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Govind, Vineeth (author)
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1
book article
An external test approach for network-on-a-chip switches
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
ATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan
2006
/
p. 437-442 : ill
http://dx.doi.org/10.1109/ATS.2006.23
book article
2
book article
An external test approach for network-on-a-chip switches
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium
2011
/
p. 185-190 : ill
book article
3
journal article
Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chips
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IET computers and digital techniques
2009
/
5, p. 476-486 : ill
http://dx.doi.org/10.1049/iet-cdt.2008.0096
journal article
4
book article
Design-for-testability for application of external test patterns in a NoC
Govind, Vineeth
;
Raik, Jaan
2nd Workshop on Diagnostic Services in Network-on-Chips - Test, Debug, and On-Line Monitoring, in conjunction with Design Automation Conference (DAC)
2008
/
[4] p
book article
5
book article
DfT for application of external test patterns in a Network-on-a-Chip
Govind, Vineeth
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 25-28 : ill
book article
6
dissertation
DfT-based external test and diagnosis of mesh-like networks on chips = Testitavusel põhinev välise testi ja diagnoosi meetod kahemõõtmelistele kiipvõrkudele
Govind, Vineeth
2009
https://digi.lib.ttu.ee/i/?454
https://www.ester.ee/record=b2539211*est
dissertation
7
book article
Extended checkers for logic-based distributed routing in network-on-chips
Niazmand, Behrad
;
Hariharan, Ranganathan
;
Govind, Vineeth
;
Jervan, Gert
;
Hollstein, Thomas
;
Raik, Jaan
Proceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere
2014
/
p. 83-86 : ill
book article
8
book article
Extended checkers for logic-based distributed routing in network-on-chips
Niazmand, Behrad
;
Hariharan, Ranganathan
;
Govind, Vineeth
;
Jervan, Gert
;
Hollstein, Thomas
;
Raik, Jaan
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
2014
/
p. 77-80 : ill
book article
9
book article
An external diagnosis method for network-on-a-chip
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France
2007
/
[2] p. : ill
book article
10
book article
A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routers
Saltarelli, Pietro
;
Niazmand, Behrad
;
Raik, Jaan
;
Govind, Vineeth
;
Hollstein, Thomas
;
Jervan, Gert
;
Hariharan, Ranganathan
NOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 2015
2015
/
[8] p. : ill
http://dx.doi.org/10.1145/2786572.2788713
book article
11
book article
A generic synthesizable NoC switch with a scalable testbench
Govind, Vineeth
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 91-94 : ill
book article
12
journal article
Kuidas testida arvutivõrku ränikiibil
Raik, Jaan
;
Govind, Vineeth
A & A
2010
/
4, lk. 35-37
https://artiklid.elnet.ee/record=b2286479*est
journal article
13
book article
Low-area boundary BIST architecture for mesh-like network-on-chip
Raik, Jaan
;
Govind, Vineeth
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
/
p. 95-100 : ill
book article
14
book article
RT-level test point insertion for sequential circuits
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings
2004
/
p. 34-40 : ill
https://ieeexplore.ieee.org/document/1428412
book article
15
newspaper article
Tenniseharrastus Tallinna tehnikaülikoolis. Tennis on au sees : [kommenteerivad Tauno Otto ja Viveeth Govind]
Sulling, Andres
;
Otto, Tauno
;
Govind, Vineeth
Mente et Manu
2013
/
lk. 26-27 : fot
newspaper article
16
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 33-37 : ill
book article
17
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
2007
/
p. 29-34 : ill
http://dx.doi.org/10.1109/ETS.2007.41
book article
18
book article
Ultra-low latency NoC testing via pseudo-random test pattern compaction
Tatenguem, Herve
;
Govind, Vineeth
;
Raik, Jaan
SoC 2012 : International Symposium on System-on-Chip 2012 : Tampere, Finland, October 11-12, 2012
2012
/
6 p. : ill
https://ieeexplore.ieee.org/document/6376370
book article
Number of records 18, displaying
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3
1.
Govind, Vineeth
2.
Leo, Vincent Vineeth
3.
Govind, Madhav
CV
1
1.
Govind, Vineeth 1979
name of the person
1
1.
Govind, Viveeth
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