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Jutman, Artur 1976
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1
book article
A new evolutionary-technique-based approach to optimize pseudo-random TPG for logic BIST
Jutman, Artur
;
Aleksejev, Jevgeni
;
Ubar, Raimund-Johannes
MEET/MARIND'2002 : proceedings of First International Congress on Mechanical and Electrical Engineering and Technology and Fourth International Conference on Marine Industry, 07-11 October 2002, Varna Bulgaria. Volume 1
2002
/
p. 247-252 : ill
book article
2
book article
A scalable static test set compaction method for sequential circuits
Aleksejev, Igor
;
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 87-92 : ill
book article
3
book article
A system for teaching basic and advanced topics of IEEE 1149.1 boundary scan standard (extended abstract)
Jutman, Artur
;
Rosin, Vjatšeslav
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Proceedings of 16th EAEEIE Conference on Innovation in Education for Electrical and Information Engineering (EIE) : Lappeenranta, Finland, 6th-8th June 2005
2005
/
[2] p. : ill
book article
4
book article
A tool for advanced learning of LFSR-based testing principles
Jutman, Artur
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 175-178 : ill
book article
5
book article
A tool for teaching pseudo-random TPG principles
Jutman, Artur
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
Proceedings of the 17th EAEEIE Annual Conference on Innovation in Education for Electrical and Information Engineering : Craiova, Romania, June 1st-3rd, 2006
2006
/
p. 182-187 : ill
book article
6
book article
An educational environment for digital testing : hardware, tools, and web-based runtime platform
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Vislogubov, Vladislav
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 412-419 : ill
https://www.researchgate.net/profile/Artur-Jutman/publication/220880167_An_Educational_Environment_for_Digital_Testing_Hardware_Tools_and_Web-Based_Runtime_Platform/links/02e7e53c3c71b0b2a7000000/An-Educational-Environment-for-Digital-Testing-Hardware-Tools-and-Web-Based-Runtime-Platform.pdf
book article
7
book article
Analysis of a test method for delay faults in NoC interconnects
Bengtsson, Tomas
;
Jutman, Artur
;
Kumar, Shashi
;
Ubar, Raimund-Johannes
;
Peng, Zebo
Proceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 2006
2006
/
p. 42-46 : ill
book article
8
book article
Applets for learning digital design and test [Electronic resource]
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Kruus, Margus
;
Wuttke, Heinz-Dietrich
1st International Conference on Interactive Mobile and Computer Aided Learning (IMCL2006) : Amman, Jordan, April 19-21, 2006
2006
/
p. 1-4 : ill. [CD-ROM]
book article
9
book article
Application of sequential test set compaction to LFSR reseeding
Aleksejev, Igor
;
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings
2008
/
p. 102-107 : ill
http://dx.doi.org/10.1109/NORCHP.2008.4738292
book article
10
journal article
Application of structurally synthesized binary decision diagrams for timing simulation of digital circuits
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings of the Estonian Academy of Sciences. Engineering
2001
/
4, p. 269-288 : ill
journal article
11
book article
Assessment of student's design results in e-learning-scenarios [Electronic resource]
Wuttke, Heinz-Dietrich
;
Ubar, Raimund-Johannes
;
Henke, Karsten
;
Jutman, Artur
8th International Conference on Technology Based Higher Education and Training : 10th to 13th July, 2007, KKR Hotel Kumamoto, Kumamoto, Japan : [proceedings]
2007
/
[6] p. [CD-ROM]
book article
12
book article
Asynchronous e-learning resources for hardware design issues
Jutman, Artur
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Proceedings of the International Conference on Computer Systems and Technologies (e-learning) : CompSysTech'04 : Rousse, Bulgaria, 17-18 June
2004
/
p. IV.11-1 - IV.11-6 : ill
https://www.researchgate.net/publication/234797327_Asynchronous_e-learning_resources_for_hardware_design_issues
book article
13
book article
Asynchronous fault detection in IEEE P1687 instrument network
Shibin, Konstantin
;
Devadze, Sergei
;
Jutman, Artur
IEEE 23rd North Atlantic Test Workshop : 14-16 May 2014, Binghampton, New York : proceedings
2014
/
p. 73-78 : ill
book article
14
book article
At-speed on-chip diagnosis of board-level interconnect faults
Jutman, Artur
Ninth IEEE European Test Symposium : ETS 2004 : 23-26 May 2004, Corsica, France : proceedings
2004
/
p. 2-7 : ill
https://www.researchgate.net/publication/4098807_At-speed_on-chip_diagnosis_of_board-level_interconnect_faults
book article
15
book article
Automatic SoC level test path synthesis based on partial functional models
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
2011 Asian Test Symposium (ATS) : New Delhi, India
2011
/
p. 532-538
https://ieeexplore.ieee.org/document/6114730
book article
16
book article
Automation of testing beyond the SoCs
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
lk. 29-32 : ill
book article
17
book article
BASTION : board and SoC test instrumentation for ageing and no failure found
Jutman, Artur
;
Lotz, Christophe
;
Larsson, Erik
;
Sonza Reorda, Matteo
;
Jenihhin, Maksim
;
Raik, Jaan
Proceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland
2017
/
p. 115-120 : ill
https://doi.org/10.23919/DATE.2017.7926968
book article
18
book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
19
book article
Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
;
Wuttke, Heinz-Dietrich
International Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal
2007
/
[7] p. : ill. [CD-ROM]
http://icee2007.dei.uc.pt/proceedings/papers/429.pdf
book article
20
book article
Calculation of LFSR seed and polynomial pair for BIST applications
Jutman, Artur
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 105-108 : ill
book article
21
book article
Calculation of LFSR seed and polynomial pair for BIST applications [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008
2008
/
p. 275-279 : ill. [CD-ROM]
book article
22
book article
CMOS defects analysis using DefSim measurement environment
Pleskacz, Witold A.
