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book article

An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan2006 / p. 437-442 : ill http://dx.doi.org/10.1109/ATS.2006.23

book article

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book article

An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-Johannes2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium2011 / p. 185-190 : ill

book article

3

book article

DfT for application of external test patterns in a Network-on-a-ChipGovind, Vineeth; Raik, Jaan; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 25-28 : ill

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dissertation

DfT-based external test and diagnosis of mesh-like networks on chips = Testitavusel põhinev välise testi ja diagnoosi meetod kahemõõtmelistele kiipvõrkudeleGovind, Vineeth2009 https://digi.lib.ttu.ee/i/?454 https://www.ester.ee/record=b2539211*est

dissertation

5

book article

Extended checkers for logic-based distributed routing in network-on-chipsNiazmand, Behrad; Hariharan, Ranganathan; Govind, Vineeth; Jervan, Gert; Hollstein, Thomas; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 83-86 : ill

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6

book article

Extended checkers for logic-based distributed routing in network-on-chipsNiazmand, Behrad; Hariharan, Ranganathan; Govind, Vineeth; Jervan, Gert; Hollstein, Thomas; Raik, JaanBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 77-80 : ill

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7

book article

A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routersSaltarelli, Pietro; Niazmand, Behrad; Raik, Jaan; Govind, Vineeth; Hollstein, Thomas; Jervan, Gert; Hariharan, RanganathanNOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 20152015 / [8] p. : ill http://dx.doi.org/10.1145/2786572.2788713

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journal article

Kuidas testida arvutivõrku ränikiibilRaik, Jaan; Govind, VineethA & A2010 / 4, lk. 35-37 https://artiklid.elnet.ee/record=b2286479*est

journal article

9

book article

Low-area boundary BIST architecture for mesh-like network-on-chipRaik, Jaan; Govind, VineethProceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 / p. 95-100 : ill

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newspaper article

Tenniseharrastus Tallinna tehnikaülikoolis. Tennis on au sees : [kommenteerivad Tauno Otto ja Viveeth Govind]Sulling, Andres; Otto, Tauno; Govind, VineethMente et Manu2013 / lk. 26-27 : fot

newspaper article

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book article

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, VineethInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 33-37 : ill

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book article

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

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book article

Ultra-low latency NoC testing via pseudo-random test pattern compactionTatenguem, Herve; Govind, Vineeth; Raik, JaanSoC 2012 : International Symposium on System-on-Chip 2012 : Tampere, Finland, October 11-12, 20122012 / 6 p. : ill https://ieeexplore.ieee.org/document/6376370

book article

Govind, Vineeth (TTÜ author)

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