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High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test (title)
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book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
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keyword
17
1.
high-level functional fault model
2.
implementation-independent test generation
3.
test generation and fault diagnosis
4.
RISC processors
5.
RISC-V processors
6.
high-level control fault model
7.
high-level fault coverage
8.
high-level fault model
9.
high-level fault simulation
10.
high-level synthesis for test
11.
high-level test data generation
12.
Implementation-Independent Testing of Microprocessors
13.
logic level and high level BDDs
14.
automatic fault diagnosis
15.
bearing fault diagnosis
16.
fault detection and diagnosis
17.
fault diagnosis
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