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151
book article
Synthesis of high-level decision diagrams for functional test pattern generation
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Karputkin, Anton
;
Tombak, Mati
Proceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 2009
2009
/
p. 519-524 : ill
book article
152
book article
Synthesis of testable FSM through decomposition
Devadze, Sergei
;
Sudnitsõn, Aleksander
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 101-104 : ill
book article
153
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
154
book article
Teaching diagnostic modeling of digital systems with decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Mironov, Dmitri
;
Evartson, Teet
;
Orasson, Elmet
;
Aarna, Margit
;
Wuttke, Heinz-Dietrich
Proceedings of 12th IASTED International Conference on Computers and Advanced Technology in Education - CATE 2009 : St.Thomas, US, November 22-24, 2009
2009
/
p. 1-6. [CD-ROM]
book article
155
book article
Teaching research in the laboratory using diagnosis environment for digital systems
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Aarna, Margit
;
Brik, Marina
;
Wuttke, Heinz-Dietrich
2009 EAEEIE annual conference : 20th Annual Conference of the European Association for Education in Electrical and Information Engineering : Valencia, Spain, June 22-24, 2009
2009
/
p. 280-283
https://ieeexplore.ieee.org/document/5335462
book article
156
journal article
Tehissüsteemide veakindlusest : [TTÜ arvutitehnika instituudi teadustöödest]
Ubar, Raimund-Johannes
Horisont
2006
/
2, lk. 64-69 : ill
https://artiklid.elnet.ee/record=b2039558*est
journal article
157
book
Tehted digitaalseadmeis : õppeabimaterjal
Ariste, Andri
1976
https://www.ester.ee/record=b1292367*est
book
158
book article
Test generation for control faults in digital systems
Dušina, Julia
;
Brik, Marina
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 325-330: ill
book article
159
book article
Test generation for digital systems
Ubar, Raimund-Johannes
Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy
1983
/
p. 374-377
book article
160
book article
Test generation for digital systems at functional level
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
;
Peng, Z.
Research report LiTH-IDA-R-90-06, Linköping University, Sweden
1990
/
p. 1-21
book article
161
book article
Test generation for digital systems based on alternative graphs
Ubar, Raimund-Johannes
Dependable Computing - EDCC-1 : First European Dependable Computing Conference, Berlin, Germany, October 1994 : proceedings
1994
/
p. 151-164: ill
book article
162
book article
Testability analysis of digital design verification
Hahanov, V.
;
Kaminska, M.
;
Fomina, Jelena
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 171-174 : ill
book article
163
book article
The current state of voice over Internet protocol in wireless mesh networks
Meeran, Mohammad Tariq
;
Annus, Paul
;
Le Moullec, Yannick
2016 International Conference on Advances in Computing, Communications and Informatics (ICACCI) : September 21-24, 2016, The LNM Institute of Information Technology (LNMIT), Jaipur, India
2016
/
p. 2567-2575 : ill
https://doi.org/10.1109/ICACCI.2016.7732444
book article
164
book article
The dildis-project-using applets for more demonstrative lectures in digital systems design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Proceedings of the 31st ASEE/IEEE Frontiers in Educations Conference : FIE'2001 : Reno, Nevada
2001
/
p. SIE-2-7
https://ieeexplore.ieee.org/document/963996
book article
165
book article
The dildis-project-using applets for more demonstrative lectures in digital systems design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
FIE 2001 : 31st Annual Frontiers in Educations Conference : Impact on Engineering and Science Education : Reno, Nevada, October 10-13, 2001 : conference program
2001
/
p. 83
https://ieeexplore.ieee.org/document/963996
book article
166
book
The increasing role of digital technologies in co-production [Online resource]
Lember, Veiko
2017
http://technologygovernance.eu/files/main//2017090403424444.pdf
book
167
book article
A tool for random test generation targeting high diagnostic resolution
Osimiry, Emmanuel Ovie
;
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
2016
/
p. 79-82 : ill
http://www.ester.ee/record=b2150914*est
book article
168
book article
True path tracing in structurally synthesized BDDs for testability analysis of digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
Euromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings
2019
/
p. 492-499 : ill
https://doi.org/10.1109/DSD.2019.00077
book article
169
book article
TTBist: a DfT tool for enhancing functional test for SoC
Hermann, K.
;
Raik, Jaan
;
Jenihhin, Maksim
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 191-194 : ill
book article
170
book article
Using simulation statistics for bug localization in RTL designs
Tihhomirov, Valentin
;
Jenihhin, Maksim
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 107-110 : ill
book article
171
book article
Using test pattern generation tool decider in hardware verification
Viilukas, Taavi
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 166-169 : ill
book article
172
book article
Uued meetodid digitaalsüsteemide disaini ja diagnostika valdkonnas : kommentaar Eesti Vabariigi teaduse aastapreemia pälvinud tööle
Ubar, Raimund-Johannes
Tallinna Tehnikaülikooli aastaraamat 1998
1999
/
lk. 142-145
book article
173
book article
Web-based software implementation of finite state machine decomposition for design and education
Devadze, Sergei
;
Kruus, Margus
;
Sudnitsõn, Aleksander
CompSysTech' 2001 : proceedings of the International Conference on Computer Systems and Technologies, Sofia, 21-22 June 2001
2001
/
[6] p. : ill
https://pld.ttu.ee/decomposition/publications/Sudnitson_CST_Estonia.pdf
book article
174
book article
Web-based tool for FSM encoding targeting low-power FPGA implementation
Mihhailov, Dmitri
;
Sudnitsõn, Aleksander
;
Tarletski, Konstantin
2010 27th International Conference on Microelectronics : MIEL 2010 : Niš, Serbia, 16-19 May 2010 : proceedings
2010
/
p. 349-352
https://ieeexplore.ieee.org/document/5490468
book article
175
book article
Web-based training system for teaching digital design and test
Devadze, Sergei
7th International Student Conference on Electrical Engineering : POSTER2003 : May 22, 2003, Prague, Czech Republic
2003
/
p. IC6
book article
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