;
Borejko, Tomasz
;
Walkanis, A.
;
Stopjakova, Viera
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Informal Digest of Papers : Eleventh IEEE European Test Symposium : ETS 2006 : 21-24 May 2006, Southampton, United Kingdom
2006
/
p. 241-246 : ill
book article
23
book
CMS drift tubes sector collector relocation phase 1 upgrade [Electronic resource]
Bedoya, C. F.
;
Jutman, Artur
;
Shibin, Konstantin
;
Devadze, Sergei
2015
http://cms.cern.ch/iCMS/jsp/openfile.jsp?type=DN&year=2015&files=DN2015_011.pdf
book
24
book article
DefSim - the defective IC
Pleskacz, Witold A.
;
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
DATE 2007 : Design Automation and Test in Europe : Nice, France, April 16-20, 2007
2007
/
p. s96 (2 p.)
book article
25
journal article
DefSim: a remote laboratory for studying physical defects in CMOS digital circuits
Pleskacz, Witold A.
;
Stopjakova, Viera
;
Borejko, Tomasz
;
Jutman, Artur
;
Walkanis, Andrzej
IEEE transactions on industrial electronics
2008
/
6, p. 2405-2415 : ill
https://www.researchgate.net/publication/3219964_DefSim_A_Remote_Laboratory_for_Studying_Physical_Defects_in_CMOS_Digital_Circuits
journal article
Number of records 159, displaying
1 - 25
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32
1.
Jutman, Artur
2.
Jutman, Valentin
3.
Abdullin, Artur
4.
Abels, Artur
5.
Adson, Artur
6.
Alliksaar, Artur
7.
Binczewski, Artur
8.
Dahlberg, Artur
9.
Hain, Artur
10.
Izumrudov, Artur
11.
Jugaste, Artur
12.
Jõgi, Artur
13.
Jürvetson, Artur
14.
Keller, Artur
15.
Kivikas, Artur
16.
Klauson, Artur
17.
Lavrov, Artur
18.
Leetberg, Artur
19.
Liefländer, Artur
20.
Linari-Linholm, Artur
21.
Lobov, Artur
22.
Luha, Artur Heinrich
23.
Mägi, Artur
24.
Nilson, Artur
25.
Noole, Artur
26.
Puksov, Artur
27.
Rieger, Artur
28.
Ruszczak, Artur
29.
Rätsep, Artur
30.
Talvik, Artur
31.
Toikka, Artur
32.
Tooman, Artur
CV
24
1.
Jutman, Artur 1976
2.
Jutman, Valentin 1938
3.
Georgin, Artur 1891-1954
4.
Hain, Artur 1925-2011
5.
Jõgi, Artur 1978
6.
Klauson, Artur 1995
7.
Laksberg, Artur 1975
8.
Leetberg, Artur 1886-1969
9.
Leetna, Karl Artur
10.
Liefländer, Artur
11.
Linari-Linholm, Artur A. 1903-1983
12.
Linari-Linholm, Artur Aleksander
13.
Luha, Artur Heinrich 1892-1953
14.
Luhha, Artur Heinrich
15.
Mitsulis, Artur 1981
16.
Mitšulis, Artur
17.
Noole, Artur 1985
18.
Perna, Artur (-1939)
19.
Perna, Artur 1881-1940
20.
Pihlak, Artur Aleksander 1885-1941
21.
Pärna, Artur 1915-1943
22.
Sagarov, Artur
23.
Toikka, Artur 1998
24.
Šagarov, Artur
name of the person
21
1.
Jutman, Artur
2.
Andersalu, Artur
3.
Georgin, Artur Mihkel, 1891-1954
4.
Hain, Artur
5.
Lavrov, Artur
6.
Lessner, Artur
7.
Linari-Linholm, Artur, 1903-1983
8.
Lind, Artur
9.
Lind, Artur, 1927-1989
10.
Luha, Artur Heinrich, 1892-1953
11.
Mihhailov, Artur
12.
Noole, Artur
13.
Ojasalu, Artur
14.
Perna, Artur, 1881-1940
15.
Pihlak, Artur-Aleksander, 1885-1941
16.
Prees, Artur
17.
Pärna, Artur
18.
Saaliste, Artur
19.
Sagarov, Artur
20.
Talvik, Artur, 1964-
21.
Vassar, Artur, 1911-1977
subject term
1
1.
Artur Uin ja Ko, veinitööstus
TTÜ subject term
1
1.
Perna, Artur, 1881-1940
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