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26
book article
Determination of leakage inductances of three-winding transformer for HF-PSA resonant circuit
Šklovski, Jevgeni
;
Janson, Kuno
;
Niilo, Helar
11th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 16-21, 2012
2012
/
p. 113-116 : ill
book article
27
journal article EST
/
journal article ENG
A dual-buck-boost DC–DC/AC universal converter
Ong, Yao Rong
;
Cao, Shuyu
;
Lee, Sze Sing
;
Lim, Chee Shen
;
Chen, Max M.
;
Vosoughi Kurdkandi, Naser
;
Barzegarkhoo, Reza
;
Siwakoti, Yam P.
Electronics (Switzerland)
2022
/
art. 1973
https://doi.org/10.3390/electronics11131973
Journal metrics at scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
28
book
Electrical and control engineering
Kalm, Evald
1990
https://www.ester.ee/record=b1233571*est
book
29
book
Electrical engineering and automatics
Kull, Arvo
;
Kiitam, Andres
;
Bachverk, Aleksander
;
Kängsep, Eiko
;
Jõers, Rein
;
Peterson, Jaak
;
Toomet, Madis
1989
https://www.ester.ee/record=b1212924*est
book
30
journal article
Elektrist, energiast ja füüsikast üldiselt
Kalda, Jaan
Elektriala
2019
/
lk. 26-27 : ill
http://www.ester.ee/record=b1240496*est
journal article
31
book article
Evaluation of dual-active bridge converter for DC energy buildings
Carvalho da Silva, Edivan Laercio
;
Blinov, Andrei
;
Sidorova, Aleksandra
;
Chub, Andrii
;
Vinnikov, Dmitri
2023 IEEE 17th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)
2023
/
6 p
https://doi.org/10.1109/CPE-POWERENG58103.2023.10227460
book article
32
journal article
Evaluation of equivalent cirquit diagrams and transfer functions for modeling of lithium-ion batteries
Rahmoun, Ahmad
;
Biechl, Helmuth
;
Rosin, Argo
Scientific Journal of Riga Technical University. Electrical, control and communication engineering
2013
/
p. 34-39 : ill
journal article
33
book article
Exact static compaction of independent test sequences
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 315-318 : ill
book article
34
book article
Fast static compaction of tests composed of independent sequences : basic properties and comparison of methods
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II
2002
/
p. 445-448 : ill
http://dx.doi.org/10.1109/ICECS.2002.1046190
https://ieeexplore.ieee.org/document/1046190
book article
35
journal article
Fast test pattern generation for sequential circuits using decision diagram representations
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2000
/
3, p. 213-226 : ill
https://link.springer.com/article/10.1023/A:1008335130158
journal article
36
book article
Fault oriented test pattern generation for sequential circuits using genetic algorithms
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 319-320
book article
37
book
Fourier' rida : metoodiline juhend raadiotehiliste ahelate ja signaalide laboratoorse töö sooritamiseks
1984
https://www.ester.ee/record=b1245512*est
book
38
book article
Fractional order model identification of receptor-ligand complexes formation by equivalent electrical circuit modeling
Ates, Abdullah
;
Alagoz, Baris Baykant
;
Tepljakov, Aleksei
;
Petlenkov, Eduard
2019 International Artificial Intelligence and Data Processing Symposium (IDAP)
2019
/
5 p. : ill
https://doi.org/10.1109/IDAP.2019.8875913
book article
39
book article
Greedy alternative for the static compaction of sequential circuit test sequences
Raik, Jaan
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 133-136 : ill
book article
40
book article
Heartwork analysis using bioimpedance method
Gordon, Rauno
Telekommunikatsioon 2002 : IX rahvusvahelise telekommunikatsioonipäeva materjalid
2002
/
lk. 8-14 : ill
book article
41
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 151-156
https://ieeexplore.ieee.org/document/873781
book article
42
journal article
Hierarchical physical defect reasoning in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Brik, Marina
Estonian journal of engineering
2011
/
3, p. 185-200
journal article
43
journal article
Hierarchical test generation for combinational circuits with real defects coverage
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2002
/
p. 1141-1149 : ill
https://www.sciencedirect.com/science/article/pii/S002627140200080X
journal article
44
book article
Hierarchical timing-critical paths analysis in sequential circuits
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
;
Devadze, Sergei
;
Kostin, Sergei
2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain
2018
/
6 p. : ill
https://doi.org/10.1109/PATMOS.2018.8464176
book article
45
book article
High voltage circuit breaker charging motor’s condition monitoring - importance, possibilities, and challenges
Asad, Bilal
;
Sardar, Muhammad Usman
;
Vaimann, Toomas
;
Kallaste, Ants
;
Asefi, Sajjad
;
Kilter, Jako
2024 International Conference on Diagnostics in Electrical Engineering (Diagnostika)
2024
/
7 p
https://doi.org/10.1109/Diagnostika61830.2024.10693906
book article
46
book article
Homological modelling of the electric circuits
Paal, Eugen
;
Umbleja, Märt
Moduli Operads Dynamics II
2014
book article
47
book article
How to prove that a circuit is fault-free?
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey
2012
/
p. 427-430 : ill
https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free
book article
48
book article
Identifying NBTI-critical paths in nanoscale logic
Ubar, Raimund-Johannes
;
Vargas, Fabian
;
Jenihhin, Maksim
;
Raik, Jaan
;
Kostin, Sergei
;
Bolzani Poehls, Leticia
16th Euromicro Conference series on Digital System Design : DSD 2013 : proceedings : 4-6 September 2013, Santander, Spain
2013
/
p. 136-141 : ill
book article
49
book article
Impedance network impact on the controller design of the QZSI for PV applications
Liu, Wenjie
;
Yang, Yongheng
;
Kerekes, Tamas
;
Liivik, Elizaveta
;
Blaabjerg, Frede
2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL), Aalborg, Denmark, November 9-12, 2020
2020
/
6 p
https://doi.org/10.1109/COMPEL49091.2020.9265708
book article
50
journal article EST
/
journal article ENG
Improved fractional open circuit voltage MPPT methods for PV systems
Baimel, Dmitry
;
Tapuchi, Saad
;
Levron, Yoash
;
Belikov, Juri
Electronics
2019
/
art. 321
https://doi.org/10.3390/electronics8030321
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Number of records 138, displaying
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