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476
book article
"Tervis ruudus", ehk, Tippkeskuse CEBE lugu
Ubar, Raimund-Johannes
Teadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]
2019
/
lk. 200-215 : ill., fot
https://www.ester.ee/record=b5208765*est
book article
477
book article
Test cost minimization for hybrid BIST
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
2000
/
p. 283-298 : ill
https://ieeexplore.ieee.org/abstract/document/887168
book article
478
book article
Test development and deployment tool-set for mixed-signal and digital devices
Mellik, Andres
;
Raik, Jaan
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 163-166 : ill
book article
479
book article
Test driven domain modelling
Piho, Gunnar
;
Tepandi, Jaak
;
Parman, Marko
;
Puusep, Viljam
;
Roost, Mart
MIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings
2011
/
p. 576-581
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5967121
book article
480
book article
Test generation for control faults in digital systems
Dušina, Julia
;
Brik, Marina
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 325-330: ill
book article
481
book article
Test generation for digital systems
Ubar, Raimund-Johannes
Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy
1983
/
p. 374-377
book article
482
book article
Test generation for digital systems at functional level
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
;
Peng, Z.
Research report LiTH-IDA-R-90-06, Linköping University, Sweden
1990
/
p. 1-21
book article
483
book article
Test generation for microprocessor control mechanisms
Lohuaru, Tõnu
;
Ubar, Raimund-Johannes
FTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)
1987
/
p. 305-311
book article
484
book article
Test generation for microprocessors on alternative graphs
Alango, Villem
;
Kont, Toomas
;
Ubar, Raimund-Johannes
33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik
1988
/
p. 11-14
book article
485
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
486
book article
Test method for determining radiation absorptivity and emissivity coefficients of ACSR conductors
Kiitam, Ivar
18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]
2019
/
p. 185-186 : ill
https://www.ester.ee/record=b5183874*est
book article
487
journal article
Test method for the total content of non-volatile phenols in wastewater
Johannes, Ille
;
Mölder, Leevi
;
Tiikma, Laine
Oil shale
1998
/
3, p. 232-238
journal article
488
dissertation
Test program generation for microprocessor systems
Dušina, Julia
1993
https://www.ester.ee/record=b2090526*est
dissertation
489
book article
Test scenario generator learning for model-based testing of mobile robots
Kanter, Gert
;
Liibert, Marti Ingmar
System assurances : modeling and management
2022
/
p. 67-84
https://doi.org/10.1016/B978-0-323-90240-3.00005-9
book article
490
journal article EST
/
journal article ENG
Test scenario specification language for model-based testing
Halling, Evelin
;
Vain, Jüri
;
Boyarchuk, Artem
;
Illiashenko, Oleg
International Journal of Computing
2019
/
p. 408-421 : ill
http://www.computingonline.net/computing/article/view/1611
https://doi.org/10.47839/ijc.18.4.1611
Journal metrics at Scopus
Article at Scopus
journal article EST
/
journal article ENG
491
journal article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Journal of computer science and technology
2006
/
6, p. 907-912 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
journal article
492
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
book article
493
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf
book article
494
book article
Testability analysis of digital design verification
Hahanov, V.
;
Kaminska, M.
;
Fomina, Jelena
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 171-174 : ill
book article
495
book article
Testentwurf für digitale Geräte mit Hilfe der Alternativgraphen
Voolaine, Andrus
;
Pall, Martin
;
Plakk, Mari
Fehler in Automaten
1989
/
S. 31-44 : Ill
book article
496
book article
Tester partitioning and synchronization algorithm for testing real-time distributed systems
Pal, Deepak
;
Vain, Jüri
Proceedings of the 10th Junior Researcher Workshop on Real-Time Computing : JRWRTC 2016 : Brest, France, October 19-21, 2016
2016
/
p. 13-16 : ill
http://jrwrtc2016.gforge.inria.fr/
book article
497
book article
Testieren der kommunikativen Sprachkompetenz
Serwuta, A.
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 92-94
book article
498
book article
Testing as a means of consolidation of students' knowledge
Shaymardanova, Sh.Kh.
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 94-95
book article
499
book article
Testing beyond the SoCs in a lego style
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010
2010
/
p. 334-338 : ill
https://ieeexplore.ieee.org/document/5742052
book article
500
book article
Testing different power system out-of-step detection algorithms
Tealane, Marko
18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]
2019
/
p. 199-200 : ill
https://www.ester.ee/record=b5183874*est
book article
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