;
Smahtina, Julia
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 205-208 : ill
book article
316
book article
Hydraulic conductivity testing method for all-in aggregates and mining waste materials
Šommet, Julija
;
Pastarus, Jüri-Rivaldo
;
Sabanov, Sergei
10th International Symposium "Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 10-15, 2011
2011
/
p. 122-126 : ill
book article
317
book article
HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systems
Ubar, Raimund-Johannes
;
Mazurova, Natalja
;
Smahtina, Julia
;
Orasson, Elmet
;
Raik, Jaan
Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004
2004
/
p. 497-502 : ill
book article
318
journal article
Hygrothermal calculations and laboratory tests on timber-framed wall structures
Kalamees, Targo
;
Vinha, Juha
Building and environment
2003
/
5, p. 689-697 : ill
https://www.sciencedirect.com/science/article/pii/S036013230200207X
journal article
319
book article EST
/
book article ENG
IEEE European Test Symposium (ETS)
Eggersgluss, Stephan
;
Hamdioui, Said
;
Jutman, Artur
;
Michael, Maria K.
;
Raik, Jaan
2019 IEEE International Test Conference (ITC)
2019
/
4 p
https://doi.org/10.1109/ITC44170.2019.9000148
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
320
book article
IEEE P1687 IJTAG demonstrator on FPGA
Shibin, Konstantin
;
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
DATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 2012
2012
/
1 p. : ill
https://www.academia.edu/22101517/IEEE_P1687_IJTAG_demonstrator_on_FPGA
book article
321
book article
IF filter design for satellite TV FM video modulator
Kinks, Priit
;
Laidvee, Andres
;
Taklaja, Andres
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 367-370: ill
book article
322
book article
Impact of small specimens sampling on durability of in-service power plant components
Klevtsov, Ivan
;
Dedov, Andrei
;
Bogoljubova, Elena
Conference Proceedings : 2nd International Conference SSTT : Determination of mechanical properties of materials by small punch and other miniature testing techniques
2012
/
p. 373-378
book article
323
book article
Impact wear tester for the s[t]udy of abrasive erosion and milling processes
Tarbe, Riho
;
Kulu, Priit
Proceedings of the 6th International Conference of DAAAM Baltic "Industrial Engineering" : 24-26th April 2008, Tallinn, Estonia. [2]
2008
/
p. 561-566 : ill
http://innomet.ttu.ee/daaam08/online/Materials%20Engineering/Tarbe-rev.pdf
book article
324
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
325
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
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