Searching - TalTech Research Portal

display

sort

76

journal article

Orgaaniline mikroprotsessorToomsalu, ArvoA & A2011 / lk. 18-21 : ill

journal article

77

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

78

book

Personaalarvutid mikroprotsessoril 80486. Sise- ja välisseadmete liidesed, matemaatikaprotsessorid, jõudlustestidToomsalu, Arvo1992 https://www.ester.ee/record=b1064225*est

book

79

book article

PIC microcontroller learning systemJalakas, Tanel; Möller, Taavi; Roasto, Indrek3rd International Symposium "Topical Problems of Education in the Field of Electrical and Power Engineering" : Doctoral School of Energy and Geotechnology : Kuressaare, Estonia, January 16-21, 20062006 / p. 99-101 : ill

book article

80

journal article

PingviiniprotsessorTammemäe, KalleA & A1999 / 6, lk. 8-11 https://artiklid.elnet.ee/record=b1002707*est

journal article

81

journal article

Post-RISC-arhitektuurToomsalu, ArvoA & A2001 / 2, lk. 8-14 ; 3, lk. 7-16 https://artiklid.elnet.ee/record=b1006602*est

journal article

82

book article

Power-performance trade-offs in second level memory used by an ARM-like Risc architecturePuttaswamy, Kiran; Ellervee, PeeterPower aware computing2002 / ? p. [chapter 11] https://link.springer.com/chapter/10.1007/978-1-4757-6217-4_11

book article

83

book article EST / book article ENG

PrefaceHollstein, Thomas; Raik, Jaan; Kostin, Sergei; Tšertov, Anton; O’Connor, Ian; Reis, RicardoVLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability, 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016 : Revised Selected Papers2017 / p. V-VI https://link.springer.com/book/10.1007/978-3-319-67104-8 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

84

journal article

Protsessor mälusToomsalu, ArvoA & A2001 / 4, lk. 9-16 https://artiklid.elnet.ee/record=b1007646*est

journal article

85

journal article

RISC-arhitektuuri arengusuundade peegeldusi mikroprotsessoris R10000Toomsalu, ArvoArvutustehnika ja Andmetöötlus1996 / 7, lk. 14-19; 8, lk. 16-22; 9, lk. 2-9

journal article

86

journal article

RISC-mikroprotsessorid reaalajasüsteemidesToomsalu, ArvoArvutustehnika ja Andmetöötlus1994 / 10, lk. 2-5 ; 11, lk. 2-6

journal article

87

book

RISC-mikroprotsessorite arhitektuurToomsalu, Arvo1995 https://www.ester.ee/record=b1069536*est

book

88

journal article EST / journal article ENG

Runtime contention and bandwidth-aware adaptive routing selection strategies for networks-on-chipSamman, Faizal; Hollstein, Thomas; Glesner, ManfredIEEE transactions on parallel and distributed systems2013 / p. 1411-1421 : ill https://doi.org/10.1109/TPDS.2012.200 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

89

dissertation

Software-based self-test for microprocessors with high-level decision diagrams = Mikroprotsessorite tarkvara-põhine enesetestimine kõrgtasandi otsustusdiagrammide põhjalJasnetski, Artjom2018 https://digi.lib.ttu.ee/i/?10629 https://www.ester.ee/record=b5151486*est

dissertation

90

journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

91

book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

92

book

Software-based self-test with decision diagrams for microprocessorsUbar, Raimund-Johannes; Jasnetski, Artjom; Tšertov, Anton; Oyeniran, Adeboye Stephen2018

book

93

journal article

SPARC-V8- ja V9-arhitektuuriga mikroprotsessoridToomsalu, ArvoArvutustehnika ja Andmetöötlus1995 / 7, lk. 14-23: ill

journal article

94

journal article

SPEC92 jõudlustesti vahetab välja SPEC95Toomsalu, ArvoArvutustehnika ja Andmetöötlus1996 / 2, lk. 6-8

journal article

95

book article EST / book article ENG

Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCsSelg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2024 https://doi.org/10.1109/DFT63277.2024.10753541 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

96

book article

Stepper motor drive as a control object for teaching microprocessor control of electrical drivesKährik, Rainer; Lehtla, Madis6th International Symposium "Topical Problems in the Field of Electrical and Power Engineering" : Doctoral School of Energy and Geotechnology : [Kuressaare, January 12-17, 2009]2009 / p. 140-143 : ill

book article

97

journal article

SuperH-arhitektuuriga protsessortuum kiipsüsteemideleToomsalu, ArvoA & A2001 / 1, lk. 11-18 : ill https://artiklid.elnet.ee/record=b1006239*est

journal article

98

journal article

Z-RAM-mäluToomsalu, ArvoA & A2008 / 3, lk. 10-19 https://artiklid.elnet.ee/record=b1022321*est

journal article

99

book article

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

book article

100

book article

Test generation for microprocessor control mechanismsLohuaru, Tõnu; Ubar, Raimund-JohannesFTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)1987 / p. 305-311

book article

mikroprotsessorid (subject term)

types of item

subject term 1