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451

book article

New system of testing pupils' abilities in British schoolsGizatullin, N.; Koptelova, N.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 36-37

book article

452

book article EST / book article ENG

A new test suite reduction approach based on hypergraph minimal transversal miningTrabelsi, Shaima; Bennani, Mohamed Taha; Ben Yahia, SadokFuture Data and Security Engineering : 6th International Conference, FDSE 2019, Nha Trang City, Vietnam, November 27–29, 2019, Proceedings2019 / p. 15-30 https://doi.org/10.1007/978-3-030-35653-8_2 Conference proceeding at Scopus Article at Scopus Conference proceeding at WOS Article at WOS

book article EST / book article ENG

453

journal article

A new testability calculation method to guide RTL test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2005 / p. 71-82 : ill https://doi.org/10.1007/s10836-005-5288-5

journal article

454

book article

Noise behavioral model of testing systemBrygilewicz, Volodymyr; Wojciechowski, JacekBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 57-60: ill

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455

book article

A novel artificial neural networks based automatic adaptive fault detection technique for analog circuitsPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 167-170 : ill

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456

book article

NP-hard graph problems' algorithms testing guidelines : artificial intelligence principles and testing as a serviceKumlander, DenissAdvances in computer and information sciences and engineering2008 / p. 114-118 : ill https://link.springer.com/chapter/10.1007/978-1-4020-8739-4_20

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457

book article

NP-hard graph problems' algorithms testing guidlines : artificial intelligence principles and testing as a serviceKumlander, DenissInnovative techniques in instruction technology, e-learning, e-assessment, and education2008 / p. 112-116 https://link.springer.com/chapter/10.1007/978-1-4020-8739-4_20

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458

journal article EST / journal article ENG

A numerical study for plant-independent evaluation of fractional-order PID controller performanceAlagoz, Baris Baykant; Tepljakov, Aleksei; Yeroglu, Celaleddin; Gonzalez, Emmanuel A.; Hossein Nia, S. Hassan; Petlenkov, EduardIFAC-PapersOnLine2018 / p. 539-544 : ill https://doi.org/10.1016/j.ifacol.2018.06.151 Conference proceedings at Scopus Article at Scopus Article at WOS

journal article EST / journal article ENG

459

book article

Off-line testing of crosstalk induced glitch faults in NoC InterconnectsBengtsson, Tomas; Kumar, Shashi; Jutman, Artur; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 221-225 : ill http://dx.doi.org/10.1109/NORCHP.2006.329215

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460

book article

Off-line testing of delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Peng, Zebo; Ubar, Raimund-Johannes9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 677-680 : ill http://dx.doi.org/10.1109/DSD.2006.72

book article

461

book article

On automatic software-based self-test program generation based on high-Level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 177 http://dx.doi.org/10.1109/LATW.2016.7483357

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462

book article

On coverage of timing related faults at board levelJutman, Artur; Aleksejev, Igor; Devadze, Sergei2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings2016 / [2] p. : ill https://doi.org/10.1109/ETS.2016.7519295

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463

book article

On efficient logic-level simulation of digital circuits represented by the SSBDD modelJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 621-624 : ill https://ieeexplore.ieee.org/document/1003334

book article

464

book article

On LFSR polynomial calculation for test time reductionJutman, ArturComputer Science Meets Automation : 10-13 September 2007 : proceedings. Volume II2007 / p. 153-158 : ill https://www.db-thueringen.de/receive/dbt_mods_00008867

book article

465

book article

On mutating UPPAAL timed automata to assess robustness of web servicesSiavashi, Faezeh; Truscan, Dragos; Vain, JüriProceedings of the 11th International Joint Conference on Software Technologies (ICSOFT 2016). Vol. 1, ICSOFT-EA2016 / p. 15-26 : ill http://dx.doi.org/10.5220/0005970800150026

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466

book article

On reusability of verification assertions for testingJenihhin, Maksim; Raik, JaanInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 43-46 : ill

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467

book article

On reusability of verification assertions for testingJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Tšepurov, AntonBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 151-154 : ill

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468

book article EST / book article ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

469

book article EST / book article ENG

On testing microservice systemsKoschel, Arne; Astrova, Irina; Bartels, Mirco; Helmers, Mark; Lyko, MarcelProceedings of the Future Technologies Conference (FTC) 2020 ; vol. 32021 / p. 597–609 https://doi.org/10.1007/978-3-030-63092-8_40 Conference Proceedings at Scopus Article at Scopus

book article EST / book article ENG

470

book article

On the combined use of HLDDs and EFSMs for functional ATPGDi Guglielmo, Giuseppe; Fummi, Franco; Jenihhin, Maksim; Pravadelli, Graziano; Raik, Jaan; Ubar, Raimund-Johannes5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia2007 / p. 503-508 : ill

book article

471

journal article

On the reuse of TLM mutation analysis at RTLGuarnieri, Valerio; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2012 / p. 435-448 : ill https://link.springer.com/article/10.1007/s10836-012-5303-6

journal article

472

book article

On using genetic algorithm for test generationBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 233-236 : ill

book article

473

book article

Online testing of nondeterministic systems with the reactive planning testerVain, Jüri; Kääramees, Marko; Markvardt, MailiDependability and computer engineering : concepts for software-intensive systems2012 / p. 113-150 : ill https://www.igi-global.com/chapter/online-testing-nondeterministic-systems-reactive/55327

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474

book article EST / book article ENG

On-site detection and quantification of selected semi-synthetic and natural cannabinoids in cannabis products using capillary electrophoresis - deep UV fluorescenceLoog, Saari Anete; Gorbatšova, Jelena; Remmelg, Karoliin; Kuhtinskaja, Maria; Mazina-Šinkar, JekaterinaOpen Readings 2026 : The 69th International Conference for Students of Physics and Natural Sciences : Book of Abstracts2026 / p. 86 https://openreadings.eu/archive/2026/pdf/

book article EST / book article ENG

475

dissertation

Optical detection methods for droplet microfluidic applications = Optilised tuvastusmeetodid tilkade mikrofluidiliste rakenduste jaoksPärnamets, Kaiser2023 https://doi.org/10.23658/taltech.31/2023 https://digikogu.taltech.ee/et/Item/ffb85150-fb85-4a7c-b130-0d7f2c3b7fb5 https://www.ester.ee/record=b5569973*est

dissertation

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